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X-RAY DIFFRACTION
Materials and Methods page
3NGH
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 291.0
    Details 100mM Tris/HCl, 40% PEG 200, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 35.6 α = 90
    b = 55.11 β = 90
    c = 111.06 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Details mirrors
    Collection Date 2009-06-01
     
    Diffraction Radiation
    Monochromator Si(111) CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X12C
    Wavelength List 1.1
    Site NSLS
    Beamline X12C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.65
    Resolution(Low) 30.7
    Number Reflections(All) 26518
    Number Reflections(Observed) 26518
    Percent Possible(Observed) 97.5
    R Merge I(Observed) 0.488
    B(Isotropic) From Wilson Plot 26.9
    Redundancy 10.5
     
    High Resolution Shell Details
    Resolution(High) 1.65
    Resolution(Low) 1.86
    Percent Possible(All) 91.7
    R Merge I(Observed) 0.055
    Mean I Over Sigma(Observed) 3.7
    R-Sym I(Observed) 0.056
    Redundancy 5.8
    Number Unique Reflections(All) 1235
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.8
    Resolution(Low) 29.91
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 19752
    Number of Reflections(Observed) 19752
    Number of Reflections(R-Free) 1003
    Percent Reflections(Observed) 98.88
    R-Factor(All) 0.20158
    R-Factor(Observed) 0.20158
    R-Work 0.19973
    R-Free 0.23763
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 27.334
    Anisotropic B[1][1] 0.02
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.11
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.13
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8
    Shell Resolution(Low) 1.847
    Number of Reflections(R-Free) 63
    Number of Reflections(R-Work) 1396
    R-Factor(R-Work) 0.228
    R-Factor(R-Free) 0.318
    Percent Reflections(Observed) 97.01
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 4.677
    r_scbond_it 2.9
    r_mcangle_it 1.887
    r_mcbond_other 0.335
    r_mcbond_it 1.1
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.008
    r_chiral_restr 0.123
    r_dihedral_angle_4_deg 18.297
    r_dihedral_angle_3_deg 15.274
    r_dihedral_angle_2_deg 44.405
    r_dihedral_angle_1_deg 6.209
    r_angle_other_deg 0.967
    r_angle_refined_deg 1.851
    r_bond_other_d 0.001
    r_bond_refined_d 0.022
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1666
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 187
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement REFMAC 5.5.0109
     
    Software
    refinement REFMAC version: 5.5.0109
    model building Phaser
    data collection CBASS