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X-RAY DIFFRACTION
Materials and Methods page
3QLV
  •   Crystallization Hide
    Crystallization Experiments
    pH 8
    Temperature 293.0
    Details 10% Ethylene Glycol, 0.1 M HEPES, 5% PEG 8K, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 366.55 α = 90
    b = 109.18 β = 97.54
    c = 155.47 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2009-11-24
     
    Diffraction Radiation
    Monochromator SI(111) DOUBLE CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength 1.03320
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 3.94
    Resolution(Low) 50
    Number Reflections(Observed) 54061
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.139
    B(Isotropic) From Wilson Plot 131.0
    Redundancy 13.3
     
    High Resolution Shell Details
    Resolution(High) 3.95
    Resolution(Low) 4.1
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.895
    Mean I Over Sigma(Observed) 2.8
    Redundancy 13.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.94
    Resolution(Low) 48.95
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 50913
    Number of Reflections(Observed) 50913
    Number of Reflections(R-Free) 2595
    Percent Reflections(Observed) 94.1
    R-Factor(Observed) 0.264
    R-Work 0.264
    R-Free 0.28
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -18.0599
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 14.6265
    Anisotropic B[2][2] 23.7176
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -5.6576
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.942
    Shell Resolution(Low) 4.0828
    Number of Reflections(R-Free) 212
    Number of Reflections(R-Work) 4206
    R-Factor(R-Work) 0.3633
    R-Factor(R-Free) 0.3471
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0828
    Shell Resolution(Low) 4.2462
    Number of Reflections(R-Free) 262
    Number of Reflections(R-Work) 4461
    R-Factor(R-Work) 0.3235
    R-Factor(R-Free) 0.3299
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2462
    Shell Resolution(Low) 4.4393
    Number of Reflections(R-Free) 246
    Number of Reflections(R-Work) 4631
    R-Factor(R-Work) 0.295
    R-Factor(R-Free) 0.3499
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4393
    Shell Resolution(Low) 4.6732
    Number of Reflections(R-Free) 245
    Number of Reflections(R-Work) 4773
    R-Factor(R-Work) 0.2629
    R-Factor(R-Free) 0.2849
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6732
    Shell Resolution(Low) 4.9657
    Number of Reflections(R-Free) 272
    Number of Reflections(R-Work) 4866
    R-Factor(R-Work) 0.2443
    R-Factor(R-Free) 0.2731
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9657
    Shell Resolution(Low) 5.3487
    Number of Reflections(R-Free) 267
    Number of Reflections(R-Work) 4929
    R-Factor(R-Work) 0.2538
    R-Factor(R-Free) 0.2757
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3487
    Shell Resolution(Low) 5.8861
    Number of Reflections(R-Free) 269
    Number of Reflections(R-Work) 4969
    R-Factor(R-Work) 0.2871
    R-Factor(R-Free) 0.3425
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8861
    Shell Resolution(Low) 6.736
    Number of Reflections(R-Free) 278
    Number of Reflections(R-Work) 5076
    R-Factor(R-Work) 0.273
    R-Factor(R-Free) 0.2997
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.736
    Shell Resolution(Low) 8.4795
    Number of Reflections(R-Free) 272
    Number of Reflections(R-Work) 5139
    R-Factor(R-Work) 0.2118
    R-Factor(R-Free) 0.238
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.4795
    Shell Resolution(Low) 48.9531
    Number of Reflections(R-Free) 272
    Number of Reflections(R-Work) 5268
    R-Factor(R-Work) 0.2539
    R-Factor(R-Free) 0.2406
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.042
    f_dihedral_angle_d 13.149
    f_angle_d 0.593
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 29634
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection HKL-2000