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X-RAY DIFFRACTION
Materials and Methods page
3RAF
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 304.0
    Details 50 mM sodium cacodylate, 5-6% isopropanol, optimised mixture of salts, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 304K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 158.55 α = 90
    b = 158.55 β = 90
    c = 210.33 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-08-05
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04
    Wavelength List 0.9762
    Site DIAMOND
    Beamline I04
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.71
    Resolution(Low) 114.98
    Number Reflections(All) 83475
    Number Reflections(Observed) 83426
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.239
    B(Isotropic) From Wilson Plot 66.392
    Redundancy 6.0
     
    High Resolution Shell Details
    Resolution(High) 2.71
    Resolution(Low) 2.78
    Percent Possible(All) 100.0
    R Merge I(Observed) 1.936
    Mean I Over Sigma(Observed) 0.4
    Redundancy 6.1
    Number Unique Reflections(All) 6122
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.24
    Resolution(Low) 114.977
    Cut-off Sigma(F) 1.44
    Number of Reflections(all) 49022
    Number of Reflections(Observed) 49022
    Number of Reflections(R-Free) 1505
    Percent Reflections(Observed) 99.77
    R-Factor(All) 0.1681
    R-Factor(Observed) 0.1681
    R-Work 0.1668
    R-Free 0.2064
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.1955
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.1955
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -18.9756
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2401
    Shell Resolution(Low) 3.3447
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 4252
    R-Factor(R-Work) 0.2137
    R-Factor(R-Free) 0.2527
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3447
    Shell Resolution(Low) 3.4643
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 4281
    R-Factor(R-Work) 0.1891
    R-Factor(R-Free) 0.2611
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4643
    Shell Resolution(Low) 3.603
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 4293
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.236
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.603
    Shell Resolution(Low) 3.767
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 4281
    R-Factor(R-Work) 0.1625
    R-Factor(R-Free) 0.1859
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.767
    Shell Resolution(Low) 3.9656
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 4281
    R-Factor(R-Work) 0.15
    R-Factor(R-Free) 0.221
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9656
    Shell Resolution(Low) 4.2141
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 4279
    R-Factor(R-Work) 0.1419
    R-Factor(R-Free) 0.1837
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2141
    Shell Resolution(Low) 4.5394
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 4336
    R-Factor(R-Work) 0.136
    R-Factor(R-Free) 0.1626
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5394
    Shell Resolution(Low) 4.9963
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4319
    R-Factor(R-Work) 0.1386
    R-Factor(R-Free) 0.1762
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9963
    Shell Resolution(Low) 5.7192
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4353
    R-Factor(R-Work) 0.1562
    R-Factor(R-Free) 0.2262
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7192
    Shell Resolution(Low) 7.2055
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4360
    R-Factor(R-Work) 0.1816
    R-Factor(R-Free) 0.1973
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.2055
    Shell Resolution(Low) 115.049
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4482
    R-Factor(R-Work) 0.1788
    R-Factor(R-Free) 0.1941
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_dihedral_angle_d 18.003
    f_angle_d 1.283
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10403
    Nucleic Acid Atoms 730
    Heterogen Atoms 56
    Solvent Atoms 40
     
     
  •   Software and Computing Hide
    Computing
    Data Collection GDE
    Data Reduction (intensity integration) XIA2 (mosflm)
    Data Reduction (data scaling) XIA2 (scala)
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.6.1_357)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.1_357)
    model building Phaser
    data collection GDE