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X-RAY DIFFRACTION
Materials and Methods page
3P3B
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 293.0
    Details 30% PEG Monomethyl ether 2000, 0.1M potassium thiocyanate , pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 293.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 158.86 α = 90
    b = 66.05 β = 95.48
    c = 75.66 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 4
    Collection Date 2010-09-22
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X4A
    Wavelength List 0.97915
    Site NSLS
    Beamline X4A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.65
    Resolution(Low) 41.2
    Number Reflections(All) 87428
    Number Reflections(Observed) 87428
    Percent Possible(Observed) 93.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.651
    Resolution(Low) 41.2
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 87428
    Number of Reflections(Observed) 87428
    Number of Reflections(R-Free) 4384
    Percent Reflections(Observed) 93.3
    R-Factor(All) 0.2175
    R-Factor(Observed) 0.2175
    R-Work 0.2158
    R-Free 0.252
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 3.0511
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -3.4106
    Anisotropic B[2][2] -1.1672
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.8839
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6506
    Shell Resolution(Low) 1.6694
    Number of Reflections(R-Free) 42
    Number of Reflections(R-Work) 1011
    R-Factor(R-Work) 0.3726
    R-Factor(R-Free) 0.3565
    Percent Reflections(Observed) 34.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6694
    Shell Resolution(Low) 1.689
    Number of Reflections(R-Free) 77
    Number of Reflections(R-Work) 1465
    R-Factor(R-Work) 0.3585
    R-Factor(R-Free) 0.3567
    Percent Reflections(Observed) 49.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.689
    Shell Resolution(Low) 1.7096
    Number of Reflections(R-Free) 96
    Number of Reflections(R-Work) 1799
    R-Factor(R-Work) 0.3497
    R-Factor(R-Free) 0.3888
    Percent Reflections(Observed) 61.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7096
    Shell Resolution(Low) 1.7313
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2215
    R-Factor(R-Work) 0.3374
    R-Factor(R-Free) 0.3998
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7313
    Shell Resolution(Low) 1.754
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2552
    R-Factor(R-Work) 0.3256
    R-Factor(R-Free) 0.3409
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.754
    Shell Resolution(Low) 1.7781
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2788
    R-Factor(R-Work) 0.3166
    R-Factor(R-Free) 0.3427
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7781
    Shell Resolution(Low) 1.8035
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2928
    R-Factor(R-Work) 0.3021
    R-Factor(R-Free) 0.3344
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8035
    Shell Resolution(Low) 1.8304
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2941
    R-Factor(R-Work) 0.2956
    R-Factor(R-Free) 0.3393
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8304
    Shell Resolution(Low) 1.859
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2919
    R-Factor(R-Work) 0.278
    R-Factor(R-Free) 0.2905
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.859
    Shell Resolution(Low) 1.8895
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2979
    R-Factor(R-Work) 0.2675
    R-Factor(R-Free) 0.3151
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8895
    Shell Resolution(Low) 1.9221
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2936
    R-Factor(R-Work) 0.2649
    R-Factor(R-Free) 0.305
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9221
    Shell Resolution(Low) 1.957
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2949
    R-Factor(R-Work) 0.246
    R-Factor(R-Free) 0.263
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.957
    Shell Resolution(Low) 1.9946
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2960
    R-Factor(R-Work) 0.2396
    R-Factor(R-Free) 0.2845
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9946
    Shell Resolution(Low) 2.0354
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2946
    R-Factor(R-Work) 0.2345
    R-Factor(R-Free) 0.2283
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0354
    Shell Resolution(Low) 2.0796
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2949
    R-Factor(R-Work) 0.2366
    R-Factor(R-Free) 0.2521
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0796
    Shell Resolution(Low) 2.128
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2961
    R-Factor(R-Work) 0.2269
    R-Factor(R-Free) 0.2942
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.128
    Shell Resolution(Low) 2.1812
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2973
    R-Factor(R-Work) 0.2319
    R-Factor(R-Free) 0.2986
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1812
    Shell Resolution(Low) 2.2402
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2934
    R-Factor(R-Work) 0.2252
    R-Factor(R-Free) 0.2519
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2402
    Shell Resolution(Low) 2.3061
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2993
    R-Factor(R-Work) 0.2182
    R-Factor(R-Free) 0.2872
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3061
    Shell Resolution(Low) 2.3805
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2965
    R-Factor(R-Work) 0.2195
    R-Factor(R-Free) 0.2517
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3805
    Shell Resolution(Low) 2.4656
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2940
    R-Factor(R-Work) 0.2255
    R-Factor(R-Free) 0.2634
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4656
    Shell Resolution(Low) 2.5643
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2962
    R-Factor(R-Work) 0.2208
    R-Factor(R-Free) 0.2964
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5643
    Shell Resolution(Low) 2.681
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 2953
    R-Factor(R-Work) 0.222
    R-Factor(R-Free) 0.2532
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.681
    Shell Resolution(Low) 2.8223
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2973
    R-Factor(R-Work) 0.2271
    R-Factor(R-Free) 0.2563
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8223
    Shell Resolution(Low) 2.9991
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2979
    R-Factor(R-Work) 0.2325
    R-Factor(R-Free) 0.2813
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9991
    Shell Resolution(Low) 3.2305
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2978
    R-Factor(R-Work) 0.2295
    R-Factor(R-Free) 0.2852
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2305
    Shell Resolution(Low) 3.5555
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2982
    R-Factor(R-Work) 0.2051
    R-Factor(R-Free) 0.2187
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5555
    Shell Resolution(Low) 4.0696
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 3020
    R-Factor(R-Work) 0.1722
    R-Factor(R-Free) 0.2103
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0696
    Shell Resolution(Low) 5.1257
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3020
    R-Factor(R-Work) 0.1599
    R-Factor(R-Free) 0.1804
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1257
    Shell Resolution(Low) 41.2127
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 3074
    R-Factor(R-Work) 0.1772
    R-Factor(R-Free) 0.1928
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.075
    f_dihedral_angle_d 16.897
    f_angle_d 1.063
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5859
    Nucleic Acid Atoms 0
    Heterogen Atoms 24
    Solvent Atoms 316
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution BALBES
    Structure Refinement PHENIX (phenix.refine: 1.5_2)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.5_2)
    model building BALBES
    data collection ADSC version: Quantum