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X-RAY DIFFRACTION
Materials and Methods page
3O45
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 293.0
    Details 20.5% (w/v) PEG 4000, 0.2 M lithium sulfate monohydrate, 0.1 M Tris-HCl pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 79.54 α = 90
    b = 92.97 β = 90
    c = 140.92 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2010-04-18
     
    Diffraction Radiation
    Monochromator Si 220. Rosenbaum-Rock double-crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.0000
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.87
    Resolution(Low) 50
    Number Reflections(All) 24012
    Number Reflections(Observed) 24012
    Percent Possible(Observed) 98.7
     
    High Resolution Shell Details
    Resolution(High) 2.87
    Resolution(Low) 3.0
    Percent Possible(All) 92.0
    R Merge I(Observed) 0.688
    Mean I Over Sigma(Observed) 1.8
    Redundancy 5.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.872
    Resolution(Low) 25.543
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 23958
    Number of Reflections(Observed) 23958
    Number of Reflections(R-Free) 1228
    Percent Reflections(Observed) 97.95
    R-Factor(Observed) 0.2026
    R-Work 0.1999
    R-Free 0.254
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.7007
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -6.5038
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.4449
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8723
    Shell Resolution(Low) 2.9871
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2135
    R-Factor(R-Work) 0.2762
    R-Factor(R-Free) 0.3581
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9871
    Shell Resolution(Low) 3.1228
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2470
    R-Factor(R-Work) 0.2617
    R-Factor(R-Free) 0.3183
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1228
    Shell Resolution(Low) 3.2872
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2534
    R-Factor(R-Work) 0.2335
    R-Factor(R-Free) 0.3051
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2872
    Shell Resolution(Low) 3.4926
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2545
    R-Factor(R-Work) 0.2111
    R-Factor(R-Free) 0.2642
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4926
    Shell Resolution(Low) 3.7615
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.18
    R-Factor(R-Free) 0.2294
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7615
    Shell Resolution(Low) 4.1386
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2562
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.2187
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1386
    Shell Resolution(Low) 4.7342
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.1481
    R-Factor(R-Free) 0.2055
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7342
    Shell Resolution(Low) 5.9521
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.1612
    R-Factor(R-Free) 0.2112
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9521
    Shell Resolution(Low) 25.5438
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2734
    R-Factor(R-Work) 0.2077
    R-Factor(R-Free) 0.2547
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.036
    f_dihedral_angle_d 12.218
    f_angle_d 0.558
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6890
    Nucleic Acid Atoms 0
    Heterogen Atoms 35
    Solvent Atoms 28
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SER-CAT
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.5_2)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.5_2)
    model building PHASER
    data collection SER-CAT