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X-RAY DIFFRACTION
Materials and Methods page
3PT6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 292.0
    Details 6% PEG20,000, 0.1M MES, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 83.19 α = 90
    b = 213.51 β = 99.64
    c = 86.27 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2009-11-04
     
    Diffraction Radiation
    Monochromator Si mirrors
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 1.2827
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -1.0
    Resolution(High) 3
    Resolution(Low) 30
    Number Reflections(All) 58980
    Number Reflections(Observed) 58596
    Percent Possible(Observed) 99.3
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.11
    Percent Possible(All) 99.0
    Mean I Over Sigma(Observed) 1.9
    R-Sym I(Observed) 0.512
    Redundancy 2.9
    Number Unique Reflections(All) 5839
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 3.0
    Resolution(Low) 29.819
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 58596
    Number of Reflections(Observed) 57011
    Number of Reflections(R-Free) 1930
    Percent Reflections(Observed) 96.55
    R-Factor(Observed) 0.213
    R-Work 0.2111
    R-Free 0.2659
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 9.845
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 8.5073
    Anisotropic B[2][2] -13.866
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.021
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0
    Shell Resolution(Low) 3.1092
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 5074
    R-Factor(R-Work) 0.3228
    R-Factor(R-Free) 0.3539
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1092
    Shell Resolution(Low) 3.2336
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 5250
    R-Factor(R-Work) 0.2923
    R-Factor(R-Free) 0.3675
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2336
    Shell Resolution(Low) 3.3805
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 5395
    R-Factor(R-Work) 0.2614
    R-Factor(R-Free) 0.3178
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3805
    Shell Resolution(Low) 3.5585
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 5490
    R-Factor(R-Work) 0.24
    R-Factor(R-Free) 0.3076
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5585
    Shell Resolution(Low) 3.781
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 5573
    R-Factor(R-Work) 0.2217
    R-Factor(R-Free) 0.3037
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.781
    Shell Resolution(Low) 4.0723
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 5566
    R-Factor(R-Work) 0.2018
    R-Factor(R-Free) 0.2569
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0723
    Shell Resolution(Low) 4.4809
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 5645
    R-Factor(R-Work) 0.1775
    R-Factor(R-Free) 0.2472
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4809
    Shell Resolution(Low) 5.1264
    Number of Reflections(R-Free) 202
    Number of Reflections(R-Work) 5686
    R-Factor(R-Work) 0.1696
    R-Factor(R-Free) 0.2052
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1264
    Shell Resolution(Low) 6.448
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 5696
    R-Factor(R-Work) 0.2093
    R-Factor(R-Free) 0.2477
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.448
    Shell Resolution(Low) 29.8207
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 5706
    R-Factor(R-Work) 0.1868
    R-Factor(R-Free) 0.2434
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.06
    f_dihedral_angle_d 18.667
    f_angle_d 0.97
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 13963
    Nucleic Acid Atoms 1546
    Heterogen Atoms 60
    Solvent Atoms 24
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHARP
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building SHARP
    data collection MAR345dtb