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X-RAY DIFFRACTION
Materials and Methods page
3PC7
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 277.0
    Details 25 % polyethylene glycol 3350, 0.1 M BisTris, 0.25 M ammonium acetate , pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 70.13 α = 90
    b = 70.13 β = 90
    c = 62.33 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 345 mm plate
    Collection Date 2010-08-16
     
    Diffraction Radiation
    Monochromator Si 111 crystal
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 0.9793, 0.9748, 0.9795
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.65
    Resolution(Low) 50
    Number Reflections(All) 19139
    Number Reflections(Observed) 19139
    Percent Possible(Observed) 98.9
    R Merge I(Observed) 0.069
    Redundancy 9.3
     
    High Resolution Shell Details
    Resolution(High) 1.65
    Resolution(Low) 1.71
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.422
    Redundancy 8.8
    Number Unique Reflections(All) 1892
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.65
    Resolution(Low) 46.589
    Cut-off Sigma(F) 0.95
    Number of Reflections(all) 35544
    Number of Reflections(Observed) 19117
    Number of Reflections(R-Free) 1808
    Percent Reflections(Observed) 99.3
    R-Factor(Observed) 0.143
    R-Work 0.1401
    R-Free 0.1981
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 29.361
    Anisotropic B[1][1] 0.0337
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0337
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.0674
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6491
    Shell Resolution(Low) 1.6936
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2586
    R-Factor(R-Work) 0.1426
    R-Factor(R-Free) 0.2081
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6936
    Shell Resolution(Low) 1.7435
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.1379
    R-Factor(R-Free) 0.2104
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7435
    Shell Resolution(Low) 1.7998
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2584
    R-Factor(R-Work) 0.1235
    R-Factor(R-Free) 0.2228
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7998
    Shell Resolution(Low) 1.8641
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2593
    R-Factor(R-Work) 0.116
    R-Factor(R-Free) 0.186
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8641
    Shell Resolution(Low) 1.9387
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.1171
    R-Factor(R-Free) 0.1778
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9387
    Shell Resolution(Low) 2.027
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.1167
    R-Factor(R-Free) 0.2059
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.027
    Shell Resolution(Low) 2.1338
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.1135
    R-Factor(R-Free) 0.1844
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1338
    Shell Resolution(Low) 2.2675
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.1179
    R-Factor(R-Free) 0.204
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2675
    Shell Resolution(Low) 2.4426
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.1254
    R-Factor(R-Free) 0.2288
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4426
    Shell Resolution(Low) 2.6884
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.1439
    R-Factor(R-Free) 0.208
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6884
    Shell Resolution(Low) 3.0773
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.152
    R-Factor(R-Free) 0.2157
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0773
    Shell Resolution(Low) 3.8768
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2556
    R-Factor(R-Work) 0.1387
    R-Factor(R-Free) 0.1646
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8768
    Shell Resolution(Low) 46.6072
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 2546
    R-Factor(R-Work) 0.1543
    R-Factor(R-Free) 0.2024
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.024
    f_plane_restr 0.006
    f_chiral_restr 0.078
    f_angle_d 1.099
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1260
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 171
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6_289)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    data processing HKL