X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 298.0
Details 0.6M NaFormate, 0.2M NaHEPES, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 44.23 α = 90
b = 56.85 β = 90
c = 100.38 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR scanner 345 mm plate -- 2010-08-16
Diffraction Radiation
Monochromator Protocol
Si 111 crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.0 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 50 97.4 0.062 -- -- 5.1 20146 20146 1.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 1.97 82.8 0.231 -- -- 3.5 1668

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.9 37.625 -- 1.36 20081 20081 1033 97.35 -- 0.1823 0.18 0.2266 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9 1.9993 -- 135 2328 0.206 0.2917 -- 85.0
X Ray Diffraction 1.9993 2.1246 -- 145 2655 0.1896 0.2147 -- 97.0
X Ray Diffraction 2.1246 2.2886 -- 138 2754 0.1774 0.2522 -- 99.0
X Ray Diffraction 2.2886 2.5189 -- 157 2749 0.1893 0.2627 -- 100.0
X Ray Diffraction 2.5189 2.8833 -- 167 2771 0.1936 0.2226 -- 100.0
X Ray Diffraction 2.8833 3.6321 -- 152 2828 0.1634 0.2013 -- 100.0
X Ray Diffraction 3.6321 37.6325 -- 139 2963 0.1711 0.2053 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 27.3142
Anisotropic B[1][1] 8.5994
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.3794
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -8.22
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 16.095
f_plane_restr 0.004
f_chiral_restr 0.068
f_angle_d 0.863
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1696
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 182

Software

Computing
Computing Package Purpose
StructureStudio Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.6_289) Structure Refinement
Software
Software Name Purpose
pdb_extract version: 3.10 data extraction
phenix refinement
HKL data processing