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X-RAY DIFFRACTION
Materials and Methods page
3RM0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 277.15
    Details 15% PEG 8000, 20mM sodium phosphate, 175mM sodium chloride, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 277.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 70.5 α = 90
    b = 71.3 β = 100.5
    c = 72.5 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
    Details COLLIMATING MIRROR
    Collection Date 2010-06-25
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL MONOCHROMATOR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.34
    Resolution(Low) 50
    Number Reflections(All) 78347
    Number Reflections(Observed) 78347
    Percent Possible(Observed) 98.7
    B(Isotropic) From Wilson Plot 11.59
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 1.34
    Resolution(Low) 1.36
    Percent Possible(All) 97.3
    Mean I Over Sigma(Observed) 2.2
    R-Sym I(Observed) 0.519
    Redundancy 3.3
    Number Unique Reflections(All) 3850
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.34
    Resolution(Low) 21.512
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 77869
    Number of Reflections(Observed) 74108
    Number of Reflections(R-Free) 3761
    Percent Reflections(Observed) 93.71
    R-Factor(All) 0.1409
    R-Factor(Observed) 0.1409
    R-Work 0.1395
    R-Free 0.1656
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 19.9263
    Anisotropic B[1][1] 1.687
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 2.4863
    Anisotropic B[2][2] -1.5998
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.1452
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.34
    Shell Resolution(Low) 1.3879
    Number of Reflections(R-Free) 346
    Number of Reflections(R-Work) 6251
    R-Factor(R-Work) 0.2177
    R-Factor(R-Free) 0.2702
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3879
    Shell Resolution(Low) 1.4434
    Number of Reflections(R-Free) 329
    Number of Reflections(R-Work) 6468
    R-Factor(R-Work) 0.1693
    R-Factor(R-Free) 0.2028
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4434
    Shell Resolution(Low) 1.5091
    Number of Reflections(R-Free) 335
    Number of Reflections(R-Work) 6740
    R-Factor(R-Work) 0.1444
    R-Factor(R-Free) 0.2016
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5091
    Shell Resolution(Low) 1.5887
    Number of Reflections(R-Free) 368
    Number of Reflections(R-Work) 6939
    R-Factor(R-Work) 0.113
    R-Factor(R-Free) 0.1567
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5887
    Shell Resolution(Low) 1.6882
    Number of Reflections(R-Free) 399
    Number of Reflections(R-Work) 7048
    R-Factor(R-Work) 0.1081
    R-Factor(R-Free) 0.1454
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6882
    Shell Resolution(Low) 1.8184
    Number of Reflections(R-Free) 403
    Number of Reflections(R-Work) 7180
    R-Factor(R-Work) 0.1081
    R-Factor(R-Free) 0.1409
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8184
    Shell Resolution(Low) 2.0013
    Number of Reflections(R-Free) 381
    Number of Reflections(R-Work) 7294
    R-Factor(R-Work) 0.1185
    R-Factor(R-Free) 0.1509
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0013
    Shell Resolution(Low) 2.2906
    Number of Reflections(R-Free) 399
    Number of Reflections(R-Work) 7439
    R-Factor(R-Work) 0.1302
    R-Factor(R-Free) 0.1474
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2906
    Shell Resolution(Low) 2.8849
    Number of Reflections(R-Free) 422
    Number of Reflections(R-Work) 7446
    R-Factor(R-Work) 0.1491
    R-Factor(R-Free) 0.1689
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8849
    Shell Resolution(Low) 21.5146
    Number of Reflections(R-Free) 379
    Number of Reflections(R-Work) 7542
    R-Factor(R-Work) 0.1507
    R-Factor(R-Free) 0.1702
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 17.623
    f_plane_restr 0.005
    f_chiral_restr 0.074
    f_angle_d 1.112
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2340
    Nucleic Acid Atoms 0
    Heterogen Atoms 97
    Solvent Atoms 361
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection MAR345dtb