POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
3RAD
  •   Crystallization Hide
    Crystallization Experiments
    Method LIQUID DIFFUSION
    pH 6.5
    Temperature 304.0
    Details 50mM sodium cacodylate, 7% isopropanol, pH 6.5, LIQUID DIFFUSION, temperature 304K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 157.13 α = 90
    b = 157.13 β = 90
    c = 211.09 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-09-26
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I03
    Wavelength List 0.9763
    Site DIAMOND
    Beamline I03
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.1
    Resolution(Low) 50
    Number Reflections(All) 55483
    Number Reflections(Observed) 55095
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.102
    B(Isotropic) From Wilson Plot 90.1
    Redundancy 4.5
     
    High Resolution Shell Details
    Resolution(High) 3.1
    Resolution(Low) 3.21
    Percent Possible(All) 98.8
    R Merge I(Observed) 0.84
    Mean I Over Sigma(Observed) 1.43
    R-Sym I(Observed) 0.84
    Redundancy 4.1
    Number Unique Reflections(All) 5432
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.35
    Resolution(Low) 41.674
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 43537
    Number of Reflections(R-Free) 4348
    Percent Reflections(Observed) 99.28
    R-Factor(Observed) 0.1825
    R-Work 0.1774
    R-Free 0.2279
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 14.2168
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 14.2168
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -28.4337
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.35
    Shell Resolution(Low) 3.3881
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1242
    R-Factor(R-Work) 0.2341
    R-Factor(R-Free) 0.2956
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3881
    Shell Resolution(Low) 3.4279
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1311
    R-Factor(R-Work) 0.2191
    R-Factor(R-Free) 0.2798
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4279
    Shell Resolution(Low) 3.4697
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1260
    R-Factor(R-Work) 0.2017
    R-Factor(R-Free) 0.2983
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4697
    Shell Resolution(Low) 3.5136
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1322
    R-Factor(R-Work) 0.2123
    R-Factor(R-Free) 0.2743
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5136
    Shell Resolution(Low) 3.5598
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 1296
    R-Factor(R-Work) 0.1987
    R-Factor(R-Free) 0.2783
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5598
    Shell Resolution(Low) 3.6085
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1279
    R-Factor(R-Work) 0.2011
    R-Factor(R-Free) 0.2658
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6085
    Shell Resolution(Low) 3.6601
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1320
    R-Factor(R-Work) 0.199
    R-Factor(R-Free) 0.2313
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6601
    Shell Resolution(Low) 3.7147
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1268
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.2495
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7147
    Shell Resolution(Low) 3.7727
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 1315
    R-Factor(R-Work) 0.1949
    R-Factor(R-Free) 0.2592
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7727
    Shell Resolution(Low) 3.8345
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1295
    R-Factor(R-Work) 0.1715
    R-Factor(R-Free) 0.2275
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8345
    Shell Resolution(Low) 3.9006
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1300
    R-Factor(R-Work) 0.1622
    R-Factor(R-Free) 0.2445
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9006
    Shell Resolution(Low) 3.9714
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1304
    R-Factor(R-Work) 0.154
    R-Factor(R-Free) 0.231
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9714
    Shell Resolution(Low) 4.0477
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 1312
    R-Factor(R-Work) 0.1552
    R-Factor(R-Free) 0.2295
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0477
    Shell Resolution(Low) 4.1303
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1302
    R-Factor(R-Work) 0.1542
    R-Factor(R-Free) 0.2148
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1303
    Shell Resolution(Low) 4.22
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1275
    R-Factor(R-Work) 0.1464
    R-Factor(R-Free) 0.2058
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.22
    Shell Resolution(Low) 4.3181
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1322
    R-Factor(R-Work) 0.1462
    R-Factor(R-Free) 0.1865
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3181
    Shell Resolution(Low) 4.426
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1307
    R-Factor(R-Work) 0.1463
    R-Factor(R-Free) 0.201
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.426
    Shell Resolution(Low) 4.5455
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1313
    R-Factor(R-Work) 0.1315
    R-Factor(R-Free) 0.1875
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5455
    Shell Resolution(Low) 4.6791
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 1287
    R-Factor(R-Work) 0.1282
    R-Factor(R-Free) 0.1814
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6791
    Shell Resolution(Low) 4.8299
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1312
    R-Factor(R-Work) 0.1481
    R-Factor(R-Free) 0.2081
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8299
    Shell Resolution(Low) 5.0022
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1314
    R-Factor(R-Work) 0.1564
    R-Factor(R-Free) 0.2233
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0022
    Shell Resolution(Low) 5.2022
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1309
    R-Factor(R-Work) 0.1844
    R-Factor(R-Free) 0.2692
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2022
    Shell Resolution(Low) 5.4384
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1345
    R-Factor(R-Work) 0.1905
    R-Factor(R-Free) 0.2506
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4384
    Shell Resolution(Low) 5.7245
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1319
    R-Factor(R-Work) 0.2156
    R-Factor(R-Free) 0.2841
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7245
    Shell Resolution(Low) 6.0821
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1344
    R-Factor(R-Work) 0.2377
    R-Factor(R-Free) 0.3487
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0821
    Shell Resolution(Low) 6.5501
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1333
    R-Factor(R-Work) 0.2225
    R-Factor(R-Free) 0.2931
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5501
    Shell Resolution(Low) 7.2062
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1334
    R-Factor(R-Work) 0.1796
    R-Factor(R-Free) 0.2061
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.2062
    Shell Resolution(Low) 8.2419
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1342
    R-Factor(R-Work) 0.1446
    R-Factor(R-Free) 0.1906
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.2419
    Shell Resolution(Low) 10.3575
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 1301
    R-Factor(R-Work) 0.1485
    R-Factor(R-Free) 0.172
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 10.3575
    Shell Resolution(Low) 41.6767
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1306
    R-Factor(R-Work) 0.2256
    R-Factor(R-Free) 0.2195
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.075
    f_dihedral_angle_d 18.242
    f_angle_d 1.282
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10244
    Nucleic Acid Atoms 730
    Heterogen Atoms 56
    Solvent Atoms 34
     
     
  •   Software and Computing Hide
    Computing
    Data Collection GDE
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building Phaser
    data collection GDE