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X-RAY DIFFRACTION
Materials and Methods page
3MJG
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 295.0
    Details 0.84 M (NH4)2HPO4, 0.1 M imidazole, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 78.47 α = 90
    b = 116.82 β = 90
    c = 134.15 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2008-06-15
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-D
    Wavelength List 0.9786
    Site APS
    Beamline 21-ID-D
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.3
    Resolution(Low) 44.24
    Number Reflections(All) 55432
    Number Reflections(Observed) 54767
    Percent Possible(Observed) 98.8
    R Merge I(Observed) 0.078
    B(Isotropic) From Wilson Plot 36.0
    Redundancy 4.0
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.4
    Percent Possible(All) 97.7
    R Merge I(Observed) 0.327
    Mean I Over Sigma(Observed) 3.3
    R-Sym I(Observed) 0.426
    Redundancy 4.0
    Number Unique Reflections(All) 8466
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 44.24
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 55249
    Number of Reflections(Observed) 54642
    Number of Reflections(R-Free) 2764
    Percent Reflections(Observed) 98.9
    R-Factor(Observed) 0.237
    R-Work 0.237
    R-Free 0.277
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 67.4
    Anisotropic B[1][1] -5.52
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 11.67
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -6.14
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.44
    Number of Reflections(Observed) 8466
    Number of Reflections(R-Free) 439
    Number of Reflections(R-Work) 8466
    R-Factor(R-Work) 0.338
    R-Factor(R-Free) 0.356
    R-Free Error 0.017
    Percent Reflections(Observed) 97.8
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_improper_angle_d 1.19
    c_dihedral_angle_d 27.4
    c_angle_deg 1.6
    c_bond_d 0.009
     
    Coordinate Error
    Luzzati ESD(Observed) 0.33
    Luzzati Sigma A(Observed) 0.43
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.39
    Luzzati Sigma A(R-Free Set) 0.46
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5888
    Nucleic Acid Atoms 0
    Heterogen Atoms 196
    Solvent Atoms 1170
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement CNS 1.1
     
    Software
    refinement CNS version: 1.1
    model building PHASER
    data collection HKL-2000