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X-RAY DIFFRACTION
Materials and Methods page
3ONU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 0.1 M Imidazole pH 6.5, 8.25% PEG 8000, 1% MPD , VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.22 α = 90
    b = 79.11 β = 99.65
    c = 69.29 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-08-08
     
    Diffraction Radiation
    Monochromator SI 111. ROSENBAUM-ROCK DOUBLE-CRYSTAL MONOCHROMATOR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.0
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.4
    Resolution(Low) 50
    Number Reflections(All) 130975
    Number Reflections(Observed) 130975
    Percent Possible(Observed) 95.2
     
    High Resolution Shell Details
    Resolution(High) 1.4
    Resolution(Low) 1.45
    Percent Possible(All) 69.6
    R Merge I(Observed) 0.449
    Mean I Over Sigma(Observed) 2.0
    Redundancy 2.7
    Number Unique Reflections(All) 9536
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.395
    Resolution(Low) 22.695
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 122330
    Number of Reflections(Observed) 122330
    Number of Reflections(R-Free) 6166
    Percent Reflections(Observed) 88.91
    R-Factor(All) 0.1514
    R-Factor(Observed) 0.1514
    R-Work 0.1505
    R-Free 0.1672
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.379
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -2.3447
    Anisotropic B[2][2] -2.0272
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.4062
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3955
    Shell Resolution(Low) 1.4113
    Number of Reflections(R-Free) 102
    Number of Reflections(R-Work) 2048
    R-Factor(R-Work) 0.224
    R-Factor(R-Free) 0.2351
    Percent Reflections(Observed) 47.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4113
    Shell Resolution(Low) 1.4279
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.2197
    R-Factor(R-Free) 0.2501
    Percent Reflections(Observed) 60.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4279
    Shell Resolution(Low) 1.4454
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2844
    R-Factor(R-Work) 0.2149
    R-Factor(R-Free) 0.2404
    Percent Reflections(Observed) 65.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4454
    Shell Resolution(Low) 1.4636
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 2995
    R-Factor(R-Work) 0.205
    R-Factor(R-Free) 0.2294
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4636
    Shell Resolution(Low) 1.4829
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3220
    R-Factor(R-Work) 0.2045
    R-Factor(R-Free) 0.2152
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4829
    Shell Resolution(Low) 1.5032
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 3389
    R-Factor(R-Work) 0.1957
    R-Factor(R-Free) 0.2342
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5032
    Shell Resolution(Low) 1.5247
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 3598
    R-Factor(R-Work) 0.1914
    R-Factor(R-Free) 0.2152
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5247
    Shell Resolution(Low) 1.5474
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3726
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.1842
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5474
    Shell Resolution(Low) 1.5716
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 3787
    R-Factor(R-Work) 0.1767
    R-Factor(R-Free) 0.2112
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5716
    Shell Resolution(Low) 1.5974
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 3873
    R-Factor(R-Work) 0.167
    R-Factor(R-Free) 0.1942
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5974
    Shell Resolution(Low) 1.6249
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 3923
    R-Factor(R-Work) 0.1629
    R-Factor(R-Free) 0.1978
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6249
    Shell Resolution(Low) 1.6544
    Number of Reflections(R-Free) 214
    Number of Reflections(R-Work) 3955
    R-Factor(R-Work) 0.1571
    R-Factor(R-Free) 0.1927
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6544
    Shell Resolution(Low) 1.6863
    Number of Reflections(R-Free) 244
    Number of Reflections(R-Work) 3970
    R-Factor(R-Work) 0.151
    R-Factor(R-Free) 0.1786
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6863
    Shell Resolution(Low) 1.7207
    Number of Reflections(R-Free) 195
    Number of Reflections(R-Work) 4049
    R-Factor(R-Work) 0.1478
    R-Factor(R-Free) 0.1637
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7207
    Shell Resolution(Low) 1.7581
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 4074
    R-Factor(R-Work) 0.1422
    R-Factor(R-Free) 0.1683
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7581
    Shell Resolution(Low) 1.7989
    Number of Reflections(R-Free) 216
    Number of Reflections(R-Work) 4083
    R-Factor(R-Work) 0.1377
    R-Factor(R-Free) 0.1879
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7989
    Shell Resolution(Low) 1.8439
    Number of Reflections(R-Free) 220
    Number of Reflections(R-Work) 4051
    R-Factor(R-Work) 0.1372
    R-Factor(R-Free) 0.1426
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8439
    Shell Resolution(Low) 1.8937
    Number of Reflections(R-Free) 222
    Number of Reflections(R-Work) 4098
    R-Factor(R-Work) 0.1463
    R-Factor(R-Free) 0.1535
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8937
    Shell Resolution(Low) 1.9494
    Number of Reflections(R-Free) 228
    Number of Reflections(R-Work) 4189
    R-Factor(R-Work) 0.1435
    R-Factor(R-Free) 0.164
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9494
    Shell Resolution(Low) 2.0123
    Number of Reflections(R-Free) 231
    Number of Reflections(R-Work) 4263
    R-Factor(R-Work) 0.1392
    R-Factor(R-Free) 0.1659
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0123
    Shell Resolution(Low) 2.0842
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 4329
    R-Factor(R-Work) 0.1403
    R-Factor(R-Free) 0.155
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0842
    Shell Resolution(Low) 2.1676
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 4322
    R-Factor(R-Work) 0.1387
    R-Factor(R-Free) 0.1666
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1676
    Shell Resolution(Low) 2.2662
    Number of Reflections(R-Free) 229
    Number of Reflections(R-Work) 4292
    R-Factor(R-Work) 0.1334
    R-Factor(R-Free) 0.1494
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2662
    Shell Resolution(Low) 2.3855
    Number of Reflections(R-Free) 266
    Number of Reflections(R-Work) 4272
    R-Factor(R-Work) 0.135
    R-Factor(R-Free) 0.1407
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3855
    Shell Resolution(Low) 2.5348
    Number of Reflections(R-Free) 220
    Number of Reflections(R-Work) 4274
    R-Factor(R-Work) 0.1403
    R-Factor(R-Free) 0.1383
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5348
    Shell Resolution(Low) 2.7302
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 4341
    R-Factor(R-Work) 0.1475
    R-Factor(R-Free) 0.1757
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7302
    Shell Resolution(Low) 3.0044
    Number of Reflections(R-Free) 221
    Number of Reflections(R-Work) 4378
    R-Factor(R-Work) 0.1511
    R-Factor(R-Free) 0.161
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0044
    Shell Resolution(Low) 3.4378
    Number of Reflections(R-Free) 212
    Number of Reflections(R-Work) 4380
    R-Factor(R-Work) 0.1483
    R-Factor(R-Free) 0.165
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4378
    Shell Resolution(Low) 4.3264
    Number of Reflections(R-Free) 253
    Number of Reflections(R-Work) 4381
    R-Factor(R-Work) 0.1422
    R-Factor(R-Free) 0.1559
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3264
    Shell Resolution(Low) 22.6977
    Number of Reflections(R-Free) 216
    Number of Reflections(R-Work) 4471
    R-Factor(R-Work) 0.1587
    R-Factor(R-Free) 0.1684
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.084
    f_dihedral_angle_d 11.591
    f_angle_d 1.331
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4814
    Nucleic Acid Atoms 0
    Heterogen Atoms 32
    Solvent Atoms 909
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SerGUI
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection SerGUI