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X-RAY DIFFRACTION
Materials and Methods page
3RKK
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 289.0
    Details 0.7 M Ammonium sulfate 25.5 % (w/v) PEG 4000, 15 % (v/v) Glycerol, 5 mM zinc acetate, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 59.76 α = 90
    b = 50.86 β = 106.98
    c = 70.72 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2011-04-15
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97918
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.35
    Resolution(Low) 50
    Number Reflections(All) 16892
    Number Reflections(Observed) 16892
    Percent Possible(Observed) 97.6
    R Merge I(Observed) 0.144
    B(Isotropic) From Wilson Plot 24.97
    Redundancy 3.8
     
    High Resolution Shell Details
    Resolution(High) 2.35
    Resolution(Low) 2.39
    Percent Possible(All) 80.9
    R Merge I(Observed) 0.448
    Mean I Over Sigma(Observed) 2.0
    Redundancy 2.2
    Number Unique Reflections(All) 709
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.35
    Resolution(Low) 40.65
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 16745
    Number of Reflections(Observed) 16745
    Number of Reflections(R-Free) 842
    Percent Reflections(Observed) 97.55
    R-Factor(All) 0.212
    R-Factor(Observed) 0.212
    R-Work 0.208
    R-Free 0.283
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model mixed
    Mean Isotropic B Value 30.6
    Anisotropic B[1][1] -0.8486
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 10.8873
    Anisotropic B[2][2] -7.2363
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 8.0849
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.35
    Shell Resolution(Low) 2.4972
    Number of Reflections(Observed) 2445
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2321
    R-Factor(R-Work) 0.2899
    R-Factor(R-Free) 0.4055
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4972
    Shell Resolution(Low) 2.69
    Number of Reflections(Observed) 2857
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.228
    R-Factor(R-Free) 0.3131
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.69
    Shell Resolution(Low) 2.9606
    Number of Reflections(Observed) 2818
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.2061
    R-Factor(R-Free) 0.3166
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9606
    Shell Resolution(Low) 3.3889
    Number of Reflections(Observed) 2864
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.1965
    R-Factor(R-Free) 0.2976
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3889
    Shell Resolution(Low) 4.2689
    Number of Reflections(Observed) 2857
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.1715
    R-Factor(R-Free) 0.2416
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2689
    Shell Resolution(Low) 40.6561
    Number of Reflections(Observed) 2920
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2792
    R-Factor(R-Work) 0.2167
    R-Factor(R-Free) 0.2486
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.011
    f_chiral_restr 0.125
    f_dihedral_angle_d 16.859
    f_angle_d 1.615
    f_bond_d 0.017
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3369
    Nucleic Acid Atoms 0
    Heterogen Atoms 70
    Solvent Atoms 170
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCCOLLECT, HKL3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution HKL3000, Molrep
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building Molrep
    model building HKL3000
    data collection HKL3000
    data collection SBCCOLLECT