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X-RAY DIFFRACTION
Materials and Methods page
3QWO
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 293.0
    Details 20.5% (w/v) PEG 4000, 0.2 M lithium sulfate monohydrate, 0.1 M Tris-HCl pH 8.5, 100 mM NaCl, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 75.76 α = 90
    b = 74.43 β = 101.75
    c = 86.4 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2010-08-10
     
    Diffraction Radiation
    Monochromator Si 220
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.00
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.9
    Resolution(Low) 50
    Number Reflections(All) 73584
    Number Reflections(Observed) 73143
    Percent Possible(Observed) 99.4
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.93
    Percent Possible(All) 92.0
    Mean I Over Sigma(Observed) 2.0
    Redundancy 3.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9
    Resolution(Low) 36.836
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 73697
    Number of Reflections(Observed) 69917
    Number of Reflections(R-Free) 3589
    Percent Reflections(Observed) 94.87
    R-Factor(All) 0.1897
    R-Factor(Observed) 0.1897
    R-Work 0.1875
    R-Free 0.2306
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.6225
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 3.4157
    Anisotropic B[2][2] 4.0244
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.4018
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9293
    Number of Reflections(R-Free) 102
    Number of Reflections(R-Work) 1932
    R-Factor(R-Work) 0.2624
    R-Factor(R-Free) 0.332
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9293
    Shell Resolution(Low) 1.9558
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2187
    R-Factor(R-Work) 0.2286
    R-Factor(R-Free) 0.2559
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9558
    Shell Resolution(Low) 1.9837
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2274
    R-Factor(R-Work) 0.2177
    R-Factor(R-Free) 0.2307
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9837
    Shell Resolution(Low) 2.0133
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2472
    R-Factor(R-Work) 0.2206
    R-Factor(R-Free) 0.2501
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0133
    Shell Resolution(Low) 2.0448
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2422
    R-Factor(R-Work) 0.2116
    R-Factor(R-Free) 0.2754
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0448
    Shell Resolution(Low) 2.0783
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2460
    R-Factor(R-Work) 0.2019
    R-Factor(R-Free) 0.2698
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0783
    Shell Resolution(Low) 2.1141
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2489
    R-Factor(R-Work) 0.1991
    R-Factor(R-Free) 0.2456
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1141
    Shell Resolution(Low) 2.1526
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2490
    R-Factor(R-Work) 0.1856
    R-Factor(R-Free) 0.2283
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1526
    Shell Resolution(Low) 2.194
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2526
    R-Factor(R-Work) 0.1799
    R-Factor(R-Free) 0.2522
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.194
    Shell Resolution(Low) 2.2387
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2540
    R-Factor(R-Work) 0.1852
    R-Factor(R-Free) 0.204
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2387
    Shell Resolution(Low) 2.2874
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2415
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2874
    Shell Resolution(Low) 2.3406
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.1925
    R-Factor(R-Free) 0.2649
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3406
    Shell Resolution(Low) 2.3991
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.1991
    R-Factor(R-Free) 0.2518
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3991
    Shell Resolution(Low) 2.464
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.2433
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.464
    Shell Resolution(Low) 2.5365
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.2646
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5365
    Shell Resolution(Low) 2.6183
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2610
    R-Factor(R-Work) 0.1983
    R-Factor(R-Free) 0.2239
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6183
    Shell Resolution(Low) 2.7119
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.1946
    R-Factor(R-Free) 0.2714
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7119
    Shell Resolution(Low) 2.8204
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.1947
    R-Factor(R-Free) 0.2324
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8204
    Shell Resolution(Low) 2.9487
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.1961
    R-Factor(R-Free) 0.266
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9487
    Shell Resolution(Low) 3.1041
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.248
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1041
    Shell Resolution(Low) 3.2985
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.1904
    R-Factor(R-Free) 0.2595
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2985
    Shell Resolution(Low) 3.553
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.1835
    R-Factor(R-Free) 0.2248
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.553
    Shell Resolution(Low) 3.9102
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.1758
    R-Factor(R-Free) 0.211
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9102
    Shell Resolution(Low) 4.4751
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.1518
    R-Factor(R-Free) 0.175
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4751
    Shell Resolution(Low) 5.635
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2718
    R-Factor(R-Work) 0.1645
    R-Factor(R-Free) 0.2114
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.635
    Shell Resolution(Low) 36.8433
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2727
    R-Factor(R-Work) 0.2101
    R-Factor(R-Free) 0.2256
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.067
    f_dihedral_angle_d 11.586
    f_angle_d 1.034
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7362
    Nucleic Acid Atoms 0
    Heterogen Atoms 27
    Solvent Atoms 509
     
     
  •   Software and Computing Hide
    Computing
    Data Collection sergui
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building Phaser
    data collection sergui