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X-RAY DIFFRACTION
Materials and Methods page
3QL8
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 291.0
    Details 5 mg/mL CDK2 protein, 3 mM inhibitor, 15% v/v PEG3350, 50 mM HEPES/NaOH, 50 mM Na/K phosphate, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 53.18 α = 90
    b = 71.55 β = 90
    c = 72.17 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 93
     
    Diffraction Detector
    Detector CCD SATURN 944+
    Type RIGAKU
    Details MIRRORS
    Collection Date 2010-08-21
     
    Diffraction Radiation
    Monochromator MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength 1.54178
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.9
    Resolution(Low) 20
    Number Reflections(All) 22205
    Number Reflections(Observed) 22205
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.028
    B(Isotropic) From Wilson Plot 14.1
    Redundancy 3.8
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.95
    Percent Possible(All) 99.4
    R Merge I(Observed) 0.19
    Mean I Over Sigma(Observed) 4.46
    Redundancy 2.3
    Number Unique Reflections(All) 1631
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9
    Resolution(Low) 18.69
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 22205
    Number of Reflections(Observed) 22205
    Number of Reflections(R-Free) 1100
    Percent Reflections(Observed) 99.5
    R-Factor(Observed) 0.202
    R-Work 0.202
    R-Free 0.238
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 30.3
    Anisotropic B[1][1] -1.71
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.3
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.01
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.86
    Shell Resolution(Low) 1.98
    Number of Reflections(Observed) 2297
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2297
    R-Factor(R-Work) 0.23
    R-Factor(R-Free) 0.245
    R-Free Error 0.022
    Percent Reflections(Observed) 62.1
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 2.68
    c_scbond_it 1.75
    c_mcangle_it 2.35
    c_mcbond_it 1.39
    c_improper_angle_d 0.91
    c_bond_d 0.009
    c_angle_deg 1.4
    c_dihedral_angle_d 22.5
     
    Coordinate Error
    Luzzati ESD(Observed) 0.21
    Luzzati Sigma A(Observed) 0.11
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.25
    Luzzati Sigma A(R-Free Set) 0.14
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2366
    Nucleic Acid Atoms 0
    Heterogen Atoms 20
    Solvent Atoms 148
     
     
  •   Software and Computing Hide
    Computing
    Data Collection StructureStudio
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution CNS 1.2
    Structure Refinement CNS 1.2
     
    Software
    refinement CNS version: 1.2
    model building CNS version: 1.2
    data collection StructureStudio