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X-RAY DIFFRACTION
Materials and Methods page
3RRT
  •   Crystallization Hide
    Crystallization Experiments
    pH 4.5
    Temperature 293.0
    Details 23% (w/v) PEG 3000, 0.1 M acetate, pH 4.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 71.02 α = 90
    b = 81.88 β = 90
    c = 271.95 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-02-10
     
    Diffraction Radiation
    Monochromator SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength 1.00
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 3.2
    Resolution(Low) 50
    Number Reflections(Observed) 26109
    Percent Possible(Observed) 93.9
    R Merge I(Observed) 0.208
    Redundancy 3.1
     
    High Resolution Shell Details
    Resolution(High) 3.2
    Resolution(Low) 3.26
    Percent Possible(All) 82.3
    R Merge I(Observed) 0.47
    Mean I Over Sigma(Observed) 1.7
    Redundancy 2.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.2
    Resolution(Low) 46.17
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 28339
    Number of Reflections(Observed) 25928
    Number of Reflections(R-Free) 1331
    Percent Reflections(Observed) 91.5
    R-Factor(Observed) 0.255
    R-Work 0.253
    R-Free 0.282
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -23.3349
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 23.0759
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.259
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1494
    Shell Resolution(Low) 3.2619
    Number of Reflections(R-Free) 75
    Number of Reflections(R-Work) 1727
    R-Factor(R-Work) 0.3472
    R-Factor(R-Free) 0.394
    Percent Reflections(Observed) 65.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2619
    Shell Resolution(Low) 3.3925
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2247
    R-Factor(R-Work) 0.309
    R-Factor(R-Free) 0.3337
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3925
    Shell Resolution(Low) 3.5468
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2343
    R-Factor(R-Work) 0.2965
    R-Factor(R-Free) 0.336
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5468
    Shell Resolution(Low) 3.7337
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2518
    R-Factor(R-Work) 0.2803
    R-Factor(R-Free) 0.3035
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7337
    Shell Resolution(Low) 3.9676
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2527
    R-Factor(R-Work) 0.2716
    R-Factor(R-Free) 0.3236
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9676
    Shell Resolution(Low) 4.2737
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.227
    R-Factor(R-Free) 0.2952
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2737
    Shell Resolution(Low) 4.7034
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2623
    R-Factor(R-Work) 0.1923
    R-Factor(R-Free) 0.2167
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7034
    Shell Resolution(Low) 5.3831
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.2171
    R-Factor(R-Free) 0.2863
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3831
    Shell Resolution(Low) 6.7787
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.2416
    R-Factor(R-Free) 0.2746
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.7787
    Shell Resolution(Low) 46.1756
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2726
    R-Factor(R-Work) 0.27
    R-Factor(R-Free) 0.2554
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.057
    f_dihedral_angle_d 14.326
    f_angle_d 1.09
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10064
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection SERGUI