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X-RAY DIFFRACTION
Materials and Methods page
3RRR
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.5
    Temperature 293.0
    Details 20% (w/v) PEG 3000, 0.1 M sodium citrate, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 113.17 α = 90
    b = 131.5 β = 103.17
    c = 164.28 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2010-12-20
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.00
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.8
    Resolution(Low) 50
    Number Reflections(All) 114379
    Number Reflections(Observed) 76177
    Percent Possible(Observed) 66.6
    R Merge I(Observed) 0.159
    Redundancy 3.2
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.9
    Percent Possible(All) 16.7
    R Merge I(Observed) 0.353
    Mean I Over Sigma(Observed) 1.4
    Redundancy 1.5
    Number Unique Reflections(All) 1902
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.821
    Resolution(Low) 44.209
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 112776
    Number of Reflections(Observed) 71850
    Number of Reflections(R-Free) 3586
    Percent Reflections(Observed) 63.71
    R-Factor(Observed) 0.2233
    R-Work 0.2213
    R-Free 0.2621
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.4863
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 3.0705
    Anisotropic B[2][2] -1.9715
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.4578
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8213
    Shell Resolution(Low) 2.8585
    Number of Reflections(R-Free) 3
    Number of Reflections(R-Work) 76
    R-Factor(R-Work) 0.3552
    R-Factor(R-Free) 0.321
    Percent Reflections(Observed) 2.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8585
    Shell Resolution(Low) 2.8976
    Number of Reflections(R-Free) 11
    Number of Reflections(R-Work) 219
    R-Factor(R-Work) 0.3987
    R-Factor(R-Free) 0.5517
    Percent Reflections(Observed) 5.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8976
    Shell Resolution(Low) 2.939
    Number of Reflections(R-Free) 16
    Number of Reflections(R-Work) 407
    R-Factor(R-Work) 0.3487
    R-Factor(R-Free) 0.4509
    Percent Reflections(Observed) 10.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.939
    Shell Resolution(Low) 2.9829
    Number of Reflections(R-Free) 42
    Number of Reflections(R-Work) 552
    R-Factor(R-Work) 0.3319
    R-Factor(R-Free) 0.3872
    Percent Reflections(Observed) 14.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9829
    Shell Resolution(Low) 3.0295
    Number of Reflections(R-Free) 30
    Number of Reflections(R-Work) 711
    R-Factor(R-Work) 0.3492
    R-Factor(R-Free) 0.4132
    Percent Reflections(Observed) 18.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0295
    Shell Resolution(Low) 3.0791
    Number of Reflections(R-Free) 47
    Number of Reflections(R-Work) 896
    R-Factor(R-Work) 0.3585
    R-Factor(R-Free) 0.326
    Percent Reflections(Observed) 22.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0791
    Shell Resolution(Low) 3.1322
    Number of Reflections(R-Free) 58
    Number of Reflections(R-Work) 1111
    R-Factor(R-Work) 0.3314
    R-Factor(R-Free) 0.3873
    Percent Reflections(Observed) 27.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1322
    Shell Resolution(Low) 3.1891
    Number of Reflections(R-Free) 73
    Number of Reflections(R-Work) 1305
    R-Factor(R-Work) 0.3231
    R-Factor(R-Free) 0.3651
    Percent Reflections(Observed) 32.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1891
    Shell Resolution(Low) 3.2505
    Number of Reflections(R-Free) 71
    Number of Reflections(R-Work) 1588
    R-Factor(R-Work) 0.3036
    R-Factor(R-Free) 0.3481
    Percent Reflections(Observed) 38.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2505
    Shell Resolution(Low) 3.3168
    Number of Reflections(R-Free) 88
    Number of Reflections(R-Work) 1956
    R-Factor(R-Work) 0.301
    R-Factor(R-Free) 0.32
    Percent Reflections(Observed) 48.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3168
    Shell Resolution(Low) 3.3889
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2364
    R-Factor(R-Work) 0.3038
    R-Factor(R-Free) 0.3429
    Percent Reflections(Observed) 58.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3889
    Shell Resolution(Low) 3.4677
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2767
    R-Factor(R-Work) 0.2928
    R-Factor(R-Free) 0.3576
    Percent Reflections(Observed) 67.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4677
    Shell Resolution(Low) 3.5544
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3016
    R-Factor(R-Work) 0.2755
    R-Factor(R-Free) 0.3235
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5544
    Shell Resolution(Low) 3.6504
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3251
    R-Factor(R-Work) 0.2603
    R-Factor(R-Free) 0.3459
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6504
    Shell Resolution(Low) 3.7578
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3467
    R-Factor(R-Work) 0.2494
    R-Factor(R-Free) 0.3183
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7578
    Shell Resolution(Low) 3.879
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 3647
    R-Factor(R-Work) 0.228
    R-Factor(R-Free) 0.2557
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.879
    Shell Resolution(Low) 4.0176
    Number of Reflections(R-Free) 221
    Number of Reflections(R-Work) 3860
    R-Factor(R-Work) 0.2156
    R-Factor(R-Free) 0.2505
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0176
    Shell Resolution(Low) 4.1783
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 4044
    R-Factor(R-Work) 0.1768
    R-Factor(R-Free) 0.2515
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1783
    Shell Resolution(Low) 4.3683
    Number of Reflections(R-Free) 231
    Number of Reflections(R-Work) 4093
    R-Factor(R-Work) 0.164
    R-Factor(R-Free) 0.2156
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3683
    Shell Resolution(Low) 4.5984
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 4079
    R-Factor(R-Work) 0.1574
    R-Factor(R-Free) 0.2038
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5984
    Shell Resolution(Low) 4.8861
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 4107
    R-Factor(R-Work) 0.1657
    R-Factor(R-Free) 0.1892
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8861
    Shell Resolution(Low) 5.2628
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 4137
    R-Factor(R-Work) 0.1698
    R-Factor(R-Free) 0.2101
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2628
    Shell Resolution(Low) 5.7914
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 4121
    R-Factor(R-Work) 0.2031
    R-Factor(R-Free) 0.2581
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7914
    Shell Resolution(Low) 6.627
    Number of Reflections(R-Free) 229
    Number of Reflections(R-Work) 4133
    R-Factor(R-Work) 0.2216
    R-Factor(R-Free) 0.2648
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.627
    Shell Resolution(Low) 8.3402
    Number of Reflections(R-Free) 213
    Number of Reflections(R-Work) 4151
    R-Factor(R-Work) 0.2057
    R-Factor(R-Free) 0.2232
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.3402
    Shell Resolution(Low) 44.2146
    Number of Reflections(R-Free) 239
    Number of Reflections(R-Work) 4206
    R-Factor(R-Work) 0.2366
    R-Factor(R-Free) 0.2412
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.049
    f_dihedral_angle_d 15.454
    f_angle_d 0.856
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 19947
    Nucleic Acid Atoms 0
    Heterogen Atoms 168
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SERGUI
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection SERGUI