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X-RAY DIFFRACTION
Materials and Methods page
3QGT
  •   Crystallization Hide
    Crystallization Experiments
    Method microbatch
    pH 4.5
    Temperature 297.0
    Details PEG 4000, NH4OAc, pH 4.5, microbatch, temperature 297K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 56.1 α = 90
    b = 154.44 β = 90
    c = 164.01 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type Nonius Kappa CCD
    Details mirrors
    Collection Date 2004-08-29
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type Cu FINE FOCUS
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 33.9
    Resolution(High) 2.3
    Resolution(Low) 50
    Number Reflections(Observed) 63667
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.082
    B(Isotropic) From Wilson Plot 28.0
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.38
    Percent Possible(All) 96.0
    R Merge I(Observed) 0.468
    Mean I Over Sigma(Observed) 2.34
    Number Unique Reflections(All) 6034
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 44.62
    Cut-off Sigma(I) 1.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 64107
    Number of Reflections(Observed) 63588
    Number of Reflections(R-Free) 3186
    Percent Reflections(Observed) 98.9
    R-Work 0.2217
    R-Free 0.2596
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model Overall
    Mean Isotropic B Value 43.0398
    Anisotropic B[1][1] 4.961
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.722
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -4.239
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.41
    Number of Reflections(Observed) 7527
    Number of Reflections(R-Free) 405
    Number of Reflections(R-Work) 830
    R-Factor(R-Work) 0.286
    R-Factor(R-Free) 0.306
    R-Free Error 0.015
    Percent Reflections(Observed) 95.3
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.41
    Shell Resolution(Low) 2.53
    Number of Reflections(Observed) 7827
    Number of Reflections(R-Free) 348
    Number of Reflections(R-Work) 1174
    R-Factor(R-Work) 0.277
    R-Factor(R-Free) 0.325
    R-Free Error 0.017
    Percent Reflections(Observed) 98.6
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.53
    Shell Resolution(Low) 2.69
    Number of Reflections(Observed) 7883
    Number of Reflections(R-Free) 416
    Number of Reflections(R-Work) 1177
    R-Factor(R-Work) 0.259
    R-Factor(R-Free) 0.295
    R-Free Error 0.014
    Percent Reflections(Observed) 99.5
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.69
    Shell Resolution(Low) 2.9
    Number of Reflections(Observed) 7934
    Number of Reflections(R-Free) 388
    Number of Reflections(R-Work) 1130
    R-Factor(R-Work) 0.238
    R-Factor(R-Free) 0.278
    R-Free Error 0.014
    Percent Reflections(Observed) 99.8
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9
    Shell Resolution(Low) 3.19
    Number of Reflections(Observed) 7947
    Number of Reflections(R-Free) 411
    Number of Reflections(R-Work) 1193
    R-Factor(R-Work) 0.219
    R-Factor(R-Free) 0.279
    R-Free Error 0.014
    Percent Reflections(Observed) 99.8
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.19
    Shell Resolution(Low) 3.65
    Number of Reflections(Observed) 8007
    Number of Reflections(R-Free) 380
    Number of Reflections(R-Work) 1172
    R-Factor(R-Work) 0.199
    R-Factor(R-Free) 0.242
    R-Free Error 0.012
    Percent Reflections(Observed) 99.8
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.65
    Shell Resolution(Low) 4.6
    Number of Reflections(Observed) 8080
    Number of Reflections(R-Free) 424
    Number of Reflections(R-Work) 1194
    R-Factor(R-Work) 0.185
    R-Factor(R-Free) 0.21
    R-Free Error 0.01
    Percent Reflections(Observed) 99.9
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6
    Shell Resolution(Low) 44.62
    Number of Reflections(Observed) 8383
    Number of Reflections(R-Free) 414
    Number of Reflections(R-Work) 1211
    R-Factor(R-Work) 0.212
    R-Factor(R-Free) 0.25
    R-Free Error 0.012
    Percent Reflections(Observed) 99.8
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_torsion_impr_deg 0.77
    c_torsion_deg 23.0
    c_scangle_it 2.74
    c_mcangle_it 2.49
    c_angle_deg 1.4
    c_bond_d 0.007
     
    Coordinate Error
    Luzzati ESD(Observed) 0.28
    Luzzati Sigma A(Observed) 0.29
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.34
    Luzzati Sigma A(R-Free Set) 0.33
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9044
    Nucleic Acid Atoms 0
    Heterogen Atoms 170
    Solvent Atoms 313
     
     
  •   Software and Computing Hide
    Computing
    Data Collection supergui
    Data Reduction (intensity integration) HKL2000
    Data Reduction (data scaling) HKL2000
    Structure Solution CNS
    Structure Refinement CNS 1.2
     
    Software
    data extraction pdb_extract version: 3.10
    refinement CNS
    molecular replacement CNS
    data scaling SCALEPACK
    reflection data processing DENZO