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X-RAY DIFFRACTION
Materials and Methods page
3Q3A
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 0.1 M Imidazole, 8.25% (w/v) PEG 8000, 1% (v/v) MPD, VAPOR DIFFUSION, HANGING DROP, temperature 293K, pH 6.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.17 α = 90
    b = 79.1 β = 99.54
    c = 68.91 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 95
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-08-08
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.0
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.4
    Resolution(Low) 28.17
    Number Reflections(Observed) 135108
    Percent Possible(Observed) 99.8
    B(Isotropic) From Wilson Plot 13.9
    Redundancy 3.74
     
    High Resolution Shell Details
    Resolution(High) 1.4
    Resolution(Low) 1.44
    Percent Possible(All) 99.9
    Mean I Over Sigma(Observed) 2.32
    R-Sym I(Observed) 0.672
    Redundancy 3.69
    Number Unique Reflections(All) 9985
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.4
    Resolution(Low) 28.171
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 135210
    Number of Reflections(Observed) 135108
    Number of Reflections(R-Free) 6863
    Percent Reflections(Observed) 99.82
    R-Factor(Observed) 0.1698
    R-Work 0.1689
    R-Free 0.1881
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model Isotropic, TLS
    Mean Isotropic B Value 23.204
    Anisotropic B[1][1] -0.1027
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -2.7216
    Anisotropic B[2][2] -1.3517
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.4544
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4
    Shell Resolution(Low) 1.4159
    Number of Reflections(Observed) 4264
    Number of Reflections(R-Free) 245
    Number of Reflections(R-Work) 4264
    R-Factor(R-Work) 0.2714
    R-Factor(R-Free) 0.3076
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4159
    Shell Resolution(Low) 1.4326
    Number of Reflections(Observed) 4207
    Number of Reflections(R-Free) 250
    Number of Reflections(R-Work) 4207
    R-Factor(R-Work) 0.2576
    R-Factor(R-Free) 0.2803
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4326
    Shell Resolution(Low) 1.45
    Number of Reflections(Observed) 4276
    Number of Reflections(R-Free) 219
    Number of Reflections(R-Work) 4276
    R-Factor(R-Work) 0.2552
    R-Factor(R-Free) 0.2787
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.45
    Shell Resolution(Low) 1.4684
    Number of Reflections(Observed) 4268
    Number of Reflections(R-Free) 238
    Number of Reflections(R-Work) 4268
    R-Factor(R-Work) 0.2437
    R-Factor(R-Free) 0.2633
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4684
    Shell Resolution(Low) 1.4877
    Number of Reflections(Observed) 4262
    Number of Reflections(R-Free) 237
    Number of Reflections(R-Work) 4262
    R-Factor(R-Work) 0.2339
    R-Factor(R-Free) 0.2645
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4877
    Shell Resolution(Low) 1.5081
    Number of Reflections(Observed) 4205
    Number of Reflections(R-Free) 255
    Number of Reflections(R-Work) 4205
    R-Factor(R-Work) 0.2277
    R-Factor(R-Free) 0.2449
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5081
    Shell Resolution(Low) 1.5296
    Number of Reflections(Observed) 4298
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 4298
    R-Factor(R-Work) 0.2186
    R-Factor(R-Free) 0.2448
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5296
    Shell Resolution(Low) 1.5525
    Number of Reflections(Observed) 4273
    Number of Reflections(R-Free) 216
    Number of Reflections(R-Work) 4273
    R-Factor(R-Work) 0.2126
    R-Factor(R-Free) 0.2339
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5525
    Shell Resolution(Low) 1.5767
    Number of Reflections(Observed) 4263
    Number of Reflections(R-Free) 228
    Number of Reflections(R-Work) 4263
    R-Factor(R-Work) 0.2018
    R-Factor(R-Free) 0.2237
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5767
    Shell Resolution(Low) 1.6026
    Number of Reflections(Observed) 4289
    Number of Reflections(R-Free) 222
    Number of Reflections(R-Work) 4289
    R-Factor(R-Work) 0.1936
    R-Factor(R-Free) 0.2458
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6026
    Shell Resolution(Low) 1.6302
    Number of Reflections(Observed) 4247
    Number of Reflections(R-Free) 232
    Number of Reflections(R-Work) 4247
    R-Factor(R-Work) 0.1958
    R-Factor(R-Free) 0.2313
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6302
    Shell Resolution(Low) 1.6598
    Number of Reflections(Observed) 4251
    Number of Reflections(R-Free) 241
    Number of Reflections(R-Work) 4251
    R-Factor(R-Work) 0.1849
    R-Factor(R-Free) 0.2072
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6598
    Shell Resolution(Low) 1.6918
    Number of Reflections(Observed) 4291
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 4291
    R-Factor(R-Work) 0.1772
    R-Factor(R-Free) 0.1869
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6918
    Shell Resolution(Low) 1.7263
    Number of Reflections(Observed) 4271
    Number of Reflections(R-Free) 221
    Number of Reflections(R-Work) 4271
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.1848
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7263
    Shell Resolution(Low) 1.7638
    Number of Reflections(Observed) 4281
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 4281
    R-Factor(R-Work) 0.1711
    R-Factor(R-Free) 0.2134
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7638
    Shell Resolution(Low) 1.8048
    Number of Reflections(Observed) 4292
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 4292
    R-Factor(R-Work) 0.1635
    R-Factor(R-Free) 0.1955
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8048
    Shell Resolution(Low) 1.85
    Number of Reflections(Observed) 4274
    Number of Reflections(R-Free) 228
    Number of Reflections(R-Work) 4274
    R-Factor(R-Work) 0.1563
    R-Factor(R-Free) 0.163
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.85
    Shell Resolution(Low) 1.9
    Number of Reflections(Observed) 4270
    Number of Reflections(R-Free) 233
    Number of Reflections(R-Work) 4270
    R-Factor(R-Work) 0.1588
    R-Factor(R-Free) 0.1941
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9559
    Number of Reflections(Observed) 4230
    Number of Reflections(R-Free) 245
    Number of Reflections(R-Work) 4230
    R-Factor(R-Work) 0.1564
    R-Factor(R-Free) 0.1707
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9559
    Shell Resolution(Low) 2.019
    Number of Reflections(Observed) 4307
    Number of Reflections(R-Free) 220
    Number of Reflections(R-Work) 4307
    R-Factor(R-Work) 0.1561
    R-Factor(R-Free) 0.1879
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.019
    Shell Resolution(Low) 2.0911
    Number of Reflections(Observed) 4311
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 4311
    R-Factor(R-Work) 0.1563
    R-Factor(R-Free) 0.1732
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0911
    Shell Resolution(Low) 2.1748
    Number of Reflections(Observed) 4281
    Number of Reflections(R-Free) 219
    Number of Reflections(R-Work) 4281
    R-Factor(R-Work) 0.1591
    R-Factor(R-Free) 0.1806
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1748
    Shell Resolution(Low) 2.2738
    Number of Reflections(Observed) 4251
    Number of Reflections(R-Free) 241
    Number of Reflections(R-Work) 4251
    R-Factor(R-Work) 0.1586
    R-Factor(R-Free) 0.1736
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2738
    Shell Resolution(Low) 2.3936
    Number of Reflections(Observed) 4257
    Number of Reflections(R-Free) 262
    Number of Reflections(R-Work) 4257
    R-Factor(R-Work) 0.1513
    R-Factor(R-Free) 0.166
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3936
    Shell Resolution(Low) 2.5435
    Number of Reflections(Observed) 4326
    Number of Reflections(R-Free) 213
    Number of Reflections(R-Work) 4326
    R-Factor(R-Work) 0.1577
    R-Factor(R-Free) 0.1682
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5435
    Shell Resolution(Low) 2.7397
    Number of Reflections(Observed) 4276
    Number of Reflections(R-Free) 220
    Number of Reflections(R-Work) 4276
    R-Factor(R-Work) 0.1681
    R-Factor(R-Free) 0.1866
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7397
    Shell Resolution(Low) 3.0151
    Number of Reflections(Observed) 4309
    Number of Reflections(R-Free) 214
    Number of Reflections(R-Work) 4309
    R-Factor(R-Work) 0.1654
    R-Factor(R-Free) 0.1797
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0151
    Shell Resolution(Low) 3.4507
    Number of Reflections(Observed) 4326
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 4326
    R-Factor(R-Work) 0.1619
    R-Factor(R-Free) 0.1979
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4507
    Shell Resolution(Low) 4.345
    Number of Reflections(Observed) 4305
    Number of Reflections(R-Free) 240
    Number of Reflections(R-Work) 4305
    R-Factor(R-Work) 0.1469
    R-Factor(R-Free) 0.1544
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.345
    Shell Resolution(Low) 28.1769
    Number of Reflections(Observed) 4386
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 4386
    R-Factor(R-Work) 0.161
    R-Factor(R-Free) 0.1704
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.087
    f_dihedral_angle_d 15.061
    f_angle_d 1.244
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4832
    Nucleic Acid Atoms 0
    Heterogen Atoms 145
    Solvent Atoms 748
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SERGUI
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER (2.1.4)
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER version: (2.1.4)
    data collection SERGUI