X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 4.5
Temperature 293.0
Details 23% (w/v) PEG 3000, 0.1 M acetate, pH 4.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 71.02 α = 90
b = 81.88 β = 90
c = 271.95 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 200
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2011-02-10
Diffraction Radiation
Monochromator Protocol
SI(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID -- APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.2 50 93.9 0.208 0.208 -- 3.1 -- 26109 -- 1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.2 3.26 82.3 0.47 -- 1.7 2.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.2 46.17 -- 0.0 28339 25928 1331 91.5 -- 0.255 0.253 0.282 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.1494 3.2619 -- 75 1727 0.3472 0.394 -- 65.0
X Ray Diffraction 3.2619 3.3925 -- 116 2247 0.309 0.3337 -- 85.0
X Ray Diffraction 3.3925 3.5468 -- 113 2343 0.2965 0.336 -- 88.0
X Ray Diffraction 3.5468 3.7337 -- 124 2518 0.2803 0.3035 -- 94.0
X Ray Diffraction 3.7337 3.9676 -- 136 2527 0.2716 0.3236 -- 96.0
X Ray Diffraction 3.9676 4.2737 -- 158 2566 0.227 0.2952 -- 97.0
X Ray Diffraction 4.2737 4.7034 -- 157 2623 0.1923 0.2167 -- 98.0
X Ray Diffraction 4.7034 5.3831 -- 144 2639 0.2171 0.2863 -- 98.0
X Ray Diffraction 5.3831 6.7787 -- 140 2681 0.2416 0.2746 -- 98.0
X Ray Diffraction 6.7787 46.1756 -- 168 2726 0.27 0.2554 -- 96.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -23.3349
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 23.0759
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.259
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.057
f_dihedral_angle_d 14.326
f_angle_d 1.09
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 10064
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 0

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (PHENIX.REFINE: 1.6.4_486) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.6.4_486) refinement
PHASER model building
SERGUI data collection