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X-RAY DIFFRACTION
Materials and Methods page
3RMO
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 277.15
    Details 15% PEG 8000, 20mM sodium phosphate, 175mM sodium chloride, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 277.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 70.12 α = 90
    b = 71.03 β = 100.4
    c = 72.75 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 108
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details Collimating mirror
    Collection Date 2009-06-23
     
    Diffraction Radiation
    Monochromator Bartels Monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.00
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.4
    Resolution(Low) 50
    Number Reflections(All) 64957
    Number Reflections(Observed) 64957
    Percent Possible(Observed) 94.0
    B(Isotropic) From Wilson Plot 11.81
    Redundancy 2.4
     
    High Resolution Shell Details
    Resolution(High) 1.4
    Resolution(Low) 1.42
    Percent Possible(All) 92.2
    Mean I Over Sigma(Observed) 2.2
    R-Sym I(Observed) 0.37
    Redundancy 2.4
    Number Unique Reflections(All) 3195
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.4
    Resolution(Low) 24.74
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 64188
    Number of Reflections(Observed) 61099
    Number of Reflections(R-Free) 3089
    Percent Reflections(Observed) 88.55
    R-Factor(All) 0.1359
    R-Factor(Observed) 0.1359
    R-Work 0.1343
    R-Free 0.1647
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 20.6377
    Anisotropic B[1][1] 1.9654
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -2.1
    Anisotropic B[2][2] -2.3293
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.3639
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4
    Shell Resolution(Low) 1.45
    Number of Reflections(R-Free) 284
    Number of Reflections(R-Work) 5088
    R-Factor(R-Work) 0.2081
    R-Factor(R-Free) 0.2453
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.45
    Shell Resolution(Low) 1.5081
    Number of Reflections(R-Free) 302
    Number of Reflections(R-Work) 5322
    R-Factor(R-Work) 0.1794
    R-Factor(R-Free) 0.2289
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5081
    Shell Resolution(Low) 1.5767
    Number of Reflections(R-Free) 308
    Number of Reflections(R-Work) 5502
    R-Factor(R-Work) 0.1438
    R-Factor(R-Free) 0.1928
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5767
    Shell Resolution(Low) 1.6598
    Number of Reflections(R-Free) 293
    Number of Reflections(R-Work) 5814
    R-Factor(R-Work) 0.1255
    R-Factor(R-Free) 0.1777
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6598
    Shell Resolution(Low) 1.7638
    Number of Reflections(R-Free) 302
    Number of Reflections(R-Work) 5867
    R-Factor(R-Work) 0.11
    R-Factor(R-Free) 0.1507
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7638
    Shell Resolution(Low) 1.8999
    Number of Reflections(R-Free) 273
    Number of Reflections(R-Work) 6071
    R-Factor(R-Work) 0.1072
    R-Factor(R-Free) 0.1611
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8999
    Shell Resolution(Low) 2.091
    Number of Reflections(R-Free) 355
    Number of Reflections(R-Work) 6107
    R-Factor(R-Work) 0.1098
    R-Factor(R-Free) 0.1423
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.091
    Shell Resolution(Low) 2.3934
    Number of Reflections(R-Free) 354
    Number of Reflections(R-Work) 6177
    R-Factor(R-Work) 0.1225
    R-Factor(R-Free) 0.1521
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3934
    Shell Resolution(Low) 3.0146
    Number of Reflections(R-Free) 306
    Number of Reflections(R-Work) 6168
    R-Factor(R-Work) 0.1417
    R-Factor(R-Free) 0.1732
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0146
    Shell Resolution(Low) 24.7442
    Number of Reflections(R-Free) 312
    Number of Reflections(R-Work) 5894
    R-Factor(R-Work) 0.1434
    R-Factor(R-Free) 0.1553
    Percent Reflections(Observed) 88.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 17.445
    f_plane_restr 0.005
    f_chiral_restr 0.071
    f_angle_d 1.048
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2326
    Nucleic Acid Atoms 0
    Heterogen Atoms 72
    Solvent Atoms 349
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection MAR345dtb