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X-RAY DIFFRACTION
Materials and Methods page
3RUM
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, sitting drop
    Temperature 291.0
    Details 5% isopropanol, 2M ammonium sulfate, vapor diffusion, sitting drop, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 57.83 α = 90
    b = 75 β = 90
    c = 90.78 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Collection Date 2010-03-03
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X6A
    Wavelength List 0.9537
    Site NSLS
    Beamline X6A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.85
    Resolution(Low) 19.42
    Number Reflections(All) 34368
    Number Reflections(Observed) 33176
    Percent Possible(Observed) 96.5
    Redundancy 4.06
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.851
    Resolution(Low) 19.416
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 33176
    Number of Reflections(R-Free) 1702
    Percent Reflections(Observed) 96.63
    R-Factor(Observed) 0.1785
    R-Work 0.1762
    R-Free 0.2191
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.112
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -4.0171
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 7.1291
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8509
    Shell Resolution(Low) 1.917
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.2486
    R-Factor(R-Free) 0.2854
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.917
    Shell Resolution(Low) 1.9937
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2995
    R-Factor(R-Work) 0.2217
    R-Factor(R-Free) 0.3144
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9937
    Shell Resolution(Low) 2.0843
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3119
    R-Factor(R-Work) 0.2021
    R-Factor(R-Free) 0.2448
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0843
    Shell Resolution(Low) 2.1941
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3181
    R-Factor(R-Work) 0.1817
    R-Factor(R-Free) 0.2204
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1941
    Shell Resolution(Low) 2.3314
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 3182
    R-Factor(R-Work) 0.181
    R-Factor(R-Free) 0.2466
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3314
    Shell Resolution(Low) 2.511
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3221
    R-Factor(R-Work) 0.1734
    R-Factor(R-Free) 0.2347
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.511
    Shell Resolution(Low) 2.7631
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 3265
    R-Factor(R-Work) 0.1808
    R-Factor(R-Free) 0.2179
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7631
    Shell Resolution(Low) 3.1614
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 3266
    R-Factor(R-Work) 0.1812
    R-Factor(R-Free) 0.2112
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1614
    Shell Resolution(Low) 3.9774
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3285
    R-Factor(R-Work) 0.1555
    R-Factor(R-Free) 0.2133
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9774
    Shell Resolution(Low) 19.4172
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 3364
    R-Factor(R-Work) 0.1609
    R-Factor(R-Free) 0.1831
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.075
    f_dihedral_angle_d 12.305
    f_angle_d 1.23
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3085
    Nucleic Acid Atoms 0
    Heterogen Atoms 177
    Solvent Atoms 383
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.6.2_432)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    molecular replacement MOLREP
    data processing Xscale