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X-RAY DIFFRACTION
Materials and Methods page
3R61
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 293.0
    Details 100 mM HEPES, pH 7.0, 50 mM Lithium Sulfate, 20% 1,2-Propanediol, 0.5 mM Cobalt(II) Chloride, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 45.93 α = 90
    b = 75.01 β = 90
    c = 96.17 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type NOIR-1
    Collection Date 2011-02-10
     
    Diffraction Radiation
    Monochromator SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 4.2.2
    Wavelength List 1.0000
    Site ALS
    Beamline 4.2.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.9
    Resolution(Low) 41.45
    Number Reflections(Observed) 26945
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.082
    B(Isotropic) From Wilson Plot 24.3
    Redundancy 7.2
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 2.0
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.633
    Mean I Over Sigma(Observed) 3.2
    Redundancy 7.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9002
    Resolution(Low) 41.445
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 25409
    Number of Reflections(R-Free) 1240
    Percent Reflections(Observed) 94.47
    R-Factor(Observed) 0.2157
    R-Work 0.2135
    R-Free 0.2581
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -7.8589
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -6.7319
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 14.5908
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9002
    Shell Resolution(Low) 1.9763
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2338
    R-Factor(R-Work) 0.3207
    R-Factor(R-Free) 0.3416
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9763
    Shell Resolution(Low) 2.0663
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2488
    R-Factor(R-Work) 0.2458
    R-Factor(R-Free) 0.3157
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0663
    Shell Resolution(Low) 2.1752
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.2309
    R-Factor(R-Free) 0.2827
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1752
    Shell Resolution(Low) 2.3115
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.2244
    R-Factor(R-Free) 0.3483
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3115
    Shell Resolution(Low) 2.4899
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.2096
    R-Factor(R-Free) 0.262
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4899
    Shell Resolution(Low) 2.7404
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2751
    R-Factor(R-Work) 0.2218
    R-Factor(R-Free) 0.2718
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7404
    Shell Resolution(Low) 3.1369
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2826
    R-Factor(R-Work) 0.2086
    R-Factor(R-Free) 0.2904
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1369
    Shell Resolution(Low) 3.9516
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2880
    R-Factor(R-Work) 0.1972
    R-Factor(R-Free) 0.2159
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9516
    Shell Resolution(Low) 41.4553
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2995
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.2265
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.062
    f_dihedral_angle_d 15.32
    f_angle_d 0.859
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2102
    Nucleic Acid Atoms 0
    Heterogen Atoms 32
    Solvent Atoms 122
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution EPMR
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building EPMR