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X-RAY DIFFRACTION
Materials and Methods page
3R6J
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 0.1 M Imidazole, 8.25% (w/v) PEG 8000, 1% (v/v) MPD, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.15 α = 90
    b = 99.12 β = 90
    c = 77.59 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 95
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-04-18
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.0
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.75
    Resolution(Low) 24.78
    Number Reflections(Observed) 28503
    Percent Possible(Observed) 98.9
    B(Isotropic) From Wilson Plot 31.38
    Redundancy 5.1
     
    High Resolution Shell Details
    Resolution(High) 1.75
    Resolution(Low) 1.81
    Percent Possible(All) 92.0
    Mean I Over Sigma(Observed) 2.45
    R-Sym I(Observed) 0.449
    Redundancy 3.9
    Number Unique Reflections(All) 2605
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.75
    Resolution(Low) 24.78
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 28478
    Number of Reflections(Observed) 28478
    Number of Reflections(R-Free) 1445
    Percent Reflections(Observed) 98.91
    R-Factor(All) 0.1858
    R-Factor(Observed) 0.1867
    R-Work 0.1858
    R-Free 0.2038
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model Isotropic, TLS
    Anisotropic B[1][1] -2.0086
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 3.2789
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 7.6417
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.75
    Shell Resolution(Low) 1.8125
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2489
    R-Factor(R-Work) 0.2596
    R-Factor(R-Free) 0.303
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8125
    Shell Resolution(Low) 1.8851
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.2286
    R-Factor(R-Free) 0.2547
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8851
    Shell Resolution(Low) 1.9708
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.2165
    R-Factor(R-Free) 0.2601
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9708
    Shell Resolution(Low) 2.0747
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.2039
    R-Factor(R-Free) 0.2339
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0747
    Shell Resolution(Low) 2.2046
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2741
    R-Factor(R-Work) 0.1939
    R-Factor(R-Free) 0.2228
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2046
    Shell Resolution(Low) 2.3747
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.2185
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3747
    Shell Resolution(Low) 2.6134
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2728
    R-Factor(R-Work) 0.1945
    R-Factor(R-Free) 0.2346
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6134
    Shell Resolution(Low) 2.991
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2732
    R-Factor(R-Work) 0.203
    R-Factor(R-Free) 0.2269
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.991
    Shell Resolution(Low) 3.7663
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2772
    R-Factor(R-Work) 0.1715
    R-Factor(R-Free) 0.1985
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7663
    Shell Resolution(Low) 24.7827
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2852
    R-Factor(R-Work) 0.1724
    R-Factor(R-Free) 0.1696
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.059
    f_dihedral_angle_d 11.602
    f_angle_d 0.837
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2359
    Nucleic Acid Atoms 0
    Heterogen Atoms 4
    Solvent Atoms 124
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SERGUI
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution PHASER (2.1.4)
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHASER version: (2.1.4)
    data collection SERGUI