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X-RAY DIFFRACTION
Materials and Methods page
3QZ0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 291.0
    Details 1.39 M sodium citrate, 0.1 M HEPES, 0.2 M sodium thiocyanate, 10 mM dithiothreitol, 10% glycerol, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 46.92 α = 90
    b = 46.92 β = 90
    c = 168.8 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-05-28
     
    Diffraction Radiation
    Monochromator Double silicon(111) crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.2822
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.77
    Resolution(Low) 50
    Number Reflections(All) 19293
    Number Reflections(Observed) 19167
    Percent Possible(Observed) 99.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.77
    Resolution(Low) 45.207
    Cut-off Sigma(F) 0.24
    Number of Reflections(all) 19293
    Number of Reflections(Observed) 19030
    Number of Reflections(R-Free) 1903
    Percent Reflections(Observed) 98.35
    R-Factor(Observed) 0.1906
    R-Work 0.1889
    R-Free 0.2057
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.6285
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.6285
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.257
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7704
    Shell Resolution(Low) 1.8337
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 1648
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.246
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8337
    Shell Resolution(Low) 1.9071
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 1646
    R-Factor(R-Work) 0.1866
    R-Factor(R-Free) 0.2404
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9071
    Shell Resolution(Low) 1.9939
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 1652
    R-Factor(R-Work) 0.1909
    R-Factor(R-Free) 0.2197
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9939
    Shell Resolution(Low) 2.0991
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 1675
    R-Factor(R-Work) 0.1784
    R-Factor(R-Free) 0.1955
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0991
    Shell Resolution(Low) 2.2306
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 1715
    R-Factor(R-Work) 0.1765
    R-Factor(R-Free) 0.1818
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2306
    Shell Resolution(Low) 2.4028
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 1689
    R-Factor(R-Work) 0.1807
    R-Factor(R-Free) 0.2368
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4028
    Shell Resolution(Low) 2.6446
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 1729
    R-Factor(R-Work) 0.1945
    R-Factor(R-Free) 0.2198
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6446
    Shell Resolution(Low) 3.0272
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 1740
    R-Factor(R-Work) 0.2036
    R-Factor(R-Free) 0.1913
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0272
    Shell Resolution(Low) 3.8136
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 1761
    R-Factor(R-Work) 0.1889
    R-Factor(R-Free) 0.197
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8136
    Shell Resolution(Low) 45.2217
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 1872
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.1903
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.07
    f_dihedral_angle_d 13.066
    f_angle_d 1.038
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1231
    Nucleic Acid Atoms 0
    Heterogen Atoms 12
    Solvent Atoms 152
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE within PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.6.1_357)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.1_357)
    model building SOLVE version: within PHENIX
    data collection CBASS