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X-RAY DIFFRACTION
Materials and Methods page
3Q6Q
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 0.1 M Imidazole, 8.25% (w/v) PEG 8000, 1% (v/v) MPD, VAPOR DIFFUSION, HANGING DROP, temperature 293K, pH 6.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.15 α = 90
    b = 78.96 β = 99.67
    c = 69.24 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 95
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-08-08
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.0
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.43
    Resolution(Low) 28.97
    Number Reflections(All) 123161
    Number Reflections(Observed) 123161
    Percent Possible(Observed) 96.6
    B(Isotropic) From Wilson Plot 15.3
    Redundancy 3.83
     
    High Resolution Shell Details
    Resolution(High) 1.43
    Resolution(Low) 1.47
    Percent Possible(All) 94.1
    Mean I Over Sigma(Observed) 2.16
    R-Sym I(Observed) 0.653
    Redundancy 3.55
    Number Unique Reflections(All) 8862
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.43
    Resolution(Low) 28.971
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 123157
    Number of Reflections(Observed) 123157
    Number of Reflections(R-Free) 6168
    Percent Reflections(Observed) 96.63
    R-Factor(Observed) 0.1778
    R-Work 0.1773
    R-Free 0.1884
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model Isotropic, TLS
    Mean Isotropic B Value 21.768
    Anisotropic B[1][1] -1.0584
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -1.47
    Anisotropic B[2][2] -1.8628
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.9211
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.43
    Shell Resolution(Low) 1.4463
    Number of Reflections(Observed) 3823
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3823
    R-Factor(R-Work) 0.3247
    R-Factor(R-Free) 0.3297
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4463
    Shell Resolution(Low) 1.4633
    Number of Reflections(Observed) 3778
    Number of Reflections(R-Free) 216
    Number of Reflections(R-Work) 3778
    R-Factor(R-Work) 0.2935
    R-Factor(R-Free) 0.3109
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4633
    Shell Resolution(Low) 1.4811
    Number of Reflections(Observed) 3789
    Number of Reflections(R-Free) 219
    Number of Reflections(R-Work) 3789
    R-Factor(R-Work) 0.2719
    R-Factor(R-Free) 0.3125
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4811
    Shell Resolution(Low) 1.4999
    Number of Reflections(Observed) 3770
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 3770
    R-Factor(R-Work) 0.2576
    R-Factor(R-Free) 0.2829
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4999
    Shell Resolution(Low) 1.5196
    Number of Reflections(Observed) 3840
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 3840
    R-Factor(R-Work) 0.2502
    R-Factor(R-Free) 0.2506
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5196
    Shell Resolution(Low) 1.5404
    Number of Reflections(Observed) 3820
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 3820
    R-Factor(R-Work) 0.2358
    R-Factor(R-Free) 0.2487
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5404
    Shell Resolution(Low) 1.5624
    Number of Reflections(Observed) 3821
    Number of Reflections(R-Free) 195
    Number of Reflections(R-Work) 3821
    R-Factor(R-Work) 0.2232
    R-Factor(R-Free) 0.2471
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5624
    Shell Resolution(Low) 1.5857
    Number of Reflections(Observed) 3880
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3880
    R-Factor(R-Work) 0.2133
    R-Factor(R-Free) 0.2176
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5857
    Shell Resolution(Low) 1.6105
    Number of Reflections(Observed) 3847
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 3847
    R-Factor(R-Work) 0.2161
    R-Factor(R-Free) 0.2639
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6105
    Shell Resolution(Low) 1.6369
    Number of Reflections(Observed) 3802
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 3802
    R-Factor(R-Work) 0.2144
    R-Factor(R-Free) 0.2731
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6369
    Shell Resolution(Low) 1.6651
    Number of Reflections(Observed) 3862
    Number of Reflections(R-Free) 219
    Number of Reflections(R-Work) 3862
    R-Factor(R-Work) 0.2116
    R-Factor(R-Free) 0.2156
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6651
    Shell Resolution(Low) 1.6954
    Number of Reflections(Observed) 3859
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 3859
    R-Factor(R-Work) 0.2047
    R-Factor(R-Free) 0.2395
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6954
    Shell Resolution(Low) 1.728
    Number of Reflections(Observed) 3917
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3917
    R-Factor(R-Work) 0.1918
    R-Factor(R-Free) 0.1977
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.728
    Shell Resolution(Low) 1.7633
    Number of Reflections(Observed) 3835
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 3835
    R-Factor(R-Work) 0.1861
    R-Factor(R-Free) 0.197
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7633
    Shell Resolution(Low) 1.8016
    Number of Reflections(Observed) 3920
    Number of Reflections(R-Free) 214
    Number of Reflections(R-Work) 3920
    R-Factor(R-Work) 0.172
    R-Factor(R-Free) 0.2132
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8016
    Shell Resolution(Low) 1.8435
    Number of Reflections(Observed) 3847
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 3847
    R-Factor(R-Work) 0.1674
    R-Factor(R-Free) 0.1638
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8435
    Shell Resolution(Low) 1.8896
    Number of Reflections(Observed) 3919
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 3919
    R-Factor(R-Work) 0.1697
    R-Factor(R-Free) 0.1686
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8896
    Shell Resolution(Low) 1.9407
    Number of Reflections(Observed) 3894
    Number of Reflections(R-Free) 232
    Number of Reflections(R-Work) 3894
    R-Factor(R-Work) 0.1702
    R-Factor(R-Free) 0.1983
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9407
    Shell Resolution(Low) 1.9978
    Number of Reflections(Observed) 3901
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 3901
    R-Factor(R-Work) 0.1673
    R-Factor(R-Free) 0.1751
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9978
    Shell Resolution(Low) 2.0623
    Number of Reflections(Observed) 3958
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 3958
    R-Factor(R-Work) 0.1707
    R-Factor(R-Free) 0.1781
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0623
    Shell Resolution(Low) 2.1359
    Number of Reflections(Observed) 3976
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 3976
    R-Factor(R-Work) 0.1685
    R-Factor(R-Free) 0.1858
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1359
    Shell Resolution(Low) 2.2214
    Number of Reflections(Observed) 3925
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 3925
    R-Factor(R-Work) 0.1726
    R-Factor(R-Free) 0.1755
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2214
    Shell Resolution(Low) 2.3225
    Number of Reflections(Observed) 3975
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 3975
    R-Factor(R-Work) 0.167
    R-Factor(R-Free) 0.1589
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3225
    Shell Resolution(Low) 2.4449
    Number of Reflections(Observed) 3935
    Number of Reflections(R-Free) 216
    Number of Reflections(R-Work) 3935
    R-Factor(R-Work) 0.1617
    R-Factor(R-Free) 0.1819
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4449
    Shell Resolution(Low) 2.598
    Number of Reflections(Observed) 3955
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 3955
    R-Factor(R-Work) 0.1677
    R-Factor(R-Free) 0.1697
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.598
    Shell Resolution(Low) 2.7984
    Number of Reflections(Observed) 3985
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 3985
    R-Factor(R-Work) 0.1745
    R-Factor(R-Free) 0.1861
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7984
    Shell Resolution(Low) 3.0797
    Number of Reflections(Observed) 4002
    Number of Reflections(R-Free) 195
    Number of Reflections(R-Work) 4002
    R-Factor(R-Work) 0.1724
    R-Factor(R-Free) 0.188
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0797
    Shell Resolution(Low) 3.5247
    Number of Reflections(Observed) 4012
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 4012
    R-Factor(R-Work) 0.1641
    R-Factor(R-Free) 0.1768
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5247
    Shell Resolution(Low) 4.4382
    Number of Reflections(Observed) 4022
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 4022
    R-Factor(R-Work) 0.1471
    R-Factor(R-Free) 0.1478
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4382
    Shell Resolution(Low) 28.9765
    Number of Reflections(Observed) 4120
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 4120
    R-Factor(R-Work) 0.1694
    R-Factor(R-Free) 0.1771
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.067
    f_dihedral_angle_d 12.004
    f_angle_d 0.984
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4829
    Nucleic Acid Atoms 0
    Heterogen Atoms 84
    Solvent Atoms 753
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SERGUI
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER (2.1.4)
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER version: (2.1.4)
    data collection SERGUI