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X-RAY DIFFRACTION
Materials and Methods page
3ONY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 0.66M ammonium citrate pH 6.5, 1.65% isopropanol, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 80.53 α = 90
    b = 115.9 β = 90
    c = 267.8 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-04-08
     
    Diffraction Radiation
    Monochromator Si 111. Rosenbaum-Rock double-crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.00
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.85
    Resolution(Low) 50
    Number Reflections(All) 105679
    Number Reflections(Observed) 105679
    Percent Possible(Observed) 99.1
    Redundancy 6.8
     
    High Resolution Shell Details
    Resolution(High) 1.85
    Resolution(Low) 1.92
    Percent Possible(All) 93.3
    R Merge I(Observed) 0.589
    Mean I Over Sigma(Observed) 2.2
    Redundancy 5.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.85
    Resolution(Low) 25.666
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 99983
    Number of Reflections(Observed) 99983
    Number of Reflections(R-Free) 5035
    Percent Reflections(Observed) 93.65
    R-Factor(Observed) 0.1652
    R-Work 0.164
    R-Free 0.1893
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.6314
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.0657
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -7.6971
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8504
    Shell Resolution(Low) 1.8715
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2167
    R-Factor(R-Work) 0.2724
    R-Factor(R-Free) 0.3178
    Percent Reflections(Observed) 64.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8715
    Shell Resolution(Low) 1.8935
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2260
    R-Factor(R-Work) 0.2797
    R-Factor(R-Free) 0.3264
    Percent Reflections(Observed) 69.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8935
    Shell Resolution(Low) 1.9166
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2899
    R-Factor(R-Work) 0.2523
    R-Factor(R-Free) 0.2966
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9166
    Shell Resolution(Low) 1.9408
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 3082
    R-Factor(R-Work) 0.2363
    R-Factor(R-Free) 0.2525
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9408
    Shell Resolution(Low) 1.9663
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2805
    R-Factor(R-Work) 0.2079
    R-Factor(R-Free) 0.2345
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9663
    Shell Resolution(Low) 1.9933
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2920
    R-Factor(R-Work) 0.191
    R-Factor(R-Free) 0.2106
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9933
    Shell Resolution(Low) 2.0217
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 3034
    R-Factor(R-Work) 0.174
    R-Factor(R-Free) 0.2076
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0217
    Shell Resolution(Low) 2.0519
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 3161
    R-Factor(R-Work) 0.171
    R-Factor(R-Free) 0.193
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0519
    Shell Resolution(Low) 2.0839
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3205
    R-Factor(R-Work) 0.1742
    R-Factor(R-Free) 0.2094
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0839
    Shell Resolution(Low) 2.1181
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3146
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.1956
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1181
    Shell Resolution(Low) 2.1546
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 3141
    R-Factor(R-Work) 0.1621
    R-Factor(R-Free) 0.234
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1546
    Shell Resolution(Low) 2.1938
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 3124
    R-Factor(R-Work) 0.1722
    R-Factor(R-Free) 0.2255
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1938
    Shell Resolution(Low) 2.2359
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3068
    R-Factor(R-Work) 0.1816
    R-Factor(R-Free) 0.214
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2359
    Shell Resolution(Low) 2.2815
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3282
    R-Factor(R-Work) 0.1955
    R-Factor(R-Free) 0.2272
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2815
    Shell Resolution(Low) 2.3311
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 3047
    R-Factor(R-Work) 0.171
    R-Factor(R-Free) 0.2045
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3311
    Shell Resolution(Low) 2.3853
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3250
    R-Factor(R-Work) 0.1527
    R-Factor(R-Free) 0.1914
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3853
    Shell Resolution(Low) 2.4449
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3269
    R-Factor(R-Work) 0.1616
    R-Factor(R-Free) 0.2074
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4449
    Shell Resolution(Low) 2.511
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 3302
    R-Factor(R-Work) 0.1507
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.511
    Shell Resolution(Low) 2.5848
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3285
    R-Factor(R-Work) 0.1531
    R-Factor(R-Free) 0.182
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5848
    Shell Resolution(Low) 2.6681
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3302
    R-Factor(R-Work) 0.1539
    R-Factor(R-Free) 0.1816
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6681
    Shell Resolution(Low) 2.7634
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 3335
    R-Factor(R-Work) 0.1632
    R-Factor(R-Free) 0.1928
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7634
    Shell Resolution(Low) 2.8739
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3394
    R-Factor(R-Work) 0.1693
    R-Factor(R-Free) 0.1658
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8739
    Shell Resolution(Low) 3.0045
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 3350
    R-Factor(R-Work) 0.163
    R-Factor(R-Free) 0.197
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0045
    Shell Resolution(Low) 3.1626
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3376
    R-Factor(R-Work) 0.163
    R-Factor(R-Free) 0.1859
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1626
    Shell Resolution(Low) 3.3604
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 3470
    R-Factor(R-Work) 0.17
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3604
    Shell Resolution(Low) 3.6192
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3361
    R-Factor(R-Work) 0.1681
    R-Factor(R-Free) 0.1893
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6192
    Shell Resolution(Low) 3.9822
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 3391
    R-Factor(R-Work) 0.1487
    R-Factor(R-Free) 0.1564
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9822
    Shell Resolution(Low) 4.5556
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3435
    R-Factor(R-Work) 0.1209
    R-Factor(R-Free) 0.141
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5556
    Shell Resolution(Low) 5.7291
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3475
    R-Factor(R-Work) 0.1335
    R-Factor(R-Free) 0.1563
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7291
    Shell Resolution(Low) 25.6684
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3612
    R-Factor(R-Work) 0.1861
    R-Factor(R-Free) 0.2022
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.242
    f_dihedral_angle_d 11.32
    f_angle_d 1.041
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7149
    Nucleic Acid Atoms 0
    Heterogen Atoms 73
    Solvent Atoms 727
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SerGUI
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection SerGUI