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X-RAY DIFFRACTION
Materials and Methods page
3NW8
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 293.0
    Details 10% PEG 4000, 0.2M NaCl, 0.1M Tris-HCl, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 117.99 α = 90
    b = 117.99 β = 90
    c = 321.54 γ = 120
     
    Space Group
    Space Group Name:    P 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2008-08-26
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.0809
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.76
    Resolution(Low) 48.69
    Number Reflections(All) 128895
    Number Reflections(Observed) 118749
    Percent Possible(Observed) 92.1285
    R Merge I(Observed) 0.115
    Redundancy 4.5
     
    High Resolution Shell Details
    Resolution(High) 2.76
    Resolution(Low) 2.81
    Percent Possible(All) 83.0
    Mean I Over Sigma(Observed) 1.38
    Redundancy 3.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.75915
    Resolution(Low) 48.6897
    Cut-off Sigma(F) 0.12
    Number of Reflections(all) 128885
    Number of Reflections(Observed) 108812
    Number of Reflections(R-Free) 5778
    Percent Reflections(Observed) 84.4257
    R-Factor(Observed) 0.2037
    R-Work 0.2015
    R-Free 0.2425
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 5.241
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 5.241
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -10.4819
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7593
    Shell Resolution(Low) 2.804
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 3815
    R-Factor(R-Work) 0.3061
    R-Factor(R-Free) 0.3542
    Percent Reflections(Observed) 63.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.804
    Shell Resolution(Low) 2.8519
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4286
    R-Factor(R-Work) 0.3024
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8519
    Shell Resolution(Low) 2.9031
    Number of Reflections(R-Free) 562
    Number of Reflections(R-Work) 3862
    R-Factor(R-Work) 0.2806
    R-Factor(R-Free) 0.3368
    Percent Reflections(Observed) 64.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9031
    Shell Resolution(Low) 2.9583
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4544
    R-Factor(R-Work) 0.2745
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9583
    Shell Resolution(Low) 3.0179
    Number of Reflections(R-Free) 453
    Number of Reflections(R-Work) 4139
    R-Factor(R-Work) 0.2702
    R-Factor(R-Free) 0.3331
    Percent Reflections(Observed) 69.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0179
    Shell Resolution(Low) 3.0826
    Number of Reflections(R-Free) 84
    Number of Reflections(R-Work) 4654
    R-Factor(R-Work) 0.2629
    R-Factor(R-Free) 0.3117
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0826
    Shell Resolution(Low) 3.1532
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4782
    R-Factor(R-Work) 0.2546
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1532
    Shell Resolution(Low) 3.2308
    Number of Reflections(R-Free) 610
    Number of Reflections(R-Work) 4241
    R-Factor(R-Work) 0.2494
    R-Factor(R-Free) 0.2743
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2308
    Shell Resolution(Low) 3.3167
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4983
    R-Factor(R-Work) 0.246
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3167
    Shell Resolution(Low) 3.4124
    Number of Reflections(R-Free) 603
    Number of Reflections(R-Work) 4437
    R-Factor(R-Work) 0.2288
    R-Factor(R-Free) 0.2646
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4124
    Shell Resolution(Low) 3.5203
    Number of Reflections(R-Free) 52
    Number of Reflections(R-Work) 5077
    R-Factor(R-Work) 0.2163
    R-Factor(R-Free) 0.2787
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5203
    Shell Resolution(Low) 3.6433
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 5239
    R-Factor(R-Work) 0.2065
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6433
    Shell Resolution(Low) 3.7855
    Number of Reflections(R-Free) 667
    Number of Reflections(R-Work) 4632
    R-Factor(R-Work) 0.1988
    R-Factor(R-Free) 0.2432
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7855
    Shell Resolution(Low) 3.9528
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 5382
    R-Factor(R-Work) 0.1901
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9528
    Shell Resolution(Low) 4.1543
    Number of Reflections(R-Free) 696
    Number of Reflections(R-Work) 4826
    R-Factor(R-Work) 0.1772
    R-Factor(R-Free) 0.2142
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1543
    Shell Resolution(Low) 4.4044
    Number of Reflections(R-Free) 3
    Number of Reflections(R-Work) 5623
    R-Factor(R-Work) 0.1563
    R-Factor(R-Free) 0.2177
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4044
    Shell Resolution(Low) 4.7281
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 5768
    R-Factor(R-Work) 0.1396
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7281
    Shell Resolution(Low) 5.1746
    Number of Reflections(R-Free) 719
    Number of Reflections(R-Work) 5034
    R-Factor(R-Work) 0.1543
    R-Factor(R-Free) 0.199
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1746
    Shell Resolution(Low) 5.8583
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 5889
    R-Factor(R-Work) 0.1789
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8583
    Shell Resolution(Low) 7.1548
    Number of Reflections(R-Free) 734
    Number of Reflections(R-Work) 5091
    R-Factor(R-Work) 0.2091
    R-Factor(R-Free) 0.2304
    Percent Reflections(Observed) 84.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.042
    f_dihedral_angle_d 13.279
    f_angle_d 0.601
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 19454
    Nucleic Acid Atoms 0
    Heterogen Atoms 295
    Solvent Atoms 209
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.6.1_357)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.1_357)
    model building Phaser
    data collection HKL-2000