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X-RAY DIFFRACTION
Materials and Methods page
3LJG
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 298.0
    Details MMP12 at 4mg/ml co-crystallization with AHA and non-chelating inhibitor with precipitant: 19% PEG 10K, 0.2M imidazole malate, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 69.09 α = 90
    b = 62.82 β = 90
    c = 37.55 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2009-02-05
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SOLEIL BEAMLINE PROXIMA 1
    Wavelength List 0.855
    Site SOLEIL
    Beamline PROXIMA 1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.31
    Resolution(Low) 32.99
    Number Reflections(All) 39828
    Number Reflections(Observed) 39828
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.101
    Redundancy 9.2
     
    High Resolution Shell Details
    Resolution(High) 1.31
    Resolution(Low) 1.38
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.766
    Mean I Over Sigma(Observed) 2.9
    R-Sym I(Observed) 0.811
    Redundancy 9.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method rigid body
    reflnsShellList 1.313
    Resolution(Low) 28.594
    Cut-off Sigma(F) 1.44
    Number of Reflections(all) 39775
    Number of Reflections(Observed) 39775
    Number of Reflections(R-Free) 1998
    Percent Reflections(Observed) 99.96
    R-Factor(Observed) 0.1738
    R-Work 0.1726
    R-Free 0.1948
     
    Temperature Factor Modeling
    Isotropic Thermal Model Isotropic
    Anisotropic B[1][1] -0.1565
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.0519
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.2084
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.313
    Shell Resolution(Low) 1.3458
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.2979
    R-Factor(R-Free) 0.2806
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3458
    Shell Resolution(Low) 1.3822
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.262
    R-Factor(R-Free) 0.2972
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3822
    Shell Resolution(Low) 1.4229
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.2369
    R-Factor(R-Free) 0.2442
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4229
    Shell Resolution(Low) 1.4688
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2672
    R-Factor(R-Work) 0.2254
    R-Factor(R-Free) 0.2216
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4688
    Shell Resolution(Low) 1.5213
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2670
    R-Factor(R-Work) 0.1936
    R-Factor(R-Free) 0.2178
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5213
    Shell Resolution(Low) 1.5822
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.1877
    R-Factor(R-Free) 0.2283
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5822
    Shell Resolution(Low) 1.6542
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.1812
    R-Factor(R-Free) 0.2106
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6542
    Shell Resolution(Low) 1.7414
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.1681
    R-Factor(R-Free) 0.2352
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7414
    Shell Resolution(Low) 1.8505
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2683
    R-Factor(R-Work) 0.1649
    R-Factor(R-Free) 0.1934
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8505
    Shell Resolution(Low) 1.9934
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.155
    R-Factor(R-Free) 0.1957
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9934
    Shell Resolution(Low) 2.1939
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.147
    R-Factor(R-Free) 0.1778
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1939
    Shell Resolution(Low) 2.5112
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2757
    R-Factor(R-Work) 0.1577
    R-Factor(R-Free) 0.1802
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5112
    Shell Resolution(Low) 3.1632
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2754
    R-Factor(R-Work) 0.1556
    R-Factor(R-Free) 0.1737
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1632
    Shell Resolution(Low) 28.6005
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 2849
    R-Factor(R-Work) 0.151
    R-Factor(R-Free) 0.1635
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.019
    f_chiral_restr 0.072
    f_dihedral_angle_d 18.144
    f_angle_d 1.09
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1246
    Nucleic Acid Atoms 0
    Heterogen Atoms 59
    Solvent Atoms 327
     
     
  •   Software and Computing Hide
    Computing
    Data Collection DNA
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution REFMAC (rigid body)
    Structure Refinement PHENIX (phenix.refine)
     
    Software
    refinement PHENIX version: (phenix.refine)
    model building REFMAC version: (rigid body)
    data collection DNA