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X-RAY DIFFRACTION
Materials and Methods page
3RM2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 277.15
    Details 15% PEG 8000, 20mM sodium phosphate, 175mM sodium chloride, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 277.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 69.8 α = 90
    b = 71.5 β = 99.9
    c = 71.9 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
    Details COLLIMATING MIRROR
    Collection Date 2009-12-11
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL MONOCHROMATOR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.23
    Resolution(Low) 50
    Number Reflections(All) 99085
    Number Reflections(Observed) 99085
    Percent Possible(Observed) 97.9
    B(Isotropic) From Wilson Plot 10.66
    Redundancy 2.8
     
    High Resolution Shell Details
    Resolution(High) 1.23
    Resolution(Low) 1.25
    Percent Possible(All) 91.7
    Mean I Over Sigma(Observed) 2.0
    R-Sym I(Observed) 0.387
    Redundancy 2.1
    Number Unique Reflections(All) 4675
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.23
    Resolution(Low) 20.109
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 97223
    Number of Reflections(Observed) 92538
    Number of Reflections(R-Free) 4685
    Percent Reflections(Observed) 91.87
    R-Factor(All) 0.1415
    R-Factor(Observed) 0.1415
    R-Work 0.1404
    R-Free 0.1629
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 19.7196
    Anisotropic B[1][1] 1.076
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -2.9764
    Anisotropic B[2][2] -0.2042
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.8719
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.23
    Shell Resolution(Low) 1.274
    Number of Reflections(R-Free) 443
    Number of Reflections(R-Work) 7640
    R-Factor(R-Work) 0.2082
    R-Factor(R-Free) 0.2257
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.274
    Shell Resolution(Low) 1.325
    Number of Reflections(R-Free) 440
    Number of Reflections(R-Work) 8007
    R-Factor(R-Work) 0.1761
    R-Factor(R-Free) 0.1901
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.325
    Shell Resolution(Low) 1.3853
    Number of Reflections(R-Free) 441
    Number of Reflections(R-Work) 8403
    R-Factor(R-Work) 0.1479
    R-Factor(R-Free) 0.1862
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3853
    Shell Resolution(Low) 1.4583
    Number of Reflections(R-Free) 475
    Number of Reflections(R-Work) 8682
    R-Factor(R-Work) 0.1333
    R-Factor(R-Free) 0.1614
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4583
    Shell Resolution(Low) 1.5496
    Number of Reflections(R-Free) 461
    Number of Reflections(R-Work) 8942
    R-Factor(R-Work) 0.1106
    R-Factor(R-Free) 0.1544
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5496
    Shell Resolution(Low) 1.6692
    Number of Reflections(R-Free) 490
    Number of Reflections(R-Work) 9196
    R-Factor(R-Work) 0.1012
    R-Factor(R-Free) 0.1211
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6692
    Shell Resolution(Low) 1.8371
    Number of Reflections(R-Free) 476
    Number of Reflections(R-Work) 9316
    R-Factor(R-Work) 0.1092
    R-Factor(R-Free) 0.137
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8371
    Shell Resolution(Low) 2.1027
    Number of Reflections(R-Free) 486
    Number of Reflections(R-Work) 9382
    R-Factor(R-Work) 0.1248
    R-Factor(R-Free) 0.1476
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1027
    Shell Resolution(Low) 2.6482
    Number of Reflections(R-Free) 474
    Number of Reflections(R-Work) 9441
    R-Factor(R-Work) 0.1441
    R-Factor(R-Free) 0.1613
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6482
    Shell Resolution(Low) 20.1122
    Number of Reflections(R-Free) 499
    Number of Reflections(R-Work) 8844
    R-Factor(R-Work) 0.1577
    R-Factor(R-Free) 0.1754
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 16.963
    f_plane_restr 0.005
    f_chiral_restr 0.078
    f_angle_d 1.111
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2337
    Nucleic Acid Atoms 0
    Heterogen Atoms 72
    Solvent Atoms 390
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection MAR345dtb