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X-RAY DIFFRACTION
Materials and Methods page
3REF
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 291.0
    Details EhRho1 at 15 mg/mL in crystallization buffer (50 mM Tris pH 8.0, 250 mM NaCl, 2.5% (v/v) glycerol, 5 mM DTT, 50 microM GDP, 1 mM magnesium chloride) was mixed 1:1 with and equilibrated against crystallization solution (1.5 M ammonium sulfate, 100 mM Tris pH 8.0), VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 50.3 α = 90
    b = 54.48 β = 90
    c = 132.29 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Details custom
    Collection Date 2010-11-05
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.000
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.95
    Resolution(Low) 28.32
    Number Reflections(All) 27432
    Number Reflections(Observed) 27267
    Percent Possible(Observed) 99.4
    R Merge I(Observed) 0.047
    Redundancy 2.5
     
    High Resolution Shell Details
    Resolution(High) 1.95
    Resolution(Low) 1.98
    Percent Possible(All) 99.4
    R Merge I(Observed) 0.187
    Mean I Over Sigma(Observed) 2.5
    Redundancy 1.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.95
    Resolution(Low) 28.324
    Cut-off Sigma(F) 0.12
    Number of Reflections(all) 27432
    Number of Reflections(Observed) 27158
    Number of Reflections(R-Free) 1366
    Percent Reflections(Observed) 99.58
    R-Factor(Observed) 0.1586
    R-Work 0.1565
    R-Free 0.1974
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.0786
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.1266
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.048
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.95
    Shell Resolution(Low) 2.0194
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2537
    R-Factor(R-Work) 0.1897
    R-Factor(R-Free) 0.2585
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0194
    Shell Resolution(Low) 2.1002
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2545
    R-Factor(R-Work) 0.164
    R-Factor(R-Free) 0.2257
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1002
    Shell Resolution(Low) 2.1958
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2539
    R-Factor(R-Work) 0.1554
    R-Factor(R-Free) 0.2303
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1958
    Shell Resolution(Low) 2.3115
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2542
    R-Factor(R-Work) 0.1514
    R-Factor(R-Free) 0.2048
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3115
    Shell Resolution(Low) 2.4562
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2551
    R-Factor(R-Work) 0.1533
    R-Factor(R-Free) 0.2424
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4562
    Shell Resolution(Low) 2.6458
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2569
    R-Factor(R-Work) 0.1632
    R-Factor(R-Free) 0.2075
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6458
    Shell Resolution(Low) 2.9118
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2562
    R-Factor(R-Work) 0.1723
    R-Factor(R-Free) 0.2205
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9118
    Shell Resolution(Low) 3.3325
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2586
    R-Factor(R-Work) 0.1733
    R-Factor(R-Free) 0.2467
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3325
    Shell Resolution(Low) 4.1965
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.1411
    R-Factor(R-Free) 0.1663
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1965
    Shell Resolution(Low) 28.3267
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 2726
    R-Factor(R-Work) 0.1412
    R-Factor(R-Free) 0.1536
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.088
    f_dihedral_angle_d 16.0
    f_angle_d 1.26
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2759
    Nucleic Acid Atoms 0
    Heterogen Atoms 73
    Solvent Atoms 213
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6_289)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6_289)
    model building PHASER
    data collection HKL-2000