X-RAY DIFFRACTION Experimental Data & Validation


Lost? View more X-Ray Crystallographic info.

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 292.0
Details 1.8M Ammonium Sulfate, 100 mM HEPES pH 7.0, 20% Ethylene Glycol, 5% Glycerol, VAPOR DIFFUSION, HANGING DROP, temperature 292K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 128.21 α = 90
b = 128.21 β = 90
c = 182.01 γ = 120
Symmetry
Space Group P 65

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 73
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2009-12-19
CCD ADSC QUANTUM 315r -- 2009-11-23
Diffraction Radiation
Monochromator Protocol
Si220 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.9787 APS 21-ID-F
SYNCHROTRON APS BEAMLINE 19-ID 0.9794 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 100 90.0 -- -- -- -- 156340 140384 5.9 170.6 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.83 1.86 -- 0.966 0.825 1.79 6.3 7798

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.8 41.97 -- -- 156340 140384 7398 94.48 -- 0.20886 0.2069 0.24645 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.799 1.846 -- 451 8745 0.289 0.349 -- 79.62
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 32.085
Anisotropic B[1][1] 0.17
Anisotropic B[1][2] 0.09
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.17
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.26
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 2.025
r_scbond_it 1.207
r_mcangle_it 0.735
r_mcbond_it 0.373
r_gen_planes_refined 0.003
r_chiral_restr 0.065
r_dihedral_angle_4_deg 17.489
r_dihedral_angle_3_deg 13.668
r_dihedral_angle_2_deg 37.767
r_dihedral_angle_1_deg 4.56
r_angle_refined_deg 0.936
r_bond_refined_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 12032
Nucleic Acid Atoms 0
Heterogen Atoms 120
Solvent Atoms 890

Software

Computing
Computing Package Purpose
HKL-3000 Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL-3000 Data Reduction (data scaling)
SOLVE Structure Solution
REFMAC 5.5.0072 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.5.0072 refinement
SOLVE model building
HKL-3000 data collection