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X-RAY DIFFRACTION
Materials and Methods page
3PT9
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 292.0
    Details 20% PEG 3,350, 0.2M Lithium Citrate, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 75.57 α = 90
    b = 79.68 β = 90
    c = 162.65 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-01-01
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.2820
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.5
    Resolution(Low) 30
    Number Reflections(All) 34630
    Number Reflections(Observed) 34594
    Percent Possible(Observed) 99.9
    Redundancy 14.0
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.59
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 5.6
    R-Sym I(Observed) 0.512
    Redundancy 13.9
    Number Unique Reflections(All) 3391
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.5
    Resolution(Low) 29.879
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 34630
    Number of Reflections(Observed) 33580
    Number of Reflections(R-Free) 1700
    Percent Reflections(Observed) 96.84
    R-Factor(Observed) 0.1991
    R-Work 0.196
    R-Free 0.2562
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.9256
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 12.1362
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -8.2106
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 2.5905
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2887
    R-Factor(R-Work) 0.2469
    R-Factor(R-Free) 0.329
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5905
    Shell Resolution(Low) 2.6942
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3013
    R-Factor(R-Work) 0.2473
    R-Factor(R-Free) 0.3349
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6942
    Shell Resolution(Low) 2.8167
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3137
    R-Factor(R-Work) 0.2293
    R-Factor(R-Free) 0.3006
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8167
    Shell Resolution(Low) 2.9651
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3153
    R-Factor(R-Work) 0.2184
    R-Factor(R-Free) 0.3326
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9651
    Shell Resolution(Low) 3.1507
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 3176
    R-Factor(R-Work) 0.2238
    R-Factor(R-Free) 0.2652
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1507
    Shell Resolution(Low) 3.3936
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 3182
    R-Factor(R-Work) 0.2041
    R-Factor(R-Free) 0.2822
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3936
    Shell Resolution(Low) 3.7345
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 3259
    R-Factor(R-Work) 0.2027
    R-Factor(R-Free) 0.2585
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7345
    Shell Resolution(Low) 4.2736
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3297
    R-Factor(R-Work) 0.1667
    R-Factor(R-Free) 0.2509
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2736
    Shell Resolution(Low) 5.3792
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 3303
    R-Factor(R-Work) 0.1548
    R-Factor(R-Free) 0.1801
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3792
    Shell Resolution(Low) 29.8812
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 3473
    R-Factor(R-Work) 0.1937
    R-Factor(R-Free) 0.2365
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.061
    f_dihedral_angle_d 15.636
    f_angle_d 0.951
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6472
    Nucleic Acid Atoms 0
    Heterogen Atoms 28
    Solvent Atoms 327
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection CBASS