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X-RAY DIFFRACTION
Materials and Methods page
3LEY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.5
    Temperature 293.0
    Details 31.5 % PEG 1000, 0.2 M Zn(CH3COO)2, 0.1 M CH3COONA PH 4.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 36.25 α = 90
    b = 80.16 β = 97.07
    c = 72.14 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2009-04-02
     
    Diffraction Radiation
    Monochromator SI (220)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.000
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 5.0
    Resolution(High) 1.98
    Resolution(Low) 50
    Number Reflections(Observed) 26922
    Percent Possible(Observed) 96.7
    B(Isotropic) From Wilson Plot 29.3
     
    High Resolution Shell Details
    Resolution(High) 1.98
    Resolution(Low) 2.05
    Percent Possible(All) 86.9
    Mean I Over Sigma(Observed) 5.2
    R-Sym I(Observed) 0.342
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.99
    Resolution(Low) 27.1
    Cut-off Sigma(F) 0.05
    Number of Reflections(Observed) 25977
    Number of Reflections(R-Free) 1916
    Percent Reflections(Observed) 92.0
    R-Factor(Observed) 0.18
    R-Work 0.177
    R-Free 0.215
     
    Temperature Factor Modeling
    Mean Isotropic B Value 41.75
    Anisotropic B[1][1] 7.708
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 5.834
    Anisotropic B[2][2] 0.711
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -8.419
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.988
    Shell Resolution(Low) 2.038
    Number of Reflections(R-Free) 89
    Number of Reflections(R-Work) 1125
    R-Factor(R-Work) 0.223
    R-Factor(R-Free) 0.311
    Percent Reflections(Observed) 60.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.038
    Shell Resolution(Low) 2.093
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 1547
    R-Factor(R-Work) 0.199
    R-Factor(R-Free) 0.258
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.093
    Shell Resolution(Low) 2.155
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 1678
    R-Factor(R-Work) 0.196
    R-Factor(R-Free) 0.269
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.155
    Shell Resolution(Low) 2.224
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1703
    R-Factor(R-Work) 0.204
    R-Factor(R-Free) 0.257
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.224
    Shell Resolution(Low) 2.304
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1721
    R-Factor(R-Work) 0.203
    R-Factor(R-Free) 0.314
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.304
    Shell Resolution(Low) 2.396
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1773
    R-Factor(R-Work) 0.197
    R-Factor(R-Free) 0.248
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.396
    Shell Resolution(Low) 2.505
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1769
    R-Factor(R-Work) 0.201
    R-Factor(R-Free) 0.293
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.505
    Shell Resolution(Low) 2.637
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1771
    R-Factor(R-Work) 0.205
    R-Factor(R-Free) 0.253
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.637
    Shell Resolution(Low) 2.802
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1801
    R-Factor(R-Work) 0.202
    R-Factor(R-Free) 0.253
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.802
    Shell Resolution(Low) 3.018
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1839
    R-Factor(R-Work) 0.197
    R-Factor(R-Free) 0.246
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.018
    Shell Resolution(Low) 3.321
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1819
    R-Factor(R-Work) 0.171
    R-Factor(R-Free) 0.19
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.321
    Shell Resolution(Low) 3.801
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1825
    R-Factor(R-Work) 0.154
    R-Factor(R-Free) 0.219
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.801
    Shell Resolution(Low) 4.784
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1838
    R-Factor(R-Work) 0.138
    R-Factor(R-Free) 0.156
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.784
    Shell Resolution(Low) 27.098
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1852
    R-Factor(R-Work) 0.173
    R-Factor(R-Free) 0.18
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.051
    f_dihedral_angle_d 15.031
    f_angle_d 0.768
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3402
    Nucleic Acid Atoms 0
    Heterogen Atoms 3
    Solvent Atoms 331
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    data extraction pdb_extract version: 3.005
    refinement phenix