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X-RAY DIFFRACTION
Materials and Methods page
3REG
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.6
    Temperature 291.0
    Details EhRho1 at 15 mg/mL in crystallization buffer (50 mM Tris pH 8.0, 250 mM NaCl, 2.5% (v/v) glycerol, 5 mM DTT, 50 microM GTPgammaS, 1 mM magnesium chloride) was mixed 1:1 with and equilibrated against crystallization solution (25% PEG 4000, 150 mM ammonium acetate, 100 mM sodium acetate pH 4.6), VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 36.47 α = 81.75
    b = 39.5 β = 80.76
    c = 63.58 γ = 65.44
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Details custom
    Collection Date 2010-11-18
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.000
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.8
    Resolution(Low) 40
    Number Reflections(All) 29325
    Number Reflections(Observed) 23929
    Percent Possible(Observed) 81.6
    R Merge I(Observed) 0.043
    Redundancy 2.0
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.82
    Percent Possible(All) 45.9
    R Merge I(Observed) 0.278
    Mean I Over Sigma(Observed) 2.8
    Redundancy 1.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.801
    Resolution(Low) 32.958
    Cut-off Sigma(F) 1.96
    Number of Reflections(all) 29486
    Number of Reflections(Observed) 23882
    Number of Reflections(R-Free) 1214
    Percent Reflections(Observed) 81.4
    R-Factor(Observed) 0.1744
    R-Work 0.1718
    R-Free 0.2221
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.3683
    Anisotropic B[1][2] 0.703
    Anisotropic B[1][3] -0.5607
    Anisotropic B[2][2] -1.8001
    Anisotropic B[2][3] 2.6031
    Anisotropic B[3][3] 1.4318
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.801
    Shell Resolution(Low) 1.8735
    Number of Reflections(R-Free) 86
    Number of Reflections(R-Work) 1558
    R-Factor(R-Work) 0.2154
    R-Factor(R-Free) 0.2907
    Percent Reflections(Observed) 50.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8735
    Shell Resolution(Low) 1.9588
    Number of Reflections(R-Free) 105
    Number of Reflections(R-Work) 1931
    R-Factor(R-Work) 0.2029
    R-Factor(R-Free) 0.2994
    Percent Reflections(Observed) 62.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9588
    Shell Resolution(Low) 2.062
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2250
    R-Factor(R-Work) 0.1985
    R-Factor(R-Free) 0.2454
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.062
    Shell Resolution(Low) 2.1912
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2480
    R-Factor(R-Work) 0.1858
    R-Factor(R-Free) 0.2512
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1912
    Shell Resolution(Low) 2.3603
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.1814
    R-Factor(R-Free) 0.2339
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3603
    Shell Resolution(Low) 2.5978
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2863
    R-Factor(R-Work) 0.1821
    R-Factor(R-Free) 0.2334
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5978
    Shell Resolution(Low) 2.9735
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 2914
    R-Factor(R-Work) 0.1834
    R-Factor(R-Free) 0.2413
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9735
    Shell Resolution(Low) 3.7454
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2998
    R-Factor(R-Work) 0.1579
    R-Factor(R-Free) 0.198
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7454
    Shell Resolution(Low) 32.9637
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2995
    R-Factor(R-Work) 0.1527
    R-Factor(R-Free) 0.1928
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.078
    f_dihedral_angle_d 13.895
    f_angle_d 1.2
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2658
    Nucleic Acid Atoms 0
    Heterogen Atoms 66
    Solvent Atoms 229
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6_289)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6_289)
    model building PHASER
    data collection HKL-2000