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X-RAY DIFFRACTION
Materials and Methods page
3Q6R
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 0.1 M Imidazole, 8.25% (w/v) PEG 8000, 1% (v/v) MPD, VAPOR DIFFUSION, HANGING DROP, temperature 293K, pH 6.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.28 α = 90
    b = 79.02 β = 99.87
    c = 69.7 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 95
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-08-08
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.0
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.4
    Resolution(Low) 26.67
    Number Reflections(All) 136423
    Number Reflections(Observed) 136423
    Percent Possible(Observed) 99.6
    B(Isotropic) From Wilson Plot 13.4
    Redundancy 3.73
     
    High Resolution Shell Details
    Resolution(High) 1.4
    Resolution(Low) 1.44
    Percent Possible(All) 99.7
    Mean I Over Sigma(Observed) 2.39
    R-Sym I(Observed) 0.71
    Redundancy 3.67
    Number Unique Reflections(All) 36943
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.4
    Resolution(Low) 26.674
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 136413
    Number of Reflections(Observed) 136413
    Number of Reflections(R-Free) 6924
    Percent Reflections(Observed) 99.6
    R-Factor(All) 0.1654
    R-Factor(Observed) 0.1654
    R-Work 0.1648
    R-Free 0.1779
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model Isotropic, TLS
    Mean Isotropic B Value 21.68
    Anisotropic B[1][1] -1.6254
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -2.5603
    Anisotropic B[2][2] -1.2109
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.8362
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4
    Shell Resolution(Low) 1.4159
    Number of Reflections(Observed) 4274
    Number of Reflections(R-Free) 244
    Number of Reflections(R-Work) 4274
    R-Factor(R-Work) 0.2646
    R-Factor(R-Free) 0.2781
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4159
    Shell Resolution(Low) 1.4326
    Number of Reflections(Observed) 4293
    Number of Reflections(R-Free) 248
    Number of Reflections(R-Work) 4293
    R-Factor(R-Work) 0.2595
    R-Factor(R-Free) 0.2962
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4326
    Shell Resolution(Low) 1.45
    Number of Reflections(Observed) 4340
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 4340
    R-Factor(R-Work) 0.2464
    R-Factor(R-Free) 0.2683
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.45
    Shell Resolution(Low) 1.4684
    Number of Reflections(Observed) 4246
    Number of Reflections(R-Free) 235
    Number of Reflections(R-Work) 4246
    R-Factor(R-Work) 0.2345
    R-Factor(R-Free) 0.2744
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4684
    Shell Resolution(Low) 1.4877
    Number of Reflections(Observed) 4357
    Number of Reflections(R-Free) 239
    Number of Reflections(R-Work) 4357
    R-Factor(R-Work) 0.2294
    R-Factor(R-Free) 0.2578
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4877
    Shell Resolution(Low) 1.5081
    Number of Reflections(Observed) 4272
    Number of Reflections(R-Free) 253
    Number of Reflections(R-Work) 4272
    R-Factor(R-Work) 0.2155
    R-Factor(R-Free) 0.2435
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5081
    Shell Resolution(Low) 1.5296
    Number of Reflections(Observed) 4304
    Number of Reflections(R-Free) 234
    Number of Reflections(R-Work) 4304
    R-Factor(R-Work) 0.2088
    R-Factor(R-Free) 0.217
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5296
    Shell Resolution(Low) 1.5525
    Number of Reflections(Observed) 4338
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 4338
    R-Factor(R-Work) 0.2064
    R-Factor(R-Free) 0.222
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5525
    Shell Resolution(Low) 1.5767
    Number of Reflections(Observed) 4294
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 4294
    R-Factor(R-Work) 0.1938
    R-Factor(R-Free) 0.2192
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5767
    Shell Resolution(Low) 1.6026
    Number of Reflections(Observed) 4304
    Number of Reflections(R-Free) 231
    Number of Reflections(R-Work) 4304
    R-Factor(R-Work) 0.1873
    R-Factor(R-Free) 0.2123
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6026
    Shell Resolution(Low) 1.6302
    Number of Reflections(Observed) 4305
    Number of Reflections(R-Free) 239
    Number of Reflections(R-Work) 4305
    R-Factor(R-Work) 0.1856
    R-Factor(R-Free) 0.2262
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6302
    Shell Resolution(Low) 1.6598
    Number of Reflections(Observed) 4296
    Number of Reflections(R-Free) 238
    Number of Reflections(R-Work) 4296
    R-Factor(R-Work) 0.1773
    R-Factor(R-Free) 0.1906
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6598
    Shell Resolution(Low) 1.6918
    Number of Reflections(Observed) 4289
    Number of Reflections(R-Free) 246
    Number of Reflections(R-Work) 4289
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.2029
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6918
    Shell Resolution(Low) 1.7263
    Number of Reflections(Observed) 4358
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 4358
    R-Factor(R-Work) 0.1705
    R-Factor(R-Free) 0.1817
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7263
    Shell Resolution(Low) 1.7638
    Number of Reflections(Observed) 4344
    Number of Reflections(R-Free) 213
    Number of Reflections(R-Work) 4344
    R-Factor(R-Work) 0.1602
    R-Factor(R-Free) 0.1702
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7638
    Shell Resolution(Low) 1.8048
    Number of Reflections(Observed) 4311
    Number of Reflections(R-Free) 236
    Number of Reflections(R-Work) 4311
    R-Factor(R-Work) 0.1532
    R-Factor(R-Free) 0.1931
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8048
    Shell Resolution(Low) 1.85
    Number of Reflections(Observed) 4297
    Number of Reflections(R-Free) 233
    Number of Reflections(R-Work) 4297
    R-Factor(R-Work) 0.1513
    R-Factor(R-Free) 0.1678
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.85
    Shell Resolution(Low) 1.9
    Number of Reflections(Observed) 4304
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 4304
    R-Factor(R-Work) 0.1554
    R-Factor(R-Free) 0.154
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9558
    Number of Reflections(Observed) 4307
    Number of Reflections(R-Free) 248
    Number of Reflections(R-Work) 4307
    R-Factor(R-Work) 0.1548
    R-Factor(R-Free) 0.1735
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9558
    Shell Resolution(Low) 2.019
    Number of Reflections(Observed) 4316
    Number of Reflections(R-Free) 221
    Number of Reflections(R-Work) 4316
    R-Factor(R-Work) 0.1521
    R-Factor(R-Free) 0.1728
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.019
    Shell Resolution(Low) 2.0911
    Number of Reflections(Observed) 4336
    Number of Reflections(R-Free) 212
    Number of Reflections(R-Work) 4336
    R-Factor(R-Work) 0.149
    R-Factor(R-Free) 0.1531
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0911
    Shell Resolution(Low) 2.1748
    Number of Reflections(Observed) 4356
    Number of Reflections(R-Free) 220
    Number of Reflections(R-Work) 4356
    R-Factor(R-Work) 0.1537
    R-Factor(R-Free) 0.1636
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1748
    Shell Resolution(Low) 2.2737
    Number of Reflections(Observed) 4276
    Number of Reflections(R-Free) 233
    Number of Reflections(R-Work) 4276
    R-Factor(R-Work) 0.1568
    R-Factor(R-Free) 0.1614
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2737
    Shell Resolution(Low) 2.3935
    Number of Reflections(Observed) 4279
    Number of Reflections(R-Free) 270
    Number of Reflections(R-Work) 4279
    R-Factor(R-Work) 0.1513
    R-Factor(R-Free) 0.1645
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3935
    Shell Resolution(Low) 2.5434
    Number of Reflections(Observed) 4296
    Number of Reflections(R-Free) 219
    Number of Reflections(R-Work) 4296
    R-Factor(R-Work) 0.1529
    R-Factor(R-Free) 0.167
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5434
    Shell Resolution(Low) 2.7396
    Number of Reflections(Observed) 4317
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 4317
    R-Factor(R-Work) 0.159
    R-Factor(R-Free) 0.182
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7396
    Shell Resolution(Low) 3.0149
    Number of Reflections(Observed) 4348
    Number of Reflections(R-Free) 219
    Number of Reflections(R-Work) 4348
    R-Factor(R-Work) 0.1623
    R-Factor(R-Free) 0.1729
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0149
    Shell Resolution(Low) 3.4504
    Number of Reflections(Observed) 4348
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 4348
    R-Factor(R-Work) 0.1553
    R-Factor(R-Free) 0.1634
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4504
    Shell Resolution(Low) 4.3441
    Number of Reflections(Observed) 4353
    Number of Reflections(R-Free) 250
    Number of Reflections(R-Work) 4353
    R-Factor(R-Work) 0.1446
    R-Factor(R-Free) 0.1433
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3441
    Shell Resolution(Low) 26.6792
    Number of Reflections(Observed) 4431
    Number of Reflections(R-Free) 214
    Number of Reflections(R-Work) 4431
    R-Factor(R-Work) 0.1596
    R-Factor(R-Free) 0.1685
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.074
    f_dihedral_angle_d 11.765
    f_angle_d 1.062
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4793
    Nucleic Acid Atoms 0
    Heterogen Atoms 96
    Solvent Atoms 967
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SERGUI
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER (2.1.4)
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER version: (2.1.4)
    data collection SERGUI