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X-RAY DIFFRACTION
Materials and Methods page
3RPT
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.5
    Temperature 293.0
    Details 0.2 M Li2SO4,0.1 M MgSO4, 0.1 M acetate pH 4.5, and 5% isopropanol, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 45.87 α = 78.57
    b = 46.24 β = 81.8
    c = 62.28 γ = 61.11
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2009-06-03
     
    Diffraction Radiation
    Monochromator Si 200
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(Low) 50
    Number Reflections(All) 85025
    Percent Possible(Observed) 79.7
     
    High Resolution Shell Details
    Resolution(High) 1.29
    Resolution(Low) 1.31
    Percent Possible(All) 76.9
    Mean I Over Sigma(Observed) 3.0
    Redundancy 1.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.303
    Resolution(Low) 26.207
    Cut-off Sigma(F) 0.04
    Number of Reflections(all) 65145
    Number of Reflections(Observed) 80860
    Number of Reflections(R-Free) 4099
    Percent Reflections(Observed) 75.46
    R-Factor(Observed) 0.175
    R-Work 0.1735
    R-Free 0.202
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 9.4878
    Anisotropic B[1][2] 1.5095
    Anisotropic B[1][3] 2.5509
    Anisotropic B[2][2] -3.3393
    Anisotropic B[2][3] 1.4012
    Anisotropic B[3][3] -6.1484
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3031
    Shell Resolution(Low) 1.3185
    Number of Reflections(R-Free) 65
    Number of Reflections(R-Work) 1289
    R-Factor(R-Work) 0.151
    R-Factor(R-Free) 0.257
    Percent Reflections(Observed) 36.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3185
    Shell Resolution(Low) 1.3345
    Number of Reflections(R-Free) 76
    Number of Reflections(R-Work) 1507
    R-Factor(R-Work) 0.1655
    R-Factor(R-Free) 0.207
    Percent Reflections(Observed) 43.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3345
    Shell Resolution(Low) 1.3514
    Number of Reflections(R-Free) 81
    Number of Reflections(R-Work) 1558
    R-Factor(R-Work) 0.1521
    R-Factor(R-Free) 0.2293
    Percent Reflections(Observed) 44.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3514
    Shell Resolution(Low) 1.3692
    Number of Reflections(R-Free) 68
    Number of Reflections(R-Work) 1672
    R-Factor(R-Work) 0.1638
    R-Factor(R-Free) 0.2049
    Percent Reflections(Observed) 48.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3692
    Shell Resolution(Low) 1.388
    Number of Reflections(R-Free) 86
    Number of Reflections(R-Work) 1739
    R-Factor(R-Work) 0.1659
    R-Factor(R-Free) 0.2578
    Percent Reflections(Observed) 49.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.388
    Shell Resolution(Low) 1.4078
    Number of Reflections(R-Free) 85
    Number of Reflections(R-Work) 1842
    R-Factor(R-Work) 0.1705
    R-Factor(R-Free) 0.2099
    Percent Reflections(Observed) 53.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4078
    Shell Resolution(Low) 1.4288
    Number of Reflections(R-Free) 93
    Number of Reflections(R-Work) 1940
    R-Factor(R-Work) 0.1609
    R-Factor(R-Free) 0.2557
    Percent Reflections(Observed) 55.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4288
    Shell Resolution(Low) 1.4511
    Number of Reflections(R-Free) 98
    Number of Reflections(R-Work) 2052
    R-Factor(R-Work) 0.1682
    R-Factor(R-Free) 0.1975
    Percent Reflections(Observed) 59.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4511
    Shell Resolution(Low) 1.4749
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2103
    R-Factor(R-Work) 0.1627
    R-Factor(R-Free) 0.2375
    Percent Reflections(Observed) 60.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4749
    Shell Resolution(Low) 1.5003
    Number of Reflections(R-Free) 103
    Number of Reflections(R-Work) 2310
    R-Factor(R-Work) 0.1656
    R-Factor(R-Free) 0.22
    Percent Reflections(Observed) 65.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5003
    Shell Resolution(Low) 1.5276
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2457
    R-Factor(R-Work) 0.1658
    R-Factor(R-Free) 0.2103
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5276
    Shell Resolution(Low) 1.557
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2535
    R-Factor(R-Work) 0.1678
    R-Factor(R-Free) 0.2126
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.557
    Shell Resolution(Low) 1.5888
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.1719
    R-Factor(R-Free) 0.2211
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5888
    Shell Resolution(Low) 1.6233
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2774
    R-Factor(R-Work) 0.1751
    R-Factor(R-Free) 0.2175
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6233
    Shell Resolution(Low) 1.6611
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 2939
    R-Factor(R-Work) 0.1759
    R-Factor(R-Free) 0.2025
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6611
    Shell Resolution(Low) 1.7026
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3048
    R-Factor(R-Work) 0.1671
    R-Factor(R-Free) 0.2455
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7026
    Shell Resolution(Low) 1.7486
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 3096
    R-Factor(R-Work) 0.1653
    R-Factor(R-Free) 0.2417
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7486
    Shell Resolution(Low) 1.8001
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3223
    R-Factor(R-Work) 0.1652
    R-Factor(R-Free) 0.1983
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8001
    Shell Resolution(Low) 1.8582
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3236
    R-Factor(R-Work) 0.1572
    R-Factor(R-Free) 0.19
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8582
    Shell Resolution(Low) 1.9246
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 3264
    R-Factor(R-Work) 0.1495
    R-Factor(R-Free) 0.2055
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9246
    Shell Resolution(Low) 2.0016
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3298
    R-Factor(R-Work) 0.142
    R-Factor(R-Free) 0.1762
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0016
    Shell Resolution(Low) 2.0926
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3326
    R-Factor(R-Work) 0.1483
    R-Factor(R-Free) 0.1897
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0926
    Shell Resolution(Low) 2.2029
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 3367
    R-Factor(R-Work) 0.1424
    R-Factor(R-Free) 0.1736
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2029
    Shell Resolution(Low) 2.3409
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 3335
    R-Factor(R-Work) 0.1547
    R-Factor(R-Free) 0.1935
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3409
    Shell Resolution(Low) 2.5215
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 3350
    R-Factor(R-Work) 0.1655
    R-Factor(R-Free) 0.1778
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5215
    Shell Resolution(Low) 2.775
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 3379
    R-Factor(R-Work) 0.1711
    R-Factor(R-Free) 0.231
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.775
    Shell Resolution(Low) 3.1759
    Number of Reflections(R-Free) 202
    Number of Reflections(R-Work) 3351
    R-Factor(R-Work) 0.1648
    R-Factor(R-Free) 0.1769
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1759
    Shell Resolution(Low) 3.999
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 3284
    R-Factor(R-Work) 0.1681
    R-Factor(R-Free) 0.1786
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.999
    Shell Resolution(Low) 26.2122
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2843
    R-Factor(R-Work) 0.2441
    R-Factor(R-Free) 0.2355
    Percent Reflections(Observed) 81.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.075
    f_dihedral_angle_d 11.946
    f_angle_d 1.251
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3774
    Nucleic Acid Atoms 0
    Heterogen Atoms 5
    Solvent Atoms 357
     
     
  •   Software and Computing Hide
    Computing
    Data Collection sergui
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building Phaser
    data collection sergui