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X-RAY DIFFRACTION
Materials and Methods page
3NWA
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.5
    Temperature 293.0
    Details 7% PEG 4000, 0.5M NaCl, 0.1M sodium citrate, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 117.09 α = 90
    b = 117.09 β = 90
    c = 321.38 γ = 120
     
    Space Group
    Space Group Name:    P 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2008-11-12
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 0.9795
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.26
    Resolution(Low) 48.35
    Number Reflections(All) 229990
    Number Reflections(Observed) 227148
    Percent Possible(Observed) 98.7643
    R Merge I(Observed) 0.12
    Redundancy 2.3
     
    High Resolution Shell Details
    Resolution(High) 2.26
    Resolution(Low) 2.3
    Percent Possible(All) 72.0
    Mean I Over Sigma(Observed) 1.06
    Redundancy 1.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2629
    Resolution(Low) 47.3159
    Cut-off Sigma(F) 0.05
    Number of Reflections(all) 229986
    Number of Reflections(Observed) 200267
    Number of Reflections(R-Free) 10883
    Percent Reflections(Observed) 87.0779
    R-Factor(Observed) 0.1757
    R-Work 0.1724
    R-Free 0.227
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 5.9812
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 5.9812
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -11.9624
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2916
    Shell Resolution(Low) 2.3297
    Number of Reflections(R-Free) 577
    Number of Reflections(R-Work) 6992
    R-Factor(R-Work) 0.2722
    R-Factor(R-Free) 0.3242
    Percent Reflections(Observed) 65.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3297
    Shell Resolution(Low) 2.3705
    Number of Reflections(R-Free) 569
    Number of Reflections(R-Work) 7358
    R-Factor(R-Work) 0.2674
    R-Factor(R-Free) 0.3077
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3705
    Shell Resolution(Low) 2.4144
    Number of Reflections(R-Free) 600
    Number of Reflections(R-Work) 7624
    R-Factor(R-Work) 0.256
    R-Factor(R-Free) 0.302
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4144
    Shell Resolution(Low) 2.4616
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 8413
    R-Factor(R-Work) 0.2525
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4616
    Shell Resolution(Low) 2.5128
    Number of Reflections(R-Free) 604
    Number of Reflections(R-Work) 7956
    R-Factor(R-Work) 0.2409
    R-Factor(R-Free) 0.298
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5128
    Shell Resolution(Low) 2.5686
    Number of Reflections(R-Free) 629
    Number of Reflections(R-Work) 8054
    R-Factor(R-Work) 0.2354
    R-Factor(R-Free) 0.2922
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5686
    Shell Resolution(Low) 2.6296
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 8932
    R-Factor(R-Work) 0.2277
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6296
    Shell Resolution(Low) 2.6969
    Number of Reflections(R-Free) 627
    Number of Reflections(R-Work) 8465
    R-Factor(R-Work) 0.2229
    R-Factor(R-Free) 0.2842
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6969
    Shell Resolution(Low) 2.7717
    Number of Reflections(R-Free) 665
    Number of Reflections(R-Work) 8625
    R-Factor(R-Work) 0.2126
    R-Factor(R-Free) 0.2674
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7717
    Shell Resolution(Low) 2.8555
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 9244
    R-Factor(R-Work) 0.2065
    R-Factor(R-Free) 0.2416
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8555
    Shell Resolution(Low) 2.9505
    Number of Reflections(R-Free) 501
    Number of Reflections(R-Work) 9149
    R-Factor(R-Work) 0.1961
    R-Factor(R-Free) 0.2693
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9505
    Shell Resolution(Low) 3.0596
    Number of Reflections(R-Free) 683
    Number of Reflections(R-Work) 9083
    R-Factor(R-Work) 0.1887
    R-Factor(R-Free) 0.2499
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0596
    Shell Resolution(Low) 3.1867
    Number of Reflections(R-Free) 706
    Number of Reflections(R-Work) 9278
    R-Factor(R-Work) 0.1733
    R-Factor(R-Free) 0.2148
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1867
    Shell Resolution(Low) 3.3381
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 10217
    R-Factor(R-Work) 0.1619
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3381
    Shell Resolution(Low) 3.523
    Number of Reflections(R-Free) 734
    Number of Reflections(R-Work) 9593
    R-Factor(R-Work) 0.1456
    R-Factor(R-Free) 0.2072
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.523
    Shell Resolution(Low) 3.7572
    Number of Reflections(R-Free) 741
    Number of Reflections(R-Work) 9645
    R-Factor(R-Work) 0.1371
    R-Factor(R-Free) 0.2034
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7572
    Shell Resolution(Low) 4.0695
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 10391
    R-Factor(R-Work) 0.1268
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0695
    Shell Resolution(Low) 4.5208
    Number of Reflections(R-Free) 744
    Number of Reflections(R-Work) 9716
    R-Factor(R-Work) 0.1117
    R-Factor(R-Free) 0.1746
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5208
    Shell Resolution(Low) 5.2764
    Number of Reflections(R-Free) 747
    Number of Reflections(R-Work) 9584
    R-Factor(R-Work) 0.1213
    R-Factor(R-Free) 0.1891
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2764
    Shell Resolution(Low) 7.1018
    Number of Reflections(R-Free) 744
    Number of Reflections(R-Work) 9582
    R-Factor(R-Work) 0.172
    R-Factor(R-Free) 0.2196
    Percent Reflections(Observed) 89.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.066
    f_dihedral_angle_d 15.252
    f_angle_d 1.004
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 19557
    Nucleic Acid Atoms 0
    Heterogen Atoms 96
    Solvent Atoms 1867
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.6.1_357)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.1_357)
    model building Phaser
    data collection HKL-2000