X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4
Temperature 298.0
Details 1M LiCl, 0.1M Citric Acid, 10% PEG 6000, pH 4.0, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 76.11 α = 90
b = 87.72 β = 90
c = 100.45 γ = 90
Symmetry
Space Group I 2 2 2

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r mirror 2007-09-21
CCD ADSC QUANTUM 315r mirror 2007-09-05
Diffraction Radiation
Monochromator Protocol
Si (111) or Si (311) SINGLE WAVELENGTH
Si (111) or Si (311) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE BM30A 0.9797 ESRF BM30A
SYNCHROTRON ESRF BEAMLINE ID29 0.932 ESRF ID29

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.55 43.9 97.7 0.083 -- -- 6.36 47819 47819 0.0 0.0 29.1
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.55 1.6 93.2 0.499 -- 2.23 4.0 4131

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.551 33.036 -- 0.0 47819 47804 2258 97.65 -- 0.1691 0.168 0.1917 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.551 1.6064 -- 225 4388 0.2534 0.3035 -- 96.0
X Ray Diffraction 1.6064 1.6708 -- 232 4514 0.2279 0.2724 -- 98.0
X Ray Diffraction 1.6708 1.7468 -- 229 4495 0.2049 0.2646 -- 98.0
X Ray Diffraction 1.7468 1.8389 -- 230 4482 0.1925 0.2268 -- 97.0
X Ray Diffraction 1.8389 1.9541 -- 216 4510 0.1953 0.2377 -- 97.0
X Ray Diffraction 1.9541 2.1049 -- 226 4528 0.1654 0.2002 -- 98.0
X Ray Diffraction 2.1049 2.3167 -- 217 4579 0.1513 0.177 -- 98.0
X Ray Diffraction 2.3167 2.6518 -- 225 4597 0.1441 0.1745 -- 98.0
X Ray Diffraction 2.6518 3.3405 -- 226 4657 0.1537 0.1611 -- 99.0
X Ray Diffraction 3.3405 33.0438 -- 232 4796 0.1622 0.1738 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model anisotropic
Anisotropic B[1][1] 3.3884
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -5.3636
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 1.9753
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.007
f_bond_d 0.013
f_dihedral_angle_d 14.726
f_chiral_restr 0.082
f_angle_d 1.333
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2263
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 340

Software

Software
Software Name Purpose
XDS data scaling
PHASER phasing
PHENIX refinement version: (phenix.refine: 1.6_288)
XDS data reduction
XSCALE data scaling