POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
3RML
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 277.15
    Details 15% PEG 8000, 20mM sodium phosphate, 175mM sodium chloride, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 277.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 69.3 α = 90
    b = 71.2 β = 99.9
    c = 72.4 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 108
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details Collimating mirror
    Collection Date 2009-06-22
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.00
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.53
    Resolution(Low) 50
    Number Reflections(All) 50478
    Number Reflections(Observed) 50478
    Percent Possible(Observed) 96.4
    B(Isotropic) From Wilson Plot 14.43
    Redundancy 2.9
     
    High Resolution Shell Details
    Resolution(High) 1.53
    Resolution(Low) 1.56
    Percent Possible(All) 92.2
    Mean I Over Sigma(Observed) 2.7
    R-Sym I(Observed) 0.357
    Redundancy 2.7
    Number Unique Reflections(All) 2436
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.53
    Resolution(Low) 35.661
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 50305
    Number of Reflections(Observed) 47916
    Number of Reflections(R-Free) 2389
    Percent Reflections(Observed) 91.6
    R-Factor(All) 0.16
    R-Factor(Observed) 0.16
    R-Work 0.1587
    R-Free 0.1856
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 24.4019
    Anisotropic B[1][1] 3.3799
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -3.0716
    Anisotropic B[2][2] -2.441
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.939
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.53
    Shell Resolution(Low) 1.5847
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3968
    R-Factor(R-Work) 0.2204
    R-Factor(R-Free) 0.2402
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5847
    Shell Resolution(Low) 1.6482
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 4140
    R-Factor(R-Work) 0.1998
    R-Factor(R-Free) 0.2456
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6482
    Shell Resolution(Low) 1.7232
    Number of Reflections(R-Free) 213
    Number of Reflections(R-Work) 4241
    R-Factor(R-Work) 0.1786
    R-Factor(R-Free) 0.2197
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7232
    Shell Resolution(Low) 1.814
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 4390
    R-Factor(R-Work) 0.1561
    R-Factor(R-Free) 0.1966
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.814
    Shell Resolution(Low) 1.9277
    Number of Reflections(R-Free) 234
    Number of Reflections(R-Work) 4519
    R-Factor(R-Work) 0.1535
    R-Factor(R-Free) 0.1716
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9277
    Shell Resolution(Low) 2.0765
    Number of Reflections(R-Free) 254
    Number of Reflections(R-Work) 4700
    R-Factor(R-Work) 0.1498
    R-Factor(R-Free) 0.1721
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0765
    Shell Resolution(Low) 2.2854
    Number of Reflections(R-Free) 249
    Number of Reflections(R-Work) 4830
    R-Factor(R-Work) 0.1531
    R-Factor(R-Free) 0.1672
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2854
    Shell Resolution(Low) 2.6161
    Number of Reflections(R-Free) 265
    Number of Reflections(R-Work) 4904
    R-Factor(R-Work) 0.1602
    R-Factor(R-Free) 0.1875
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6161
    Shell Resolution(Low) 3.2956
    Number of Reflections(R-Free) 289
    Number of Reflections(R-Work) 4905
    R-Factor(R-Work) 0.1652
    R-Factor(R-Free) 0.2177
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2956
    Shell Resolution(Low) 35.6706
    Number of Reflections(R-Free) 254
    Number of Reflections(R-Work) 4930
    R-Factor(R-Work) 0.1468
    R-Factor(R-Free) 0.1619
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 17.032
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_angle_d 1.083
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2340
    Nucleic Acid Atoms 0
    Heterogen Atoms 65
    Solvent Atoms 297
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection MAR345dtb