X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 289.0
Details 90% PACT SCREEN CONDITION E4 + 10% ADDIT SCREEN D7: 0.18 M KSCN, 18% PEG 3350, 3% W/V DIAMINOOCTANE, 5 MM AMINOLEVULINIC ACID, TOGOA.17087.A.Y2 AT 6.3 MG/ML, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 290K, pH 7.00, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 177.11 α = 90
b = 187.17 β = 90
c = 95.86 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2010-06-25
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 1.00 ALS 5.0.2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 49.93 98.6 0.115 -- -- 4.04 110745 109171 0.0 -3.0 31.45
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.56 90.3 0.538 -- 2.3 3.56 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.5 49.93 -- 0.0 110745 108861 5439 -- 0.18 0.18 0.177 0.232 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5 2.56 -- 361 6927 0.273 0.318 -- 90.08
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 23.16
Anisotropic B[1][1] 1.7
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -1.25
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.45
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 2.816
r_scbond_it 1.678
r_mcangle_it 0.974
r_mcbond_other 0.123
r_mcbond_it 0.503
r_gen_planes_other 0.001
r_gen_planes_refined 0.007
r_chiral_restr 0.08
r_dihedral_angle_4_deg 20.266
r_dihedral_angle_3_deg 15.417
r_dihedral_angle_2_deg 39.506
r_dihedral_angle_1_deg 6.107
r_angle_other_deg 0.928
r_angle_refined_deg 1.497
r_bond_other_d 0.001
r_bond_refined_d 0.014
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 21476
Nucleic Acid Atoms 0
Heterogen Atoms 228
Solvent Atoms 586

Software

Computing
Computing Package Purpose
ADSC Quantum Data Collection
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
PHASER Structure Solution
REFMAC 5.5.0109 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.5.0109 refinement
PHASER model building
ADSC version: Quantum data collection