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X-RAY DIFFRACTION
Materials and Methods page
3M6Z
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.5
    Temperature 303.0
    Details 0.1 M phosphate citrate pH 5.5, 0.15M sodium sulfate, 0.01M MgCl2, 1 M guanidium hydrochloride, 28% PEG 3350, VAPOR DIFFUSION, HANGING DROP, temperature 303K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 63.64 α = 90
    b = 80.11 β = 90
    c = 137.22 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
    Collection Date 2008-07-24
    Detector CCD
    Type RAYONIX MX-225
    Details beryllium lenses
    Collection Date 2008-07-24
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
    Monochromator silicon
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-D
    Wavelength List 0.97915
    Site APS
    Beamline 21-ID-D
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-G
    Wavelength List 0.97872
    Site APS
    Beamline 21-ID-G
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.4
    Resolution(Low) 28.9
    Number Reflections(All) 138158
    Number Reflections(Observed) 136662
    Percent Possible(Observed) 98.8
    R Merge I(Observed) 0.048
    Redundancy 8.5
     
    High Resolution Shell Details
    Resolution(High) 1.4
    Resolution(Low) 1.46
    Percent Possible(All) 95.5
    R Merge I(Observed) 0.405
    Mean I Over Sigma(Observed) 5.3
    R-Sym I(Observed) 0.379
    Redundancy 7.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.4
    Resolution(Low) 28.9
    Number of Reflections(all) 136662
    Number of Reflections(Observed) 129802
    Number of Reflections(R-Free) 6859
    Percent Reflections(Observed) 98.68
    R-Factor(Observed) 0.16587
    R-Work 0.16491
    R-Free 0.18424
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 11.181
    Anisotropic B[1][1] 0.52
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.32
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.2
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4
    Shell Resolution(Low) 1.436
    Number of Reflections(R-Free) 487
    Number of Reflections(R-Work) 8967
    R-Factor(R-Work) 0.193
    R-Factor(R-Free) 0.221
    Percent Reflections(Observed) 93.51
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 2.181
    r_scbond_it 1.651
    r_mcangle_it 0.892
    r_mcbond_other 0.175
    r_mcbond_it 0.778
    r_nbd_refined 0.225
    r_gen_planes_other 0.003
    r_gen_planes_refined 0.006
    r_chiral_restr 0.072
    r_dihedral_angle_4_deg 18.476
    r_dihedral_angle_3_deg 12.794
    r_dihedral_angle_2_deg 32.878
    r_dihedral_angle_1_deg 4.709
    r_angle_other_deg 0.901
    r_angle_refined_deg 1.195
    r_bond_other_d 0.002
    r_bond_refined_d 0.009
    r_nbd_other 0.202
    r_nbtor_refined 0.177
    r_nbtor_other 0.082
    r_xyhbond_nbd_refined 0.138
    r_symmetry_vdw_refined 0.266
    r_symmetry_vdw_other 0.242
    r_symmetry_hbond_refined 0.146
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6056
    Nucleic Acid Atoms 0
    Heterogen Atoms 52
    Solvent Atoms 573
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MD2-microdiffractometer
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution SHARP
    Structure Refinement REFMAC 5.2.0019
     
    Software
    refinement REFMAC version: 5.2.0019
    model building SHARP
    data collection MD2-microdiffractometer