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X-RAY DIFFRACTION
Materials and Methods page
3RUN
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    pH 8.5
    Temperature 291.0
    Details 0.2M ammonium phosphate, 0.1M Tris 8.5, 35% MPD, vapor diffusion, hanging drop, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 60.44 α = 90
    b = 60.44 β = 90
    c = 96.83 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 93
     
    Diffraction Detector
    Collection Date 2011-03-25
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X6A
    Wavelength List 1.000
    Site NSLS
    Beamline X6A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.4
    Resolution(Low) 19.8
    Number Reflections(All) 77978
    Number Reflections(Observed) 77081
    Percent Possible(Observed) 98.8
    R Merge I(Observed) 0.076
    B(Isotropic) From Wilson Plot 18.614
    Redundancy 5.48
     
    High Resolution Shell Details
    Resolution(High) 1.4
    Resolution(Low) 1.44
    Percent Possible(All) 87.7
    R Merge I(Observed) 0.652
    Mean I Over Sigma(Observed) 2.04
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.4
    Resolution(Low) 19.784
    Cut-off Sigma(F) 1.43
    Number of Reflections(Observed) 77081
    Number of Reflections(R-Free) 3879
    Percent Reflections(Observed) 98.88
    R-Factor(Observed) 0.1491
    R-Work 0.1475
    R-Free 0.1799
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.3277
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.3277
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.6554
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4001
    Shell Resolution(Low) 1.4501
    Number of Reflections(R-Free) 377
    Number of Reflections(R-Work) 6604
    R-Factor(R-Work) 0.237
    R-Factor(R-Free) 0.2684
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4501
    Shell Resolution(Low) 1.5081
    Number of Reflections(R-Free) 369
    Number of Reflections(R-Work) 7389
    R-Factor(R-Work) 0.1834
    R-Factor(R-Free) 0.2008
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5081
    Shell Resolution(Low) 1.5768
    Number of Reflections(R-Free) 407
    Number of Reflections(R-Work) 7359
    R-Factor(R-Work) 0.1658
    R-Factor(R-Free) 0.1918
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5768
    Shell Resolution(Low) 1.6598
    Number of Reflections(R-Free) 403
    Number of Reflections(R-Work) 7421
    R-Factor(R-Work) 0.1447
    R-Factor(R-Free) 0.1954
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6598
    Shell Resolution(Low) 1.7638
    Number of Reflections(R-Free) 421
    Number of Reflections(R-Work) 7366
    R-Factor(R-Work) 0.1309
    R-Factor(R-Free) 0.1745
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7638
    Shell Resolution(Low) 1.8999
    Number of Reflections(R-Free) 368
    Number of Reflections(R-Work) 7424
    R-Factor(R-Work) 0.1203
    R-Factor(R-Free) 0.1576
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8999
    Shell Resolution(Low) 2.0909
    Number of Reflections(R-Free) 403
    Number of Reflections(R-Work) 7383
    R-Factor(R-Work) 0.1397
    R-Factor(R-Free) 0.1715
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0909
    Shell Resolution(Low) 2.393
    Number of Reflections(R-Free) 378
    Number of Reflections(R-Work) 7406
    R-Factor(R-Work) 0.1374
    R-Factor(R-Free) 0.1709
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.393
    Shell Resolution(Low) 3.0132
    Number of Reflections(R-Free) 391
    Number of Reflections(R-Work) 7416
    R-Factor(R-Work) 0.1452
    R-Factor(R-Free) 0.1804
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0132
    Shell Resolution(Low) 19.7856
    Number of Reflections(R-Free) 362
    Number of Reflections(R-Work) 7434
    R-Factor(R-Work) 0.149
    R-Factor(R-Free) 0.173
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.069
    f_dihedral_angle_d 15.028
    f_angle_d 1.317
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1415
    Nucleic Acid Atoms 0
    Heterogen Atoms 67
    Solvent Atoms 316
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.6.2_432)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    molecular replacement MOLREP
    data processing Xscale