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X-RAY DIFFRACTION
Materials and Methods page
3QTO
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 277.15
    Details 15% PEG8000, 20mM sodium phophate, 175mM sodium chloride, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 277.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 69.8 α = 90
    b = 71.4 β = 100.3
    c = 72.5 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 107
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details Collimating mirror
    Collection Date 2009-06-22
     
    Diffraction Radiation
    Monochromator Bartels Monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.00
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.52
    Resolution(Low) 50
    Number Reflections(All) 53781
    Number Reflections(Observed) 53781
    Percent Possible(Observed) 99.8
    Redundancy 3.1
     
    High Resolution Shell Details
    Resolution(High) 1.52
    Resolution(Low) 1.55
    Percent Possible(All) 99.5
    Mean I Over Sigma(Observed) 2.2
    R-Sym I(Observed) 0.497
    Redundancy 2.9
    Number Unique Reflections(All) 2645
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.52
    Resolution(Low) 35.666
    Number of Reflections(all) 53637
    Number of Reflections(Observed) 51053
    Number of Reflections(R-Free) 2584
    Percent Reflections(Observed) 94.83
    R-Factor(All) 0.1558
    R-Factor(Observed) 0.1558
    R-Work 0.1552
    R-Free 0.165
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 20.6408
    Anisotropic B[1][1] 2.3727
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -2.3632
    Anisotropic B[2][2] -1.5382
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.8346
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.52
    Shell Resolution(Low) 1.5743
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 4315
    R-Factor(R-Work) 0.2075
    R-Factor(R-Free) 0.2095
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5743
    Shell Resolution(Low) 1.6374
    Number of Reflections(R-Free) 264
    Number of Reflections(R-Work) 4554
    R-Factor(R-Work) 0.1914
    R-Factor(R-Free) 0.2135
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6374
    Shell Resolution(Low) 1.7119
    Number of Reflections(R-Free) 242
    Number of Reflections(R-Work) 4688
    R-Factor(R-Work) 0.1778
    R-Factor(R-Free) 0.2071
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7119
    Shell Resolution(Low) 1.8021
    Number of Reflections(R-Free) 244
    Number of Reflections(R-Work) 4755
    R-Factor(R-Work) 0.1573
    R-Factor(R-Free) 0.177
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8021
    Shell Resolution(Low) 1.915
    Number of Reflections(R-Free) 246
    Number of Reflections(R-Work) 4905
    R-Factor(R-Work) 0.1496
    R-Factor(R-Free) 0.1664
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.915
    Shell Resolution(Low) 2.0629
    Number of Reflections(R-Free) 242
    Number of Reflections(R-Work) 4959
    R-Factor(R-Work) 0.1435
    R-Factor(R-Free) 0.15
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0629
    Shell Resolution(Low) 2.2705
    Number of Reflections(R-Free) 274
    Number of Reflections(R-Work) 5025
    R-Factor(R-Work) 0.1466
    R-Factor(R-Free) 0.1641
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2705
    Shell Resolution(Low) 2.5989
    Number of Reflections(R-Free) 263
    Number of Reflections(R-Work) 5051
    R-Factor(R-Work) 0.1566
    R-Factor(R-Free) 0.1762
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5989
    Shell Resolution(Low) 3.274
    Number of Reflections(R-Free) 281
    Number of Reflections(R-Work) 5081
    R-Factor(R-Work) 0.1628
    R-Factor(R-Free) 0.1742
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.274
    Shell Resolution(Low) 35.6756
    Number of Reflections(R-Free) 298
    Number of Reflections(R-Work) 5136
    R-Factor(R-Work) 0.143
    R-Factor(R-Free) 0.1404
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 15.531
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_angle_d 1.121
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2340
    Nucleic Acid Atoms 0
    Heterogen Atoms 54
    Solvent Atoms 366
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection MAR345dtb