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X-RAY DIFFRACTION
Materials and Methods page
3O41
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 293.0
    Details 20.5% (w/v) PEG 4000, 0.2 M lithium sulfate monohydrate, 0.1 M Tris-HCl pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 79.9 α = 90
    b = 92.99 β = 90
    c = 141.22 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2009-04-03
     
    Diffraction Radiation
    Monochromator Si 220. Rosenbaum-Rock double-crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 0.8266
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.95
    Resolution(Low) 50
    Number Reflections(All) 73963
    Number Reflections(Observed) 73963
    Percent Possible(Observed) 95.7
     
    High Resolution Shell Details
    Resolution(High) 1.95
    Resolution(Low) 2.02
    Percent Possible(All) 77.4
    R Merge I(Observed) 0.479
    Mean I Over Sigma(Observed) 2.0
    Redundancy 4.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.95
    Resolution(Low) 33.079
    Cut-off Sigma(F) 0.18
    Number of Reflections(all) 69877
    Number of Reflections(Observed) 69877
    Number of Reflections(R-Free) 3560
    Percent Reflections(Observed) 90.37
    R-Factor(Observed) 0.1795
    R-Work 0.1775
    R-Free 0.217
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.5213
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.2788
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.8001
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.95
    Shell Resolution(Low) 1.9766
    Number of Reflections(R-Free) 80
    Number of Reflections(R-Work) 1760
    R-Factor(R-Work) 0.2321
    R-Factor(R-Free) 0.2511
    Percent Reflections(Observed) 60.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9766
    Shell Resolution(Low) 2.0048
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 1925
    R-Factor(R-Work) 0.2345
    R-Factor(R-Free) 0.3088
    Percent Reflections(Observed) 67.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0048
    Shell Resolution(Low) 2.0347
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2108
    R-Factor(R-Work) 0.221
    R-Factor(R-Free) 0.2834
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0347
    Shell Resolution(Low) 2.0665
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2312
    R-Factor(R-Work) 0.2111
    R-Factor(R-Free) 0.2712
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0665
    Shell Resolution(Low) 2.1004
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2419
    R-Factor(R-Work) 0.1979
    R-Factor(R-Free) 0.2359
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1004
    Shell Resolution(Low) 2.1366
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2543
    R-Factor(R-Work) 0.1936
    R-Factor(R-Free) 0.2412
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1366
    Shell Resolution(Low) 2.1754
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2579
    R-Factor(R-Work) 0.1961
    R-Factor(R-Free) 0.251
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1754
    Shell Resolution(Low) 2.2173
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 2579
    R-Factor(R-Work) 0.1863
    R-Factor(R-Free) 0.2415
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2173
    Shell Resolution(Low) 2.2625
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.1779
    R-Factor(R-Free) 0.2314
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2625
    Shell Resolution(Low) 2.3117
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.1785
    R-Factor(R-Free) 0.2625
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3117
    Shell Resolution(Low) 2.3655
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.1844
    R-Factor(R-Free) 0.2159
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3655
    Shell Resolution(Low) 2.4246
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2737
    R-Factor(R-Work) 0.1901
    R-Factor(R-Free) 0.2828
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4246
    Shell Resolution(Low) 2.4901
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.1999
    R-Factor(R-Free) 0.2335
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4901
    Shell Resolution(Low) 2.5634
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2811
    R-Factor(R-Work) 0.1976
    R-Factor(R-Free) 0.2226
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5634
    Shell Resolution(Low) 2.6461
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2786
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.2513
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6461
    Shell Resolution(Low) 2.7406
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2802
    R-Factor(R-Work) 0.1884
    R-Factor(R-Free) 0.2346
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7406
    Shell Resolution(Low) 2.8503
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2821
    R-Factor(R-Work) 0.1883
    R-Factor(R-Free) 0.2124
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8503
    Shell Resolution(Low) 2.9799
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2807
    R-Factor(R-Work) 0.1858
    R-Factor(R-Free) 0.2427
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9799
    Shell Resolution(Low) 3.1369
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2860
    R-Factor(R-Work) 0.1878
    R-Factor(R-Free) 0.2157
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1369
    Shell Resolution(Low) 3.3333
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2915
    R-Factor(R-Work) 0.1745
    R-Factor(R-Free) 0.2253
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3333
    Shell Resolution(Low) 3.5904
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2919
    R-Factor(R-Work) 0.165
    R-Factor(R-Free) 0.2162
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5904
    Shell Resolution(Low) 3.9512
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2915
    R-Factor(R-Work) 0.1491
    R-Factor(R-Free) 0.1732
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9512
    Shell Resolution(Low) 4.5217
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2957
    R-Factor(R-Work) 0.1362
    R-Factor(R-Free) 0.1563
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5217
    Shell Resolution(Low) 5.6921
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 2972
    R-Factor(R-Work) 0.1331
    R-Factor(R-Free) 0.1663
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6921
    Shell Resolution(Low) 33.0835
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3133
    R-Factor(R-Work) 0.1855
    R-Factor(R-Free) 0.2201
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.062
    f_dihedral_angle_d 15.66
    f_angle_d 0.941
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6850
    Nucleic Acid Atoms 0
    Heterogen Atoms 70
    Solvent Atoms 732
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SER-CAT
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.5_2)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.5_2)
    model building PHASER
    data collection SER-CAT