X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.5
Temperature 277.0
Details 100 mM Tris-HCl pH8.5, 20% PEG8000, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 49.98 α = 90
b = 49.98 β = 90
c = 165.52 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR 300 CCD -- 2008-11-07
Diffraction Radiation
Monochromator Protocol
C(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-G 0.97856 APS 21-ID-G

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 100 99.4 0.074 -- -- 19.0 14841 14752 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.1 2.18 97.9 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.1 34.057 -- 1.11 -- 14752 2554 99.37 -- 0.2171 0.2133 0.2539 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1 2.175 -- 249 2367 0.3228 0.4175 -- 96.0
X Ray Diffraction 2.175 2.2621 -- 282 2401 0.2732 0.3249 -- 100.0
X Ray Diffraction 2.2621 2.365 -- 260 2425 0.2587 0.317 -- 100.0
X Ray Diffraction 2.365 2.4897 -- 245 2456 0.2668 0.3308 -- 100.0
X Ray Diffraction 2.4897 2.6456 -- 284 2416 0.2611 0.3241 -- 100.0
X Ray Diffraction 2.6456 2.8498 -- 259 2403 0.2528 0.2857 -- 100.0
X Ray Diffraction 2.8498 3.1364 -- 272 2464 0.2337 0.2958 -- 100.0
X Ray Diffraction 3.1364 3.5898 -- 235 2487 0.2051 0.2503 -- 100.0
X Ray Diffraction 3.5898 4.5211 -- 257 2403 0.1788 0.2042 -- 99.0
X Ray Diffraction 4.5211 34.061 -- 211 2446 0.1826 0.2032 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 2.5771
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 2.5771
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -5.1542
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.084
f_dihedral_angle_d 14.599
f_angle_d 1.117
f_bond_d 0.011
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1336
Nucleic Acid Atoms 0
Heterogen Atoms 1
Solvent Atoms 75

Software

Computing
Computing Package Purpose
MD-2 diffractometer software Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SHARP Structure Solution
PHENIX (phenix.refine: 1.6.4_486) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.6.4_486) refinement
SHARP model building
MD-2 version: diffractometer software data collection