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X-RAY DIFFRACTION
Materials and Methods page
3LRS
  •   Crystallization Hide
    Crystallization Experiments
    pH 10.5
    Temperature 293.0
    Details 0.74M Potassium Dihydrogen Phosphate, 1.10M Sodium Dihydrogen Phosphate, 0.2M Lithium Sulfate Monohydrate, 0.1 M CAPS, pH 10.5, VAPOR DIFFUSION, HANGING DROP, temperature 293.00K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 81.32 α = 90
    b = 165.09 β = 91.55
    c = 81.36 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-01-01
     
    Diffraction Radiation
    Monochromator SILICON CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength 1.00
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.37
    Resolution(Low) 50
    Number Reflections(Observed) 71375
    Percent Possible(Observed) 81.5
    R Merge I(Observed) 0.126
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 2.37
    Resolution(Low) 2.41
    Percent Possible(All) 25.4
    R Merge I(Observed) 0.5116
    Mean I Over Sigma(Observed) 1.49
    R-Sym I(Observed) 0.514
    Redundancy 1.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.37
    Resolution(Low) 30.59
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 71375
    Number of Reflections(R-Free) 3598
    Percent Reflections(Observed) 82.0
    R-Factor(Observed) 0.213
    R-Work 0.211
    R-Free 0.26
     
    Temperature Factor Modeling
    Mean Isotropic B Value 65.38
    Anisotropic B[1][1] 3.15
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -8.961
    Anisotropic B[2][2] -2.786
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.364
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.37
    Shell Resolution(Low) 2.399
    Number of Reflections(R-Free) 41
    Number of Reflections(R-Work) 902
    R-Factor(R-Work) 0.265
    R-Factor(R-Free) 0.427
    Percent Reflections(Observed) 28.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.399
    Shell Resolution(Low) 2.432
    Number of Reflections(R-Free) 58
    Number of Reflections(R-Work) 1252
    R-Factor(R-Work) 0.26
    R-Factor(R-Free) 0.358
    Percent Reflections(Observed) 40.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.432
    Shell Resolution(Low) 2.466
    Number of Reflections(R-Free) 90
    Number of Reflections(R-Work) 1384
    R-Factor(R-Work) 0.26
    R-Factor(R-Free) 0.327
    Percent Reflections(Observed) 43.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.466
    Shell Resolution(Low) 2.503
    Number of Reflections(R-Free) 81
    Number of Reflections(R-Work) 1522
    R-Factor(R-Work) 0.276
    R-Factor(R-Free) 0.352
    Percent Reflections(Observed) 49.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.503
    Shell Resolution(Low) 2.542
    Number of Reflections(R-Free) 96
    Number of Reflections(R-Work) 1750
    R-Factor(R-Work) 0.275
    R-Factor(R-Free) 0.332
    Percent Reflections(Observed) 54.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.542
    Shell Resolution(Low) 2.584
    Number of Reflections(R-Free) 106
    Number of Reflections(R-Work) 1857
    R-Factor(R-Work) 0.264
    R-Factor(R-Free) 0.363
    Percent Reflections(Observed) 60.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.584
    Shell Resolution(Low) 2.628
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2081
    R-Factor(R-Work) 0.261
    R-Factor(R-Free) 0.331
    Percent Reflections(Observed) 65.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.628
    Shell Resolution(Low) 2.676
    Number of Reflections(R-Free) 102
    Number of Reflections(R-Work) 2197
    R-Factor(R-Work) 0.279
    R-Factor(R-Free) 0.295
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.676
    Shell Resolution(Low) 2.728
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2424
    R-Factor(R-Work) 0.274
    R-Factor(R-Free) 0.351
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.728
    Shell Resolution(Low) 2.783
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2520
    R-Factor(R-Work) 0.272
    R-Factor(R-Free) 0.343
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.783
    Shell Resolution(Low) 2.844
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2716
    R-Factor(R-Work) 0.257
    R-Factor(R-Free) 0.348
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.844
    Shell Resolution(Low) 2.91
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2956
    R-Factor(R-Work) 0.258
    R-Factor(R-Free) 0.287
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.91
    Shell Resolution(Low) 2.983
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3023
    R-Factor(R-Work) 0.248
    R-Factor(R-Free) 0.313
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.983
    Shell Resolution(Low) 3.063
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 3103
    R-Factor(R-Work) 0.248
    R-Factor(R-Free) 0.306
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.063
    Shell Resolution(Low) 3.153
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 3152
    R-Factor(R-Work) 0.235
    R-Factor(R-Free) 0.313
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.153
    Shell Resolution(Low) 3.255
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 3172
    R-Factor(R-Work) 0.228
    R-Factor(R-Free) 0.284
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.255
    Shell Resolution(Low) 3.371
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3153
    R-Factor(R-Work) 0.214
    R-Factor(R-Free) 0.266
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.371
    Shell Resolution(Low) 3.506
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3162
    R-Factor(R-Work) 0.203
    R-Factor(R-Free) 0.299
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.506
    Shell Resolution(Low) 3.665
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3154
    R-Factor(R-Work) 0.186
    R-Factor(R-Free) 0.261
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.665
    Shell Resolution(Low) 3.858
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3197
    R-Factor(R-Work) 0.19
    R-Factor(R-Free) 0.221
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.858
    Shell Resolution(Low) 4.099
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 3159
    R-Factor(R-Work) 0.166
    R-Factor(R-Free) 0.237
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.099
    Shell Resolution(Low) 4.415
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3146
    R-Factor(R-Work) 0.144
    R-Factor(R-Free) 0.185
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.415
    Shell Resolution(Low) 4.858
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 3198
    R-Factor(R-Work) 0.14
    R-Factor(R-Free) 0.193
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.858
    Shell Resolution(Low) 5.557
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3186
    R-Factor(R-Work) 0.158
    R-Factor(R-Free) 0.205
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.557
    Shell Resolution(Low) 6.988
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 3205
    R-Factor(R-Work) 0.204
    R-Factor(R-Free) 0.3
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.988
    Shell Resolution(Low) 30.593
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3206
    R-Factor(R-Work) 0.221
    R-Factor(R-Free) 0.221
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.068
    f_dihedral_angle_d 16.098
    f_angle_d 1.154
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 12979
    Nucleic Acid Atoms 0
    Heterogen Atoms 56
    Solvent Atoms 389
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE: 1.5_2)
     
    Software
    data extraction pdb_extract version: 3.005
    refinement phenix
    molecular replacement Phaser
    data processing HKL