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X-RAY DIFFRACTION
Materials and Methods page
3RMM
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 277.15
    Details 15% PEG 8000, 20mM sodium phosphate, 175mM sodium chloride, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 277.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 70.1 α = 90
    b = 71.1 β = 100.4
    c = 72.7 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details Collimating mirror
    Collection Date 2009-07-31
     
    Diffraction Radiation
    Monochromator Bartels Monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.00
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.58
    Resolution(Low) 50
    Number Reflections(All) 48248
    Number Reflections(Observed) 48248
    Percent Possible(Observed) 99.8
    B(Isotropic) From Wilson Plot 14.2
    Redundancy 3.8
     
    High Resolution Shell Details
    Resolution(High) 1.58
    Resolution(Low) 1.61
    Percent Possible(All) 99.6
    Mean I Over Sigma(Observed) 3.0
    R-Sym I(Observed) 0.478
    Redundancy 3.7
    Number Unique Reflections(All) 2403
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.58
    Resolution(Low) 49.497
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 48261
    Number of Reflections(Observed) 45959
    Number of Reflections(R-Free) 2302
    Percent Reflections(Observed) 95.53
    R-Factor(All) 0.1559
    R-Factor(Observed) 0.1559
    R-Work 0.1547
    R-Free 0.1786
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 23.2358
    Anisotropic B[1][1] 3.5554
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -3.1404
    Anisotropic B[2][2] -3.5521
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.0033
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.58
    Shell Resolution(Low) 1.6365
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3987
    R-Factor(R-Work) 0.2009
    R-Factor(R-Free) 0.2453
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6365
    Shell Resolution(Low) 1.702
    Number of Reflections(R-Free) 232
    Number of Reflections(R-Work) 4086
    R-Factor(R-Work) 0.1871
    R-Factor(R-Free) 0.2441
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.702
    Shell Resolution(Low) 1.7795
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 4237
    R-Factor(R-Work) 0.1637
    R-Factor(R-Free) 0.1914
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7795
    Shell Resolution(Low) 1.8733
    Number of Reflections(R-Free) 213
    Number of Reflections(R-Work) 4310
    R-Factor(R-Work) 0.1516
    R-Factor(R-Free) 0.174
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8733
    Shell Resolution(Low) 1.9907
    Number of Reflections(R-Free) 257
    Number of Reflections(R-Work) 4344
    R-Factor(R-Work) 0.1435
    R-Factor(R-Free) 0.1733
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9907
    Shell Resolution(Low) 2.1444
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 4476
    R-Factor(R-Work) 0.1486
    R-Factor(R-Free) 0.1726
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1444
    Shell Resolution(Low) 2.3602
    Number of Reflections(R-Free) 236
    Number of Reflections(R-Work) 4516
    R-Factor(R-Work) 0.149
    R-Factor(R-Free) 0.1763
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3602
    Shell Resolution(Low) 2.7017
    Number of Reflections(R-Free) 257
    Number of Reflections(R-Work) 4496
    R-Factor(R-Work) 0.1636
    R-Factor(R-Free) 0.1947
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7017
    Shell Resolution(Low) 3.4037
    Number of Reflections(R-Free) 252
    Number of Reflections(R-Work) 4554
    R-Factor(R-Work) 0.1581
    R-Factor(R-Free) 0.1726
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4037
    Shell Resolution(Low) 49.5213
    Number of Reflections(R-Free) 237
    Number of Reflections(R-Work) 4651
    R-Factor(R-Work) 0.1452
    R-Factor(R-Free) 0.1617
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 16.736
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_angle_d 1.081
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2340
    Nucleic Acid Atoms 0
    Heterogen Atoms 66
    Solvent Atoms 305
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection MAR345dtb