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X-RAY DIFFRACTION
Materials and Methods page
3PIQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 293.0
    Details 17% PEG 8000, 0.1M Tris-Cl (pH 8.5), 0.1M NaCl, 3% galactose, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 180.37 α = 90
    b = 180.37 β = 90
    c = 222.53 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-03-11
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 3.33
    Resolution(Low) 50
    Number Reflections(Observed) 49978
    Percent Possible(Observed) 81.5
    Redundancy 5.1
     
    High Resolution Shell Details
    Resolution(High) 3.325
    Resolution(Low) 3.36
    Percent Possible(All) 43.6
    Mean I Over Sigma(Observed) 1.95
    R-Sym I(Observed) 0.449
    Redundancy 2.8
    Number Unique Reflections(All) 1322
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.325
    Resolution(Low) 22.375
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 47907
    Number of Reflections(R-Free) 2452
    Percent Reflections(Observed) 77.6
    R-Factor(Observed) 0.2397
    R-Work 0.2365
    R-Free 0.2991
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -25.0592
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -25.0592
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 50.1185
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.325
    Shell Resolution(Low) 3.3891
    Number of Reflections(Observed) 820
    Number of Reflections(R-Free) 38
    Number of Reflections(R-Work) 782
    R-Factor(R-Work) 0.3436
    R-Factor(R-Free) 0.3698
    Percent Reflections(Observed) 24.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3891
    Shell Resolution(Low) 3.4581
    Number of Reflections(Observed) 1431
    Number of Reflections(R-Free) 55
    Number of Reflections(R-Work) 1376
    R-Factor(R-Work) 0.3217
    R-Factor(R-Free) 0.4289
    Percent Reflections(Observed) 42.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4581
    Shell Resolution(Low) 3.533
    Number of Reflections(Observed) 1633
    Number of Reflections(R-Free) 89
    Number of Reflections(R-Work) 1544
    R-Factor(R-Work) 0.322
    R-Factor(R-Free) 0.3463
    Percent Reflections(Observed) 48.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.533
    Shell Resolution(Low) 3.6148
    Number of Reflections(Observed) 1786
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 1678
    R-Factor(R-Work) 0.3275
    R-Factor(R-Free) 0.3808
    Percent Reflections(Observed) 53.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6148
    Shell Resolution(Low) 3.7048
    Number of Reflections(Observed) 1982
    Number of Reflections(R-Free) 107
    Number of Reflections(R-Work) 1875
    R-Factor(R-Work) 0.3073
    R-Factor(R-Free) 0.3885
    Percent Reflections(Observed) 59.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7048
    Shell Resolution(Low) 3.8045
    Number of Reflections(Observed) 2213
    Number of Reflections(R-Free) 106
    Number of Reflections(R-Work) 2107
    R-Factor(R-Work) 0.3026
    R-Factor(R-Free) 0.3576
    Percent Reflections(Observed) 65.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8045
    Shell Resolution(Low) 3.9159
    Number of Reflections(Observed) 2448
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 2337
    R-Factor(R-Work) 0.2828
    R-Factor(R-Free) 0.3593
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9159
    Shell Resolution(Low) 4.0416
    Number of Reflections(Observed) 2684
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2557
    R-Factor(R-Work) 0.2841
    R-Factor(R-Free) 0.3591
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0416
    Shell Resolution(Low) 4.1851
    Number of Reflections(Observed) 2883
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2734
    R-Factor(R-Work) 0.2572
    R-Factor(R-Free) 0.3167
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1851
    Shell Resolution(Low) 4.3515
    Number of Reflections(Observed) 3069
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2906
    R-Factor(R-Work) 0.2203
    R-Factor(R-Free) 0.2529
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3515
    Shell Resolution(Low) 4.548
    Number of Reflections(Observed) 3172
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 2987
    R-Factor(R-Work) 0.1965
    R-Factor(R-Free) 0.3014
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.548
    Shell Resolution(Low) 4.7856
    Number of Reflections(Observed) 3257
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3085
    R-Factor(R-Work) 0.1954
    R-Factor(R-Free) 0.2788
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7856
    Shell Resolution(Low) 5.0821
    Number of Reflections(Observed) 3286
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3108
    R-Factor(R-Work) 0.1927
    R-Factor(R-Free) 0.2269
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0821
    Shell Resolution(Low) 5.4692
    Number of Reflections(Observed) 3339
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 3178
    R-Factor(R-Work) 0.1934
    R-Factor(R-Free) 0.2903
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4692
    Shell Resolution(Low) 6.0099
    Number of Reflections(Observed) 3394
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3230
    R-Factor(R-Work) 0.2253
    R-Factor(R-Free) 0.305
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0099
    Shell Resolution(Low) 6.8576
    Number of Reflections(Observed) 3448
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3273
    R-Factor(R-Work) 0.2291
    R-Factor(R-Free) 0.3296
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.8576
    Shell Resolution(Low) 8.5586
    Number of Reflections(Observed) 3476
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 3292
    R-Factor(R-Work) 0.2271
    R-Factor(R-Free) 0.2633
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.5586
    Shell Resolution(Low) 22.3754
    Number of Reflections(Observed) 3586
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3406
    R-Factor(R-Work) 0.2278
    R-Factor(R-Free) 0.2594
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.04
    f_dihedral_angle_d 9.863
    f_angle_d 0.577
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 19449
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SER-CAT
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection SER-CAT