X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 8
Temperature 293.0
Details 10% Ethylene Glycol, 0.1 M HEPES, 5% PEG 8K, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 366.55 α = 90
b = 109.18 β = 97.54
c = 155.47 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2009-11-24
Diffraction Radiation
Monochromator Protocol
SI(111) DOUBLE CRYSTAL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B -- APS 23-ID-B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.94 50 100.0 0.139 -- -- 13.3 -- 54061 -- 1.0 131.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.95 4.1 100.0 0.895 -- 2.8 13.4 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.94 48.95 -- 0.0 50913 50913 2595 94.1 -- 0.264 0.264 0.28 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.942 4.0828 -- 212 4206 0.3633 0.3471 -- 82.0
X Ray Diffraction 4.0828 4.2462 -- 262 4461 0.3235 0.3299 -- 88.0
X Ray Diffraction 4.2462 4.4393 -- 246 4631 0.295 0.3499 -- 90.0
X Ray Diffraction 4.4393 4.6732 -- 245 4773 0.2629 0.2849 -- 94.0
X Ray Diffraction 4.6732 4.9657 -- 272 4866 0.2443 0.2731 -- 95.0
X Ray Diffraction 4.9657 5.3487 -- 267 4929 0.2538 0.2757 -- 96.0
X Ray Diffraction 5.3487 5.8861 -- 269 4969 0.2871 0.3425 -- 97.0
X Ray Diffraction 5.8861 6.736 -- 278 5076 0.273 0.2997 -- 98.0
X Ray Diffraction 6.736 8.4795 -- 272 5139 0.2118 0.238 -- 99.0
X Ray Diffraction 8.4795 48.9531 -- 272 5268 0.2539 0.2406 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -18.0599
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 14.6265
Anisotropic B[2][2] 23.7176
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -5.6576
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.042
f_dihedral_angle_d 13.149
f_angle_d 0.593
f_bond_d 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 29634
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 0

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (PHENIX.REFINE: 1.6.4_486) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.6.4_486) refinement
PHASER model building
HKL-2000 data collection