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X-RAY DIFFRACTION
Materials and Methods page
3NWF
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.5
    Temperature 293.0
    Details 15% PEG 4000, 0.3M NaCl, and 0.1M sodium citrate, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 117.8 α = 90
    b = 117.8 β = 90
    c = 318.32 γ = 120
     
    Space Group
    Space Group Name:    P 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2003-09-13
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength List 0.9186
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.8
    Resolution(Low) 50.37
    Number Reflections(All) 121632
    Number Reflections(Observed) 112550
    Percent Possible(Observed) 92.533
    R Merge I(Observed) 0.125
    Redundancy 3.5
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.9
    Percent Possible(All) 68.0
    Mean I Over Sigma(Observed) 0.98
    Redundancy 2.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.0
    Resolution(Low) 41.5354
    Cut-off Sigma(F) 0.09
    Number of Reflections(all) 98937
    Number of Reflections(Observed) 92349
    Number of Reflections(R-Free) 4724
    Percent Reflections(Observed) 93.3412
    R-Factor(Observed) 0.1994
    R-Work 0.1972
    R-Free 0.2492
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0
    Shell Resolution(Low) 3.0478
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 3101
    R-Factor(R-Work) 0.294
    R-Factor(R-Free) 0.3841
    Percent Reflections(Observed) 68.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0478
    Shell Resolution(Low) 3.0988
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 3749
    R-Factor(R-Work) 0.2855
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0988
    Shell Resolution(Low) 3.1533
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3714
    R-Factor(R-Work) 0.2714
    R-Factor(R-Free) 0.388
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1533
    Shell Resolution(Low) 3.212
    Number of Reflections(R-Free) 535
    Number of Reflections(R-Work) 3527
    R-Factor(R-Work) 0.2539
    R-Factor(R-Free) 0.3037
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.212
    Shell Resolution(Low) 3.2752
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4192
    R-Factor(R-Work) 0.242
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2752
    Shell Resolution(Low) 3.3437
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4202
    R-Factor(R-Work) 0.2395
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3437
    Shell Resolution(Low) 3.4184
    Number of Reflections(R-Free) 690
    Number of Reflections(R-Work) 3500
    R-Factor(R-Work) 0.2222
    R-Factor(R-Free) 0.2525
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4184
    Shell Resolution(Low) 3.5002
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4347
    R-Factor(R-Work) 0.2154
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5002
    Shell Resolution(Low) 3.5905
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4375
    R-Factor(R-Work) 0.2125
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5905
    Shell Resolution(Low) 3.6908
    Number of Reflections(R-Free) 480
    Number of Reflections(R-Work) 3942
    R-Factor(R-Work) 0.1995
    R-Factor(R-Free) 0.2705
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6908
    Shell Resolution(Low) 3.8034
    Number of Reflections(R-Free) 257
    Number of Reflections(R-Work) 4170
    R-Factor(R-Work) 0.1998
    R-Factor(R-Free) 0.2853
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8034
    Shell Resolution(Low) 3.9311
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4278
    R-Factor(R-Work) 0.1905
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9311
    Shell Resolution(Low) 4.0779
    Number of Reflections(R-Free) 62
    Number of Reflections(R-Work) 4287
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.2505
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0779
    Shell Resolution(Low) 4.2494
    Number of Reflections(R-Free) 652
    Number of Reflections(R-Work) 3695
    R-Factor(R-Work) 0.18
    R-Factor(R-Free) 0.2305
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2494
    Shell Resolution(Low) 4.454
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4498
    R-Factor(R-Work) 0.1541
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.454
    Shell Resolution(Low) 4.7047
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4489
    R-Factor(R-Work) 0.1425
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7047
    Shell Resolution(Low) 5.0235
    Number of Reflections(R-Free) 749
    Number of Reflections(R-Work) 3703
    R-Factor(R-Work) 0.1555
    R-Factor(R-Free) 0.2162
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0235
    Shell Resolution(Low) 5.4511
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4503
    R-Factor(R-Work) 0.1775
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4511
    Shell Resolution(Low) 6.0754
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4531
    R-Factor(R-Work) 0.1967
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0754
    Shell Resolution(Low) 7.1422
    Number of Reflections(R-Free) 751
    Number of Reflections(R-Work) 3778
    R-Factor(R-Work) 0.2031
    R-Factor(R-Free) 0.2361
    Percent Reflections(Observed) 82.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.045
    f_dihedral_angle_d 14.29
    f_angle_d 0.658
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 19109
    Nucleic Acid Atoms 0
    Heterogen Atoms 129
    Solvent Atoms 76
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.6.1_357)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.1_357)
    model building Phaser
    data collection HKL-2000