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X-RAY DIFFRACTION
Materials and Methods page
3QUE
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 293.0
    Details 100mM MES, 20-30% PEG 4000, 50mM n-BOG, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.41 α = 90
    b = 74.02 β = 90
    c = 77.47 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 90
     
    Diffraction Detector
    Detector CCD
    Type PSI PILATUS 6M
    Details Dynamic bendable mirror
    Collection Date 2011-02-15
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength List 1.000000
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.7
    Resolution(Low) 45
    Number Reflections(All) 10812
    Number Reflections(Observed) 10793
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.082
    B(Isotropic) From Wilson Plot 48.255
    Redundancy 5.73
     
    High Resolution Shell Details
    Resolution(High) 2.7
    Resolution(Low) 2.8
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.496
    Mean I Over Sigma(Observed) 4.15
    Redundancy 6.0
    Number Unique Reflections(All) 1104
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.7
    Resolution(Low) 45.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 10790
    Number of Reflections(R-Free) 863
    Percent Reflections(Observed) 100.0
    R-Factor(Observed) 0.2295
    R-Work 0.2225
    R-Free 0.3109
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 40.7576
    Anisotropic B[1][1] 0.65
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.53
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.11
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7
    Shell Resolution(Low) 2.77
    Number of Reflections(R-Free) 64
    Number of Reflections(R-Work) 735
    R-Factor(R-Work) 0.309
    R-Factor(R-Free) 0.443
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 3.451
    r_scbond_it 2.01
    r_mcangle_it 1.536
    r_mcbond_it 0.806
    r_gen_planes_refined 0.007
    r_chiral_restr 0.102
    r_dihedral_angle_4_deg 19.38
    r_dihedral_angle_3_deg 19.225
    r_dihedral_angle_2_deg 39.951
    r_dihedral_angle_1_deg 6.947
    r_angle_refined_deg 1.634
    r_bond_refined_d 0.015
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2764
    Nucleic Acid Atoms 0
    Heterogen Atoms 71
    Solvent Atoms 14
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement REFMAC 5.5.0102
     
    Software
    data extraction pdb_extract version: 3.10
    refinement REFMAC5
    molecular replacement Phaser version: 2.1.4
    data processing Xscale